Yi-Ting Chao

Person

Taipei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for fabricating metal gate devices and resulting structures
- Patent number 12,159,916
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure and method for forming the same
- Patent number 12,100,765
- Issue date Sep 24, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of semiconductor device structure
- Patent number 12,002,872
- Issue date Jun 4, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of titanium silicide and titanium nitride by hy...
- Patent number 11,972,951
- Issue date Apr 30, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device and method of forming the same
- Patent number 11,901,183
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating metal gate devices and resulting structures
- Patent number 11,764,280
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for protecting a semiconductor device
- Patent number 11,605,627
- Issue date Mar 14, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Kuo-Yu Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure and method for forming the same
- Patent number 11,532,748
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of semiconductor device structure
- Patent number 11,444,176
- Issue date Sep 13, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of titanium silicide and titanium nitride by hy...
- Patent number 11,295,956
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor structure with unleveled gat...
- Patent number 11,271,089
- Issue date Mar 8, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chai-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation method of semiconductor device structure with metal-semic...
- Patent number 11,222,818
- Issue date Jan 11, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yi-Hsiang Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFET) device and method
- Patent number 11,139,295
- Issue date Oct 5, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chai-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of semiconductor device structure
- Patent number 11,133,400
- Issue date Sep 28, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field-effect transistor device and method of forming the same
- Patent number 11,107,690
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for protecting a semiconductor device
- Patent number 11,037,922
- Issue date Jun 15, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Kuo-Yu Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with low resistivity contact structure
- Patent number 11,011,611
- Issue date May 18, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image identifying method and image identifying device
- Patent number 11,010,893
- Issue date May 18, 2021
- Wistron Corporation
- Zhe-Yu Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device structure and method for forming the same
- Patent number 10,790,394
- Issue date Sep 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Falling detection method and electronic system using the same
- Patent number 10,783,765
- Issue date Sep 22, 2020
- Wistron Corporation
- Yu-Yen Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fabricating metal gate devices and resulting structures
- Patent number 10,714,587
- Issue date Jul 14, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with low resistivity contact structure and met...
- Patent number 10,700,177
- Issue date Jun 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective formation of titanium silicide and titanium nitride by hy...
- Patent number 10,685,842
- Issue date Jun 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for protecting a semiconductor device
- Patent number 10,636,782
- Issue date Apr 28, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Kuo-Yu Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with unleveled gate structure
- Patent number 10,483,370
- Issue date Nov 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chai-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFET) device structure with uneven g...
- Patent number 10,468,407
- Issue date Nov 5, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chai-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and formation method of semiconductor device structure
- Patent number 10,411,113
- Issue date Sep 10, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFET) device structure and method fo...
- Patent number 10,312,149
- Issue date Jun 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yi-Cheng Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure and method for forming the same
- Patent number 10,269,963
- Issue date Apr 23, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis method of lane stripe images, image analysis device, and n...
- Patent number 10,235,576
- Issue date Mar 19, 2019
- Wistron Corp.
- Shang-Min Yeh
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
WAFER HOLDER ASSEMBLY
- Publication number 20250006528
- Publication date Jan 2, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- CHENG-YOU TAI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME
- Publication number 20240387265
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING METAL GATE DEVICES AND RESULTING STRUCTURES
- Publication number 20240387678
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Structure and Method for Forming the Same
- Publication number 20240372000
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Formation Method of Semiconductor Device Structure
- Publication number 20240274691
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20240136191
- Publication date Apr 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Fabricating Metal Gate Devices and Resulting Structures
- Publication number 20230395689
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE STRUCTURES
- Publication number 20230395426
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Hsiang Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE PRE-CLEANING
- Publication number 20230386822
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Hsiang CHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME
- Publication number 20230260836
- Publication date Aug 17, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pei Shan Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME
- Publication number 20230223302
- Publication date Jul 13, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Pin-Wen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Structure and Method for Forming the Same
- Publication number 20230119022
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Formation Method of Semiconductor Device Structure
- Publication number 20220359726
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...
- Publication number 20220230884
- Publication date Jul 21, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fin Field-Effect Transistor Device and Method of Forming the Same
- Publication number 20210375630
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Protecting a Semiconductor Device
- Publication number 20210288045
- Publication date Sep 16, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Kuo-Yu Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Structure and Method for Forming the Same
- Publication number 20210013338
- Publication date Jan 14, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Fabricating Metal Gate Devices and Resulting Structures
- Publication number 20200343357
- Publication date Oct 29, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH LOW RESISTIVITY CONTACT STRUCTURE
- Publication number 20200335597
- Publication date Oct 22, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Min-Hsiu HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE IDENTIFYING METHOD AND IMAGE IDENTIFYING DEVICE
- Publication number 20200302597
- Publication date Sep 24, 2020
- Wistron Corporation
- Zhe-Yu Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...
- Publication number 20200294807
- Publication date Sep 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PROTECTING A SEMICONDUCTOR DEVICE
- Publication number 20200243510
- Publication date Jul 30, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Kuo-Yu Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20200176260
- Publication date Jun 4, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Min-Hsiu Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FALLING DETECTION METHOD AND ELECTRONIC SYSTEM USING THE SAME
- Publication number 20200090484
- Publication date Mar 19, 2020
- Wistron Corporation
- Yu-Yen Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fin Field Effect Transistor (FinFET) Device and Method
- Publication number 20200066719
- Publication date Feb 27, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chai-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH UNLEVELED GAT...
- Publication number 20200066880
- Publication date Feb 27, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chai-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WITH METAL-SEMIC...
- Publication number 20200020583
- Publication date Jan 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Hsiang CHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...
- Publication number 20190355585
- Publication date Nov 21, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Formation Method of Semiconductor Device Structure
- Publication number 20190334016
- Publication date Oct 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Formation Method of Semiconductor Device Structure
- Publication number 20190305113
- Publication date Oct 3, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Chi Wu
- H01 - BASIC ELECTRIC ELEMENTS

