Yoshiharu Shirakawabe

Person

Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cell detachment method
- Patent number 8,859,279
- Issue date Oct 14, 2014
- Hitachi High-Tech Science Corporation
- Amiko Nihei
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cantilever and cantilever manufacturing method
- Patent number 7,823,470
- Issue date Nov 2, 2010
- Seiko Instruments Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for manufacturing a split probe
- Patent number 7,494,575
- Issue date Feb 24, 2009
- SII NanoTechnology Inc.
- Shoji Sadayama
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating nanometer-scale structure
- Patent number 7,476,418
- Issue date Jan 13, 2009
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,456,400
- Issue date Nov 25, 2008
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning microscope
- Patent number 7,398,678
- Issue date Jul 15, 2008
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface characteristic analysis apparatus
- Patent number 7,337,656
- Issue date Mar 4, 2008
- SII NanoTechnology Inc.
- Yoshiharu Shirakawabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing the multi-tip probe, a multi-tip probe, and...
- Patent number 6,953,519
- Issue date Oct 11, 2005
- SII NanoTechnology Inc.
- Yoshiharu Shirakawabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and operation method
- Patent number 6,941,798
- Issue date Sep 13, 2005
- SII NanoTechnology Inc.
- Takehiro Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Heated self-detecting type cantilever for atomic force microscope
- Patent number 6,932,504
- Issue date Aug 23, 2005
- SII NanoTechnology Inc.
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Conductive probe for scanning microscope and machining method using...
- Patent number 6,787,769
- Issue date Sep 7, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning microscope produced by focused ion beam machining
- Patent number 6,759,653
- Issue date Jul 6, 2004
- Yoshikazu Nakayama
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for vertical scanning microscope and probe for vertical...
- Patent number 6,705,154
- Issue date Mar 16, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Microprobe and scanning probe apparatus having microprobe
- Patent number 6,667,467
- Issue date Dec 23, 2003
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Microprobe and sample surface measuring apparatus
- Patent number 6,664,540
- Issue date Dec 16, 2003
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Multiprobe and scanning probe microscope
- Patent number 6,469,293
- Issue date Oct 22, 2002
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-exciting and self-detecting probe and scanning probe apparatus
- Patent number 6,422,069
- Issue date Jul 23, 2002
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Correlation sample for scanning probe microscope and method of proc...
- Patent number 6,405,583
- Issue date Jun 18, 2002
- Seiko Instruments Inc.
- Yoshiharu Shirakawabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-detecting type of SPM probe and SPM device
- Patent number 6,388,252
- Issue date May 14, 2002
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe microscope (SPM) and SPM device
- Patent number 6,383,823
- Issue date May 7, 2002
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of processing circular patterning
- Patent number 6,294,099
- Issue date Sep 25, 2001
- Seiko Instruments Inc.
- Yoshiharu Shirakawabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor strain sensor and scanning probe microscope using the...
- Patent number 6,211,540
- Issue date Apr 3, 2001
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor manufacturing device
- Patent number 6,171,437
- Issue date Jan 9, 2001
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope, and semiconductor distortion sensor for...
- Patent number 6,049,115
- Issue date Apr 11, 2000
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever probe and scanning type probe microscope utilizing the c...
- Patent number 5,992,225
- Issue date Nov 30, 1999
- Seiko Instruments Inc.
- Yoshiharu Shirakawabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Cell detachment method
- Publication number 20070292946
- Publication date Dec 20, 2007
- Amiko Nihei
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MULTI-TIP SURFACE CANTILEVER PROBE
- Publication number 20070278405
- Publication date Dec 6, 2007
- Yoshiharu Shirakawabe
- G01 - MEASURING TESTING
Information Patent Application
Cantilever and cantilever manufacturing method
- Publication number 20070214875
- Publication date Sep 20, 2007
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Living cell observing cell
- Publication number 20070134787
- Publication date Jun 14, 2007
- Yoshiharu Shirakawabe
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20060113472
- Publication date Jun 1, 2006
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing the multi-tip probe, a multi-tip probe, and...
- Publication number 20060011467
- Publication date Jan 19, 2006
- Yoshiharu Shirakawabe
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing the multi-tip probe, a multi-tip probe, and...
- Publication number 20060011830
- Publication date Jan 19, 2006
- Yoshiharu Shirakawabe
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing a split probe
- Publication number 20050133717
- Publication date Jun 23, 2005
- Shoji Sadayama
- G01 - MEASURING TESTING
Information Patent Application
Method for fabricating nanometer-scale structure
- Publication number 20050089463
- Publication date Apr 28, 2005
- Masatoshi Yasutake
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Scanning probe microscope and operation method
- Publication number 20040093935
- Publication date May 20, 2004
- Takehiro Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing the multi-tip probe, a multi-tip probe, and...
- Publication number 20040074288
- Publication date Apr 22, 2004
- Yoshiharu Shirakawabe
- G01 - MEASURING TESTING
Information Patent Application
Temperature measurement probe and temperature measurement apparatus
- Publication number 20040028119
- Publication date Feb 12, 2004
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Cantilever for vertical scanning microscope and probe for vertical...
- Publication number 20030010100
- Publication date Jan 16, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
SPM physical characteristic measuring method, measurement program,...
- Publication number 20020179833
- Publication date Dec 5, 2002
- Yoshiharu Shirakawabe
- B82 - NANO-TECHNOLOGY
Information Patent Application
Self-detecting type SPM probe
- Publication number 20020178801
- Publication date Dec 5, 2002
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microprobe and scanning type probe apparatus using thereof
- Publication number 20020020805
- Publication date Feb 21, 2002
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microprobe and sample surface measuring apparatus
- Publication number 20010028033
- Publication date Oct 11, 2001
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY

