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Yoshihiko Isobe
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Obu, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Physical sensor
Patent number
8,146,426
Issue date
Apr 3, 2012
Denso Corporation
Kazuhiko Sugiura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor sensor for measuring a physical quantity and method o...
Patent number
7,644,623
Issue date
Jan 12, 2010
Denso Corporation
Hisanori Yokura
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
6,908,857
Issue date
Jun 21, 2005
Denso Corporation
Kazuo Akamatsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrical wiring of semiconductor device enabling increase in elec...
Patent number
6,650,017
Issue date
Nov 18, 2003
Denso Corporation
Kazuo Akamatsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrode for semiconductor device and method for manufacturing same
Patent number
6,348,735
Issue date
Feb 19, 2002
Nippondenso Co., Lt.
Tooru Yamaoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Insulated gate transistor with leakage current prevention feature
Patent number
6,337,504
Issue date
Jan 8, 2002
Denso Corporation
Yoshihiko Isobe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having thin film resistor and method of produc...
Patent number
6,287,933
Issue date
Sep 11, 2001
Nippondenso Co., Ltd.
Makio Iida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device including several transistors and method of ma...
Patent number
6,198,140
Issue date
Mar 6, 2001
Denso Corporation
Hidetoshi Muramoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrode for semiconductor device including an alloy wiring layer...
Patent number
6,066,891
Issue date
May 23, 2000
Nippondenso Co., Ltd.
Tooru Yamaoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Programmable non-volatile memory cell
Patent number
5,747,846
Issue date
May 5, 1998
Nippondenso Co., Ltd.
Makio Iida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device equipped with a heat-fusible thin film resisto...
Patent number
5,625,218
Issue date
Apr 29, 1997
Nippondenso Co., Ltd.
Hideya Yamadera
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of making semiconductor device using a trimmable thin-film r...
Patent number
5,284,794
Issue date
Feb 8, 1994
Nippondenso Co., Ltd.
Yoshihiko Isobe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and process for producing same
Patent number
5,187,559
Issue date
Feb 16, 1993
Nippondenso Co., Ltd.
Yoshihiko Isobe
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Physical sensor
Publication number
20090199637
Publication date
Aug 13, 2009
DENSO CORPORATION
Kazuhiko Sugiura
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor sensor and method of manufacturing the same
Publication number
20080202249
Publication date
Aug 28, 2008
DENSO CORPORATION
Hisanori Yokura
G01 - MEASURING TESTING
Information
Patent Application
Vertical Hall device and method for adjusting offset voltage of ver...
Publication number
20060097715
Publication date
May 11, 2006
DENSO CORPORATION
Satoshi Oohira
G01 - MEASURING TESTING
Information
Patent Application
Method of manufacturing semiconductor device
Publication number
20040046266
Publication date
Mar 11, 2004
Kazuo Akamatsu
H01 - BASIC ELECTRIC ELEMENTS