Yasuhiko Iguchi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Data analysis method and apparatus therefor
- Patent number 7,053,897
- Issue date May 30, 2006
- Agilent Technologies, Inc.
- Yasuhiko Iguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor test data analysis system
- Patent number 7,035,752
- Issue date Apr 25, 2006
- Agilent Technologies, Inc.
- Yasuhiko Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test data analysis system
- Patent number 6,898,545
- Issue date May 24, 2005
- Agilent Technologies Inc.
- Yasuhiko Iguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus of measuring characteristics of semiconductor devices
- Publication number 20070216435
- Publication date Sep 20, 2007
- Yasuhiko Iguchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test data analysis system
- Publication number 20050119852
- Publication date Jun 2, 2005
- AGILENT TECHNOLOGIES, INC.
- Yasuhiko Iguchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test data analysis system
- Publication number 20040002829
- Publication date Jan 1, 2004
- Agilent technologies, Inc. and Sandia Technologies, Inc.
- Yasuhiko Iguchi
- G01 - MEASURING TESTING
Information Patent Application
Data analysis method and apparatus therefor
- Publication number 20040002827
- Publication date Jan 1, 2004
- AGILENT TECHNOLOGIES, INC.
- Yasuhiko Iguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data analysis apparatus
- Publication number 20040001096
- Publication date Jan 1, 2004
- Hiroshi Tamura
- H01 - BASIC ELECTRIC ELEMENTS