Yoshiharu Shirakawabe

Person

Patents Grantslast 30 patents

Cell detachment method

Cantilever and cantilever manufacturing method

Method for manufacturing a split probe

Method for fabricating nanometer-scale structure

Scanning probe microscope and scanning method

Probe for a scanning microscope

Surface characteristic analysis apparatus

Method of manufacturing the multi-tip probe, a multi-tip probe, and...

Scanning probe microscope and operation method

Heated self-detecting type cantilever for atomic force microscope

Conductive probe for scanning microscope and machining method using...

Probe for scanning microscope produced by focused ion beam machining

Cantilever for vertical scanning microscope and probe for vertical...

Microprobe and scanning probe apparatus having microprobe

Microprobe and sample surface measuring apparatus

Multiprobe and scanning probe microscope

Self-exciting and self-detecting probe and scanning probe apparatus

Correlation sample for scanning probe microscope and method of proc...

Self-detecting type of SPM probe and SPM device

Probe for scanning probe microscope (SPM) and SPM device

Method of processing circular patterning

Semiconductor strain sensor and scanning probe microscope using the...

Semiconductor manufacturing device

Scanning probe microscope, and semiconductor distortion sensor for...

Cantilever probe and scanning type probe microscope utilizing the c...

Patents Applicationslast 30 patents

Cell detachment method

MULTI-TIP SURFACE CANTILEVER PROBE

Cantilever and cantilever manufacturing method

Living cell observing cell

Probe for a scanning microscope

Scanning probe microscope and scanning method

Method of manufacturing the multi-tip probe, a multi-tip probe, and...

Method of manufacturing the multi-tip probe, a multi-tip probe, and...

Method for manufacturing a split probe

Method for fabricating nanometer-scale structure

Scanning probe microscope and operation method

Method of manufacturing the multi-tip probe, a multi-tip probe, and...

Temperature measurement probe and temperature measurement apparatus

Cantilever for vertical scanning microscope and probe for vertical...

SPM physical characteristic measuring method, measurement program,...

Self-detecting type SPM probe

Microprobe and scanning type probe apparatus using thereof

Microprobe and sample surface measuring apparatus