Yoba Amoah

Person

Fairfax, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Backside binary grated lens coupled to front side waveguide
- Patent number 11,409,046
- Issue date Aug 9, 2022
- International Business Machines Corporation
- Yoba Amoah
- G02 - OPTICS
Information Patent Grant
Backside binary grated lens coupled to front side waveguide
- Patent number 10,605,992
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Yoba Amoah
- G02 - OPTICS
Information Patent Grant
Backside binary grated lens coupled to front side waveguide
- Patent number 9,910,223
- Issue date Mar 6, 2018
- International Business Machines Corporation
- Yoba Amoah
- G02 - OPTICS
Information Patent Grant
Frontside coupled waveguide with backside optical connection using...
- Patent number 9,709,748
- Issue date Jul 18, 2017
- International Business Machines Corporation
- Yoba Amoah
- G02 - OPTICS
Information Patent Grant
Backside binary grated lens coupled to front side waveguide
- Patent number 9,690,051
- Issue date Jun 27, 2017
- International Business Machines Corporation
- Yoba Amoah
- G02 - OPTICS
Information Patent Grant
Tsv wafer with improved fracture strength
- Patent number 9,607,929
- Issue date Mar 28, 2017
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming a TSV wafer with improved fracture strength
- Patent number 9,312,205
- Issue date Apr 12, 2016
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip identification pattern and method of forming
- Patent number 9,136,222
- Issue date Sep 15, 2015
- GLOBALFOUNDRIES, INC.
- Yoba Amoah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Built-in self-test method and structure
- Patent number 8,890,557
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Yoba Amoah
- G11 - INFORMATION STORAGE
Information Patent Grant
Contact formation method incorporating preventative etch step reduc...
- Patent number 8,691,690
- Issue date Apr 8, 2014
- International Business Machines Corporation
- Yoba Amoah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Locally tailoring chemical mechanical polishing (CMP) polish rate f...
- Patent number 8,637,403
- Issue date Jan 28, 2014
- International Business Machines Corporation
- Yoba Amoah
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE
- Publication number 20200150348
- Publication date May 14, 2020
- International Business Machines Corporation
- Yoba AMOAH
- G02 - OPTICS
Information Patent Application
BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE
- Publication number 20180067264
- Publication date Mar 8, 2018
- International Business Machines Corporation
- Yoba AMOAH
- G02 - OPTICS
Information Patent Application
BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE
- Publication number 20170160483
- Publication date Jun 8, 2017
- International Business Machines Corporation
- Yoba AMOAH
- G02 - OPTICS
Information Patent Application
FRONTSIDE COUPLED WAVEGUIDE WITH BACKSIDE OPTICAL CONNECTION
- Publication number 20170068052
- Publication date Mar 9, 2017
- International Business Machines Corporation
- Yoba AMOAH
- G02 - OPTICS
Information Patent Application
BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE
- Publication number 20170003452
- Publication date Jan 5, 2017
- International Business Machines Corporation
- Yoba AMOAH
- G02 - OPTICS
Information Patent Application
TSV WAFER WITH IMPROVED FRACTURE STRENGTH
- Publication number 20150348876
- Publication date Dec 3, 2015
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TSV WAFER FRACTURE STRENGTH
- Publication number 20150255404
- Publication date Sep 10, 2015
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP IDENTIFICATION PATTERN AND METHOD OF FORMING
- Publication number 20130299939
- Publication date Nov 14, 2013
- International Business Machines Corporation
- Yoba Amoah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUILT-IN SELF-TEST METHOD AND STRUCTURE
- Publication number 20130265068
- Publication date Oct 10, 2013
- International Business Machines Corporation
- Yoba Amoah
- G01 - MEASURING TESTING
Information Patent Application
LOCALLY TAILORING CHEMICAL MECHANICAL POLISHING (CMP) POLISH RATE F...
- Publication number 20130147067
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Yoba AMOAH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT FORMATION METHOD INCORPORATING A PREVENTATIVE ETCH STEP FOR...
- Publication number 20120064714
- Publication date Mar 15, 2012
- International Business Machines Corporation
- Yoba Amoah
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Backside binary grated lens coupled to front side waveguide

Backside binary grated lens coupled to front side waveguide

Backside binary grated lens coupled to front side waveguide

Frontside coupled waveguide with backside optical connection using...

Backside binary grated lens coupled to front side waveguide

Tsv wafer with improved fracture strength

Methods of forming a TSV wafer with improved fracture strength

Chip identification pattern and method of forming

Built-in self-test method and structure

Contact formation method incorporating preventative etch step reduc...

Locally tailoring chemical mechanical polishing (CMP) polish rate f...

Patents Applicationslast 30 patents

BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE

BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE

BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE

FRONTSIDE COUPLED WAVEGUIDE WITH BACKSIDE OPTICAL CONNECTION

BACKSIDE BINARY GRATED LENS COUPLED TO FRONT SIDE WAVEGUIDE

TSV WAFER WITH IMPROVED FRACTURE STRENGTH

TSV WAFER FRACTURE STRENGTH

CHIP IDENTIFICATION PATTERN AND METHOD OF FORMING

BUILT-IN SELF-TEST METHOD AND STRUCTURE

LOCALLY TAILORING CHEMICAL MECHANICAL POLISHING (CMP) POLISH RATE F...

CONTACT FORMATION METHOD INCORPORATING A PREVENTATIVE ETCH STEP FOR...