TREA

Yoichi Aruga

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Method of washing an aspiration probe of an in-vitro diagnostic sys...
    • Patent number 11,879,904
    • Issue date Jan 23, 2024
    • Roche Diagnostics Operations, Inc.
    • Kouhei Nonaka
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer and method for washing sample-pipetting probe
    • Patent number 11,480,504
    • Issue date Oct 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and cleaning method
    • Patent number 11,231,433
    • Issue date Jan 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki Muramatsu
    • B08 - CLEANING
  • Information Patent Grant

    Method of washing an aspiration probe of an in-vitro diagnostic sys...
    • Patent number 11,169,169
    • Issue date Nov 9, 2021
    • Roche Diagnostics Operations, Inc.
    • Kouhei Nonaka
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,041,874
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Saori Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,094,841
    • Issue date Oct 9, 2018
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzing apparatus
    • Patent number 9,989,550
    • Issue date Jun 5, 2018
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and method for washing sample-pipetting probe
    • Patent number 9,897,519
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,618,526
    • Issue date Apr 11, 2017
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,383,375
    • Issue date Jul 5, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,341,638
    • Issue date May 17, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chemical analyzer
    • Patent number 8,916,113
    • Issue date Dec 23, 2014
    • Hitachi High-Technologies Corporation
    • Hironobu Yamakawa
    • B08 - CLEANING
  • Information Patent Grant

    Chemical analyzer
    • Patent number 8,747,744
    • Issue date Jun 10, 2014
    • Hitachi High-Technologies Corporation
    • Hironobu Yamakawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220283195
    • Publication date Sep 8, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiromi HIRAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF WASHING AN ASPIRATION PROBE OF AN IN-VITRO DIAGNOSTIC SYS...
    • Publication number 20220113331
    • Publication date Apr 14, 2022
    • Roche Diagnostics Operations, Inc.
    • Kouhei Nonaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200096529
    • Publication date Mar 26, 2020
    • Hitachi High-Technologies Corporation
    • Saori CHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF WASHING AN ASPIRATION PROBE OF AN IN-VITRO DIAGNOSTIC SYS...
    • Publication number 20190369132
    • Publication date Dec 5, 2019
    • Roche Diagnostics Operations, Inc.
    • Kouhei Nonaka
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER AND CLEANING METHOD
    • Publication number 20190049477
    • Publication date Feb 14, 2019
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
    • Publication number 20180156702
    • Publication date Jun 7, 2018
    • Hitachi High-Technologies Corporation
    • Naoto SUZUKI
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Application

    AUTOMATED ANALYZING APPARATUS
    • Publication number 20150369833
    • Publication date Dec 24, 2015
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20150153370
    • Publication date Jun 4, 2015
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150044096
    • Publication date Feb 12, 2015
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
    • Publication number 20140363896
    • Publication date Dec 11, 2014
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20140322080
    • Publication date Oct 30, 2014
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140170027
    • Publication date Jun 19, 2014
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140147335
    • Publication date May 29, 2014
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHEMICAL ANALYZER
    • Publication number 20130121883
    • Publication date May 16, 2013
    • Hitachi High-Technologies Corporation
    • Hironobu YAMAKAWA
    • B08 - CLEANING
  • Information Patent Application

    CHEMICAL ANALYZER
    • Publication number 20120107180
    • Publication date May 3, 2012
    • Hitachi High-Technologies Corporation
    • Hironobu Yamakawa
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110058984
    • Publication date Mar 10, 2011
    • Hitachi High-Technologies Corporation
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SEPARATOR AND ANALYZER USING THE SAME
    • Publication number 20080206099
    • Publication date Aug 28, 2008
    • Yoichi ARUGA
    • B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...