The present invention relates to a method for determining the production quality of manufacturing tools, in particular to a method that can diagnose a manufacturing tool of substandard quality.
Yield is an important index in the tradition semiconductor manufacturing factory. On one hand yield represents the efficiency of the semiconductor manufacturing process, on the other hand yield has an effect on the costs of semiconductor manufacturing. Thus, yield influences the profits of semiconductor manufacturing. For the reason, how to improve yield is the most important issue for the semiconductor manufacturing factory.
The semiconductor manufacturing factory has several manufacturing tools. The production quality of each manufacturing tool influences the yield of a semiconductor assembly line. The production quality of each manufacturing tool is recorded in daily records and saved in a database. But the records are often neglected. As a result, nobody knows when a manufacturing tool causes problems until a plurality of bad lots are produced. Therefore the occurrence of bad lots may incur large financial losses. If we can diagnose substandard manufacturing tools and the degree of the substandard condition via the records, the problems would be solved earlier. The yield and the cost of manufacturing would be improved.
Therefore, in view of this, the inventor proposes the present invention to overcome the above problems based on his expert experience and deliberate research.
The object of the present invention is to provide a method for determining the production quality of the manufacturing tools. Using a method for determining production quality to find out a manufacturing tool with a substandard production quality. The problems can be solved as soon as possible. The yield and the cost are improved.
For achieving the object described above, the present invention provides a method for determining the production quality of the manufacturing tools. The steps include providing a table with manufacturing process data, analyzing the table and establishing a contingency table. The contingency table comprises manufacturing tools, manufacturing processes, and the number of occurrences of bad lots. The contingency table is split up into a plurality of sub-tables. The Cochran-Mantel-Haenszel test is used for determining the number of bad lots produced by the manufacturing tools and getting a plurality of statistics. The statistics are translated into a plurality of P-values. Sort P-values for examining data automatically. Draw a line chart for detecting substandard manufacturing tools.
The present invention has advantageous effects as follows. Use Cochran-Mantel-Haenszel test for determining the number of bad lots produced by the manufacturing tools, and translate the statistics into a plurality of P-values. Sort the P-values for examining data automatically. Draw a line chart for detecting substandard manufacturing tools. Thus, the problems can be solved as soon as possible. The yield and the cost are improved.
In order to further understand the characteristics and technical contents of the present invention, a detailed description is made with reference to the accompanying drawings. However, it should be understood that the drawings are illustrative only but not used to limit the present invention thereto.
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(S01) Collecting a chart with daily semiconductor manufacturing process data (please refer to
(S102) Split the contingency table by conditional independence to choose the manufacturing tools which are part of the same manufacturing processes, and then make a sub-table (please refer to
(S103) In order to determine whether there is relation between manufacturing tools, manufacturing processes, and number of bad lots, we use the statistical method of the Cochran Mantel Haenszel Test to determine whether the number of bad lots produced by the manufacturing tools while performing the manufacturing processes in the sub-table is similar. By means of the Cochran Mantel Haenszel Test, we can determine the rate distribution of the statistics, and determine a plurality of P-values of the manufacturing tools. Assuming the production quality of the manufacturing tools is similar (Hypothesis test), the following formula applies:
where CMH is the test statistic, η is the observed frequencies, μ is the expected frequencies, χ2 is chi-square, α is the level of significance set by the user, P represents the smallest value of the level of significance that can reject null hypothesis (H0), and K represents a manufacturing process.
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(S104) Please refer to
Using daily manufacturing process data, for example, the quantities of the good lots and bad lots. Figure out the number of bad lots produced by the manufacturing tool ASCA107 and ASCA108 while performing the manufacturing processes. Draw a line chart of the manufacturing tools versus the number of bad lots. Please refer to
The present invention is provided a method that users use the Cochran-Mantel-Haenszel test for determining the number of bad lots produced by the manufacturing tools and getting a plurality of statistics. Translate the statistics into a plurality of P-values. Sort the P-values for examining data automatically. Draw a line chart for detecting substandard manufacturing tools. Thus, the problems can be solved as soon as possible. The yield and the cost are improved.
While the present invention has been described in terms of what is presently considered to be the most practical and preferred embodiments, it is to be understood that the present invention needs not be limited to the disclosed embodiment. On the contrary, it is intended to cover various modifications and similar arrangements included within the spirit and scope of the appended claims which are to be accorded with the broadest interpretation so as to encompass all such modifications and similar structures.
Number | Date | Country | Kind |
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97131687 | Aug 2008 | TW | national |