Yahel DAVID

Person

Kibbutz Gazit, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 12,320,844
- Issue date Jun 3, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 12,282,058
- Issue date Apr 22, 2025
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 12,216,976
- Issue date Feb 4, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit workload, temperature, and/or sub-threshold leak...
- Patent number 12,092,684
- Issue date Sep 17, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,841,395
- Issue date Dec 12, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit degradation estimation and time-of-failure predi...
- Patent number 11,740,281
- Issue date Aug 29, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature and/or subthreshold leakag...
- Patent number 11,408,932
- Issue date Aug 9, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 11,391,771
- Issue date Jul 19, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,385,282
- Issue date Jul 12, 2022
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 11,132,485
- Issue date Sep 28, 2021
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT
- Publication number 20250237695
- Publication date Jul 24, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION
- Publication number 20250224447
- Publication date Jul 10, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20250181808
- Publication date Jun 5, 2025
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20240353476
- Publication date Oct 24, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20240036105
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20230341460
- Publication date Oct 26, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20230046999
- Publication date Feb 16, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20220349935
- Publication date Nov 3, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...
- Publication number 20220343048
- Publication date Oct 27, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS
- Publication number 20220268644
- Publication date Aug 25, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20220260630
- Publication date Aug 18, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20220012395
- Publication date Jan 13, 2022
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20210165941
- Publication date Jun 3, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20200393506
- Publication date Dec 17, 2020
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20200363468
- Publication date Nov 19, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...
- Publication number 20200333393
- Publication date Oct 22, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING

Yahel DAVID

Person

Patents Grantslast 30 patents

Integrated circuit profiling and anomaly detection

Integrated circuit pad failure detection

Efficient integrated circuit simulation and testing

Integrated circuit workload, temperature, and/or sub-threshold leak...

Integrated circuit margin measurement and failure prediction device

Integrated circuit profiling and anomaly detection

Integrated circuit degradation estimation and time-of-failure predi...

Integrated circuit workload, temperature and/or subthreshold leakag...

Integrated circuit pad failure detection

Integrated circuit margin measurement and failure prediction device

Efficient integrated circuit simulation and testing

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT MARGIN MEASUREMENT

DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT PAD FAILURE DETECTION

DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...

ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...