Ying Shiau

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for detecting defect sizes in polysilicon and source-drai...
- Patent number 6,001,663
- Issue date Dec 14, 1999
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting defect sizes in polysilicon and source-drain s...
- Patent number 5,963,780
- Issue date Oct 5, 1999
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement and method for detecting sequential processing effects...
- Patent number 5,930,138
- Issue date Jul 27, 1999
- Advanced Micro Devices, Inc.
- Yung-Tao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting manufactured products for defec...
- Patent number 5,896,294
- Issue date Apr 20, 1999
- Advanced Micro Devices, Inc.
- Wanyee Apple Chow
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus for detecting defect sizes in polysilicon and source-drai...
- Patent number 5,821,765
- Issue date Oct 13, 1998
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for automated wafer level testing and reliabil...
- Patent number 5,822,717
- Issue date Oct 13, 1998
- Advanced Micro Devices, Inc.
- Jerry Tsiang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern recognition of wafer test bins
- Patent number 5,787,190
- Issue date Jul 28, 1998
- Advanced Micro Devices, Inc.
- Yeng-Kaung Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement and method for detecting sequential processing effects...
- Patent number 5,761,065
- Issue date Jun 2, 1998
- Advanced Micro Devices, Inc.
- Richard Charles Kittler
- G05 - CONTROLLING REGULATING
Information Patent Grant
Defect management system for productivity and yield improvement
- Patent number 5,761,064
- Issue date Jun 2, 1998
- Advanced Micro Devices, Inc.
- Tho Le La
- G01 - MEASURING TESTING
Information Patent Grant
Watchdog system having data differentiating means for use in monito...
- Patent number 5,726,920
- Issue date Mar 10, 1998
- Advanced Micro Devices, Inc.
- Susan Hsuching Chen
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for detecting sequential processing effects...
- Patent number 5,716,856
- Issue date Feb 10, 1998
- Advanced Micro Devices, Inc.
- Yung-Tao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures to extract defect size information of poly and source-dr...
- Patent number 5,670,891
- Issue date Sep 23, 1997
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time in-line defect disposition and yield forecasting system
- Patent number 5,598,341
- Issue date Jan 28, 1997
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Apparatus for detecting defect sizes in polysilicon and source-drai...

Method for detecting defect sizes in polysilicon and source-drain s...

Arrangement and method for detecting sequential processing effects...

Method and apparatus for inspecting manufactured products for defec...

Apparatus for detecting defect sizes in polysilicon and source-drai...

Method and apparatus for automated wafer level testing and reliabil...

Method and apparatus for pattern recognition of wafer test bins

Arrangement and method for detecting sequential processing effects...

Defect management system for productivity and yield improvement

Watchdog system having data differentiating means for use in monito...

Arrangement and method for detecting sequential processing effects...

Structures to extract defect size information of poly and source-dr...

Real-time in-line defect disposition and yield forecasting system