Yih-Yuh Doong

Person

Kaoshsiung, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing a semiconductor product wafer
- Patent number 10,546,792
- Issue date Jan 28, 2020
- PDF Solutions, Inc.
- Yih-Yuh Kelvin Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Direct access memory characterization vehicle
- Patent number 10,410,735
- Issue date Sep 10, 2019
- PDF Solutions, Inc.
- Yih-Yuh Doong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Direct probing characterization vehicle for transistor, capacitor a...
- Patent number 10,380,305
- Issue date Aug 13, 2019
- PDF Solutions, Inc.
- Yih-Yuh Doong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip capacitance measurement for memory characterization vehicle
- Patent number 10,096,378
- Issue date Oct 9, 2018
- PDF Solutions, Inc.
- Yih-Yuh Doong
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacturing a semiconductor product wafer
- Patent number 9,847,264
- Issue date Dec 19, 2017
- PDF Solutions, Inc.
- Yih-Yuh (Kelvin) Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
- Patent number 8,115,500
- Issue date Feb 14, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Method for shape and timing equivalent dimension extraction
- Patent number 8,037,575
- Issue date Oct 18, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ying-Chou Cheng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
- Patent number 7,880,494
- Issue date Feb 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Test pad design for reducing the effect of contact resistances
- Patent number 7,825,678
- Issue date Nov 2, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical parameter extraction for integrated circuit design
- Patent number 7,783,999
- Issue date Aug 24, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsong-Hua Ou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
- Patent number 7,772,868
- Issue date Aug 10, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Versatile semiconductor test structure array
- Patent number 7,405,585
- Issue date Jul 29, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Structure for FIB based microanalysis and method for manufacturing it
- Patent number 6,576,894
- Issue date Jun 10, 2003
- Taiwan Semiconductor Manufacturing Company
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for addressable failure site test structure
- Patent number 6,577,149
- Issue date Jun 10, 2003
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yih-Yuh Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising a test structure
- Patent number 6,396,751
- Issue date May 28, 2002
- Taiwan Semiconductor Manufacturing Corporation, LTD
- Yih-Yuh Doong
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of forming shallow trench isolation structures
- Patent number 6,150,235
- Issue date Nov 21, 2000
- Worldwide Semiconductor Manufacturing Corp.
- Yih-Yuh Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming precisely cross-sectioned electron-transparent sa...
- Patent number 5,940,678
- Issue date Aug 17, 1999
- United Microelectronics Corp.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Grant
Method of removing thin film layers of a semiconductor component
- Patent number 5,926,688
- Issue date Jul 20, 1999
- United Microelectronics Corporation
- Chien-Hsin Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for preventing charging effect and thermal damage in charged...
- Patent number 5,747,803
- Issue date May 5, 1998
- United Microelectronics Corporation
- Yih-Yuh Doong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR PRODUCT WAFER
- Publication number 20180108580
- Publication date Apr 19, 2018
- PDF Solutions, Inc.
- Yih-Yuh Kelvin DOONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
- Publication number 20110168995
- Publication date Jul 14, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
- Publication number 20100156453
- Publication date Jun 24, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
Test Pad Design for Reducing the Effect of Contact Resistances
- Publication number 20100045325
- Publication date Feb 25, 2010
- Yih-Yuh Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SHAPE AND TIMING EQUIVALENT DIMENSION EXTRACTION
- Publication number 20090222785
- Publication date Sep 3, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ying-Chou CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrical Parameter Extraction for Integrated Circuit Design
- Publication number 20090187866
- Publication date Jul 23, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsong-Hua Ou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
- Publication number 20090002012
- Publication date Jan 1, 2009
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
Versatile semiconductor test structure array
- Publication number 20070200587
- Publication date Aug 30, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yih-Yuh Doong
- G01 - MEASURING TESTING
Information Patent Application
Model-based insertion of irregular dummy features
- Publication number 20050205961
- Publication date Sep 22, 2005
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yih Yuh Doong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for semiconductor wafer testing
- Publication number 20020089345
- Publication date Jul 11, 2002
- Yih-Yuh Doong
- H01 - BASIC ELECTRIC ELEMENTS

Yih-Yuh Doong

Person

Patents Grantslast 30 patents

Method for manufacturing a semiconductor product wafer

Direct access memory characterization vehicle

Direct probing characterization vehicle for transistor, capacitor a...

On-chip capacitance measurement for memory characterization vehicle

Method for manufacturing a semiconductor product wafer

Accurate capacitance measurement for ultra large scale integrated c...

Method for shape and timing equivalent dimension extraction

Accurate capacitance measurement for ultra large scale integrated c...

Test pad design for reducing the effect of contact resistances

Electrical parameter extraction for integrated circuit design

Accurate capacitance measurement for ultra large scale integrated c...

Versatile semiconductor test structure array

Structure for FIB based microanalysis and method for manufacturing it

Method and device for addressable failure site test structure

Semiconductor device comprising a test structure

Method of forming shallow trench isolation structures

Method of forming precisely cross-sectioned electron-transparent sa...

Method of removing thin film layers of a semiconductor component

Method for preventing charging effect and thermal damage in charged...

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING A SEMICONDUCTOR PRODUCT WAFER

Accurate Capacitance Measurement for Ultra Large Scale Integrated C...

Accurate Capacitance Measurement for Ultra Large Scale Integrated C...

Test Pad Design for Reducing the Effect of Contact Resistances

METHOD FOR SHAPE AND TIMING EQUIVALENT DIMENSION EXTRACTION

Electrical Parameter Extraction for Integrated Circuit Design

Accurate Capacitance Measurement for Ultra Large Scale Integrated C...

Versatile semiconductor test structure array

Model-based insertion of irregular dummy features

Method and device for semiconductor wafer testing