Tokyo, JP
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Yoshifumi Wakisaka
G01 - MEASURING TESTING
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Yoshifumi Wakisaka
G01 - MEASURING TESTING
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Yoshifumi Wakisaka
G01 - MEASURING TESTING
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Tomokazu Oda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Atsushi Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Daisuke Iida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Atsushi Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Yoshifumi Wakisaka
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
The University of Tokyo
Yasuyuki Ozeki
G01 - MEASURING TESTING
Information
Patent Grant
Nippon Telegraph and Telephone Corporation
Kunihiro Toge
G02 - OPTICS
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Daisuke IIDA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Atsushi NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Atsushi NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Tomokazu ODA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Daisuke IIDA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Kunihiro Toge
G01 - MEASURING TESTING
Information
Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
Information
Patent Application
THE UNIVERSITY OF TOKYO
Yasuyuki OZEKI
G01 - MEASURING TESTING
