Yan ZHAO

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Patterned substrate imaging using multiple electron beams
- Patent number 10,347,460
- Issue date Jul 9, 2019
- Dongfang Jingyuan Electron Limited
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-node server platform
- Patent number 9,865,980
- Issue date Jan 9, 2018
- Facebook, Inc.
- Hu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple graphics processing unit platform
- Patent number 9,807,901
- Issue date Oct 31, 2017
- Facebook, Inc.
- John Brian Ehlen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for calibrating charge-regulating module
- Patent number 9,536,697
- Issue date Jan 3, 2017
- Hermes Microvision Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hot spot identification, inspection, and review
- Patent number 9,330,987
- Issue date May 3, 2016
- Hermes-Microvision, Inc.
- Steve Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for examining a sample by using a charged particle beam
- Patent number 8,937,281
- Issue date Jan 20, 2015
- Hermes-Microvision, Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam imaging assembly and imaging method thereof
- Patent number 8,884,224
- Issue date Nov 11, 2014
- Hermes-Microvision, Inc.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam inspection method
- Patent number 8,692,214
- Issue date Apr 8, 2014
- Hermes Microvision, Inc.
- Yan Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing identified defects during charged particl...
- Patent number 8,664,596
- Issue date Mar 4, 2014
- Hermes-Microvision, Inc.
- Yan Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method for examining a sample by using a charged particle beam
- Patent number 8,299,431
- Issue date Oct 30, 2012
- Hermes-Microvision, Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reducing substrate edge effect during insp...
- Patent number 8,294,094
- Issue date Oct 23, 2012
- Hermes Microvision Inc.
- Yan Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining images by raster scanning charge...
- Patent number 7,982,186
- Issue date Jul 19, 2011
- Hermes Microvision, Inc.
- Kenichi Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam imaging method and system thereof
- Patent number 7,884,334
- Issue date Feb 8, 2011
- Hermes-Microvision, Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for in-line monitoring of via/contact holes etch process bas...
- Patent number 7,474,001
- Issue date Jan 6, 2009
- Hermes-Microvision, Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for in-line monitoring of via/contact holes etch process bas...
- Patent number 7,105,436
- Issue date Sep 12, 2006
- Hermes-Microvision, Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for in-line monitoring of via/contact holes etch process bas...
- Patent number 6,815,345
- Issue date Nov 9, 2004
- Hermes-Microvision (Taiwan) Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Patterned Substrate Imaging Using Multiple Electron Beams
- Publication number 20180254167
- Publication date Sep 6, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE GRAPHICS PROCESSING UNIT PLATFORM
- Publication number 20160381825
- Publication date Dec 29, 2016
- FACEBOOK, INC.
- John Brian Ehlen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
System and Method for Calibrating Charge-Regulating Module
- Publication number 20160343534
- Publication date Nov 24, 2016
- HERMES MICROVISION INC.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-NODE SERVER PLATFORM
- Publication number 20160262282
- Publication date Sep 8, 2016
- FACEBOOK, INC.
- Hu Li
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Hot Spot Identification, Inspection, and Review
- Publication number 20150069232
- Publication date Mar 12, 2015
- Hermes-Microvision, Inc.
- Steve Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EXAMINING A SAMPLE BY USING A CHARGED PARTICLE BEAM
- Publication number 20120273678
- Publication date Nov 1, 2012
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION METHOD
- Publication number 20110036981
- Publication date Feb 17, 2011
- Hermes Microvision, Inc.
- YAN ZHAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXAMINING A SAMPLE BY USING A CHARGED PARTICLE BEAM
- Publication number 20100327160
- Publication date Dec 30, 2010
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZING IDENTIFIED DEFECTS DURING CHARGED PARTICL...
- Publication number 20100320381
- Publication date Dec 23, 2010
- Hermes-Microvision, Inc.
- Yan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM IMAGING ASSEMBLY AND IMAGING METHOD THEREOF
- Publication number 20100258722
- Publication date Oct 14, 2010
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM IMAGING METHOD AND SYSTEM THEREOF
- Publication number 20100181492
- Publication date Jul 22, 2010
- Yan ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR OBTAINING IMAGES BY RASTER SCANNING CHARGE...
- Publication number 20090244078
- Publication date Oct 1, 2009
- Kenichi Kanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS OF WAFER SURFACE POTENTIAL REGULATION
- Publication number 20080296496
- Publication date Dec 4, 2008
- Hermes Microvision, Inc. (TAIWAN)
- Yan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
Method for in-line monitoring of via/contact holes etch process bas...
- Publication number 20060234496
- Publication date Oct 19, 2006
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for in-line monitoring of via/contact holes etch process bas...
- Publication number 20050026310
- Publication date Feb 3, 2005
- Hermes-Microvision (Taiwan) Inc.
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for in-line monitoring of via/contact holes etch process bas...
- Publication number 20030136762
- Publication date Jul 24, 2003
- Yan Zhao
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Patterned substrate imaging using multiple electron beams

Multi-node server platform

Multiple graphics processing unit platform

System and method for calibrating charge-regulating module

Hot spot identification, inspection, and review

Method for examining a sample by using a charged particle beam

Charged particle beam imaging assembly and imaging method thereof

Charged particle beam inspection method

Method for characterizing identified defects during charged particl...

Method for examining a sample by using a charged particle beam

Method and apparatus for reducing substrate edge effect during insp...

Method and apparatus for obtaining images by raster scanning charge...

Charged particle beam imaging method and system thereof

Method for in-line monitoring of via/contact holes etch process bas...

Method for in-line monitoring of via/contact holes etch process bas...

Method for in-line monitoring of via/contact holes etch process bas...

Patents Applicationslast 30 patents

Patterned Substrate Imaging Using Multiple Electron Beams

MULTIPLE GRAPHICS PROCESSING UNIT PLATFORM

System and Method for Calibrating Charge-Regulating Module

MULTI-NODE SERVER PLATFORM

Hot Spot Identification, Inspection, and Review

METHOD FOR EXAMINING A SAMPLE BY USING A CHARGED PARTICLE BEAM

CHARGED PARTICLE BEAM INSPECTION METHOD

METHOD FOR EXAMINING A SAMPLE BY USING A CHARGED PARTICLE BEAM

METHOD FOR CHARACTERIZING IDENTIFIED DEFECTS DURING CHARGED PARTICL...

CHARGED PARTICLE BEAM IMAGING ASSEMBLY AND IMAGING METHOD THEREOF

CHARGED PARTICLE BEAM IMAGING METHOD AND SYSTEM THEREOF

METHOD AND APPARATUS FOR OBTAINING IMAGES BY RASTER SCANNING CHARGE...

METHOD AND APPARATUS OF WAFER SURFACE POTENTIAL REGULATION

Method for in-line monitoring of via/contact holes etch process bas...

Method for in-line monitoring of via/contact holes etch process bas...

Method for in-line monitoring of via/contact holes etch process bas...