Yoshihiro KANETANI

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Fukuchiyama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical measurement apparatus having a synchronizing function of sy...
- Patent number 10,514,294
- Issue date Dec 24, 2019
- Omron Corporation
- Yoshihiro Kanetani
- G05 - CONTROLLING REGULATING
Information Patent Grant
Displacement measuring device, measuring system and displacement me...
- Patent number 10,495,448
- Issue date Dec 3, 2019
- Omron Corporation
- Tomonori Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement apparatus
- Patent number 8,917,900
- Issue date Dec 23, 2014
- Omron Corporation
- Yoshihiro Kanetani
- G01 - MEASURING TESTING
Information Patent Grant
Device for and method of inspecting surface condition having differ...
- Patent number 7,782,451
- Issue date Aug 24, 2010
- Omron Corporation
- Toshihiko Matsumoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20220075062
- Publication date Mar 10, 2022
- Omron Corporation
- Jun TAKASHIMA
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASURING DEVICE, MEASURING SYSTEM AND DISPLACEMENT ME...
- Publication number 20190094013
- Publication date Mar 28, 2019
- Omron Corporation
- Tomonori KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS
- Publication number 20180010962
- Publication date Jan 11, 2018
- Omron Corporation
- Yoshihiro KANETANI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20100232650
- Publication date Sep 16, 2010
- OMRON CORPORATION
- Yoshihiro KANETANI
- G02 - OPTICS
Information Patent Application
Defect inspection apparatus and defect inspection method
- Publication number 20070211242
- Publication date Sep 13, 2007
- OMRON CORPORATION
- Hiroshi Okabe
- G01 - MEASURING TESTING
Information Patent Application
Device for and method of inspecting surface condition
- Publication number 20070211240
- Publication date Sep 13, 2007
- OMRON CORPORATION
- Toshihiko Matsumoto
- G01 - MEASURING TESTING