Xing Chu

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detecting defects on a wafer using template image matching
- Patent number 9,311,698
- Issue date Apr 12, 2016
- KLA-Tencor Corp.
- Xing Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory cell and page break inspection
- Patent number 8,155,428
- Issue date Apr 10, 2012
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for binning defects detected on a specimen
- Patent number 7,570,800
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Detecting Defects on a Wafer Using Template Image Matching
- Publication number 20140193065
- Publication date Jul 10, 2014
- KLA-Tencor Corporation
- Xing Chu
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN
- Publication number 20090290784
- Publication date Nov 26, 2009
- KLA-Tencor Technologies Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory cell and page break inspection
- Publication number 20090067722
- Publication date Mar 12, 2009
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory cell and page break inspection
- Publication number 20090067703
- Publication date Mar 12, 2009
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for binning defects detected on a specimen
- Publication number 20070133860
- Publication date Jun 14, 2007
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING