Yau Y. Hung

Follow

Person

Rochester, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Nondestructive testing of diffusely reflective objects
- Patent number 6,606,160
- Issue date Aug 12, 2003
- Yau Y. Hung
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring displacement between points on a test object
- Patent number 5,011,280
- Issue date Apr 30, 1991
- Yau Y. Hung
- G01 - MEASURING TESTING
Information Patent Grant
Dual-lens shearing interferometer
- Patent number 5,004,345
- Issue date Apr 2, 1991
- Yau Y. Hung
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for electronic analysis of test objects
- Patent number 4,887,899
- Issue date Dec 19, 1989
- Yau Y. Hung
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric deformation analysis system
- Patent number 4,620,223
- Issue date Oct 28, 1986
- Industrial Holographics, Inc.
- Richard E. Haskell
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interferometric deformation analysis
- Patent number 4,139,302
- Issue date Feb 13, 1979
- Dr. Ralph M. Grant Engineering Consultants, Inc.
- Yau Y. Hung
- G01 - MEASURING TESTING