YIJ CHIEH CHU

Person

TAIPEI COUNTY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Fault detection method of semiconductor manufacturing processes and...
- Patent number 8,756,028
- Issue date Jun 17, 2014
- Inotera Memories, Inc.
- Yij Chieh Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting variance in semiconductor processes
- Patent number 8,649,990
- Issue date Feb 11, 2014
- Inotera Memories, Inc.
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system of compressing raw fabrication data for fault det...
- Patent number 8,510,610
- Issue date Aug 13, 2013
- Inotera Memories, Inc.
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Specification establishing method for controlling semiconductor pro...
- Patent number 8,332,416
- Issue date Dec 11, 2012
- Inotera Memories, Inc.
- Cheng-Hao Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for assessing data worth for analyzing yield rate
- Patent number 8,265,903
- Issue date Sep 11, 2012
- Inotera Memories, Inc.
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of adjusting wafer processing sequence
- Patent number 8,244,500
- Issue date Aug 14, 2012
- Inotera Memories, Inc.
- Yun-Zong Tian
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM OF COMPRESSING RAW FABRICATION DATA FOR FAULT DET...
- Publication number 20120331357
- Publication date Dec 27, 2012
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION METHOD OF SEMICONDUCTOR MANUFACTURING PROCESSES AND...
- Publication number 20120330591
- Publication date Dec 27, 2012
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECIFICATION ESTABLISHING METHOD FOR CONTROLLING SEMICONDUCTOR PRO...
- Publication number 20120102052
- Publication date Apr 26, 2012
- INOTERA MEMORIES, INC.
- CHENG-HAO CHEN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES
- Publication number 20110257932
- Publication date Oct 20, 2011
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR PLANNING PRODUCTION SCHEDULE OF EQUIPMENT AND ASSOCIATED...
- Publication number 20110251708
- Publication date Oct 13, 2011
- Wei-Jun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...
- Publication number 20110153660
- Publication date Jun 23, 2011
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
YIELD LOSS PREDICTION METHOD AND ASSOCIATED COMPUTER READABLE MEDIUM
- Publication number 20110137595
- Publication date Jun 9, 2011
- Yij-Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for assessing data worth for analyzing yield rate
- Publication number 20100268501
- Publication date Oct 21, 2010
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF ADJUSTING WAFER PROCESSING SEQUENCE
- Publication number 20100256792
- Publication date Oct 7, 2010
- INOTERA MEMORIES, INC.
- YUN-ZONG TIAN
- G05 - CONTROLLING REGULATING
Information Patent Application
MONITORING METHOD FOR MULTI TOOLS
- Publication number 20100223027
- Publication date Sep 2, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...
- Publication number 20100093114
- Publication date Apr 15, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETERMINING TOOL'S PRODUCTION QUALITY
- Publication number 20100049355
- Publication date Feb 25, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES
- Publication number 20100010763
- Publication date Jan 14, 2010
- INOTERA MEMORIES INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST...
- Publication number 20100004882
- Publication date Jan 7, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING

YIJ CHIEH CHU

Person

Patents Grantslast 30 patents

Fault detection method of semiconductor manufacturing processes and...

Method for detecting variance in semiconductor processes

Method and system of compressing raw fabrication data for fault det...

Specification establishing method for controlling semiconductor pro...

Method for assessing data worth for analyzing yield rate

Method of adjusting wafer processing sequence

Patents Applicationslast 30 patents

METHOD AND SYSTEM OF COMPRESSING RAW FABRICATION DATA FOR FAULT DET...

FAULT DETECTION METHOD OF SEMICONDUCTOR MANUFACTURING PROCESSES AND...

SPECIFICATION ESTABLISHING METHOD FOR CONTROLLING SEMICONDUCTOR PRO...

METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES

METHOD FOR PLANNING PRODUCTION SCHEDULE OF EQUIPMENT AND ASSOCIATED...

METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...

YIELD LOSS PREDICTION METHOD AND ASSOCIATED COMPUTER READABLE MEDIUM

Method for assessing data worth for analyzing yield rate

METHOD OF ADJUSTING WAFER PROCESSING SEQUENCE

MONITORING METHOD FOR MULTI TOOLS

METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...

METHOD FOR DETERMINING TOOL'S PRODUCTION QUALITY

METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES

FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST...