Xing Chen

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical interleaving with enhanced spectral response and reduced po...
- Patent number 6,907,167
- Issue date Jun 14, 2005
- Gazillion Bits, Inc.
- Hwan J. Jeong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 6,734,967
- Issue date May 11, 2004
- KLA-Tencor Technologies Corporation
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Grant
System for non-destructive measurement of samples
- Patent number 6,268,916
- Issue date Jul 31, 2001
- KLA-Tencor Corporation
- Shing Lee
- G01 - MEASURING TESTING
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 5,910,842
- Issue date Jun 8, 1999
- KLA-Tencor Corporation
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Grant
Film measurement system with improved calibration
- Patent number 5,771,094
- Issue date Jun 23, 1998
- KLA-Tencor Corporation
- Joseph Carter
- G01 - MEASURING TESTING
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 5,608,526
- Issue date Mar 4, 1997
- Tencor Instruments
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating an ellipsometer
- Patent number 5,581,350
- Issue date Dec 3, 1996
- Tencor Instruments
- Xing Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Focused beam spectroscopic ellipsometry method and system
- Publication number 20050105090
- Publication date May 19, 2005
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Application
Focused beam spectroscopic ellipsometry method and system
- Publication number 20040100632
- Publication date May 27, 2004
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Application
Optical interleaving with enhanced spectral response and reduced po...
- Publication number 20020126354
- Publication date Sep 12, 2002
- Gazillion Bits, Inc.
- Hwan J. Jeong
- G02 - OPTICS