Yi-Ting Chao

Person

Patents Grantslast 30 patents

Method for fabricating metal gate devices and resulting structures

Semiconductor device structure and method for forming the same

Structure and formation method of semiconductor device structure

Selective formation of titanium silicide and titanium nitride by hy...

Fin field-effect transistor device and method of forming the same

Method for fabricating metal gate devices and resulting structures

Systems and methods for protecting a semiconductor device

Semiconductor device structure and method for forming the same

Structure and formation method of semiconductor device structure

Selective formation of titanium silicide and titanium nitride by hy...

Method for manufacturing semiconductor structure with unleveled gat...

Formation method of semiconductor device structure with metal-semic...

Fin field effect transistor (FinFET) device and method

Structure and formation method of semiconductor device structure

Fin field-effect transistor device and method of forming the same

Systems and methods for protecting a semiconductor device

Semiconductor device with low resistivity contact structure

Image identifying method and image identifying device

Semiconductor device structure and method for forming the same

Falling detection method and electronic system using the same

Method for fabricating metal gate devices and resulting structures

Semiconductor device with low resistivity contact structure and met...

Selective formation of titanium silicide and titanium nitride by hy...

Systems and methods for protecting a semiconductor device

Semiconductor structure with unleveled gate structure

Fin field effect transistor (FinFET) device structure with uneven g...

Structure and formation method of semiconductor device structure

Fin field effect transistor (FinFET) device structure and method fo...

Semiconductor device structure and method for forming the same

Analysis method of lane stripe images, image analysis device, and n...

Patents Applicationslast 30 patents

WAFER HOLDER ASSEMBLY

CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

METHOD FOR FABRICATING METAL GATE DEVICES AND RESULTING STRUCTURES

Semiconductor Device Structure and Method for Forming the Same

Structure and Formation Method of Semiconductor Device Structure

FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME

Method for Fabricating Metal Gate Devices and Resulting Structures

CONDUCTIVE STRUCTURES

SEMICONDUCTOR DEVICE PRE-CLEANING

CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

CONTACT FEATURES OF SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME

Semiconductor Device Structure and Method for Forming the Same

Structure and Formation Method of Semiconductor Device Structure

SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...

Fin Field-Effect Transistor Device and Method of Forming the Same

Systems and Methods for Protecting a Semiconductor Device

Semiconductor Device Structure and Method for Forming the Same

Method for Fabricating Metal Gate Devices and Resulting Structures

SEMICONDUCTOR DEVICE WITH LOW RESISTIVITY CONTACT STRUCTURE

IMAGE IDENTIFYING METHOD AND IMAGE IDENTIFYING DEVICE

SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...

SYSTEMS AND METHODS FOR PROTECTING A SEMICONDUCTOR DEVICE

FIN FIELD-EFFECT TRANSISTOR DEVICE AND METHOD OF FORMING THE SAME

FALLING DETECTION METHOD AND ELECTRONIC SYSTEM USING THE SAME

Fin Field Effect Transistor (FinFET) Device and Method

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH UNLEVELED GAT...

FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WITH METAL-SEMIC...

SELECTIVE FORMATION OF TITANIUM SILICIDE AND TITANIUM NITRIDE BY HY...

Structure and Formation Method of Semiconductor Device Structure

Structure and Formation Method of Semiconductor Device Structure