Yoshihiro Kobayashi

Person

Matsumoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor device and electronic apparatus
- Patent number 12,031,847
- Issue date Jul 9, 2024
- Seiko Epson Corporation
- Masayasu Sakuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Derivation method of diagnosing a state of a superstructure, deriva...
- Patent number 11,988,579
- Issue date May 21, 2024
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Determining abnormalities in the superstructure of a bridge based o...
- Patent number 11,982,595
- Issue date May 14, 2024
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality determination for bridge superstructure based on accele...
- Patent number 11,921,012
- Issue date Mar 5, 2024
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Time point acquisition method, time point acquisition device, time...
- Patent number 11,892,377
- Issue date Feb 6, 2024
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method, measurement device, measurement system, and mea...
- Patent number 11,881,102
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G08 - SIGNALLING
Information Patent Grant
Measurement method, measurement device, measurement system, and mea...
- Patent number 11,761,811
- Issue date Sep 19, 2023
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method, measurement device, measurement system, and mea...
- Patent number 11,761,812
- Issue date Sep 19, 2023
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method, measurement device, measurement system, and mea...
- Patent number 11,714,021
- Issue date Aug 1, 2023
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Bridge displacement measurement method
- Patent number 11,713,993
- Issue date Aug 1, 2023
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and electronic apparatus
- Patent number 11,709,079
- Issue date Jul 25, 2023
- Seiko Epson Corporation
- Masayasu Sakuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method, measurement device, measurement system, and mea...
- Patent number 11,408,761
- Issue date Aug 9, 2022
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G08 - SIGNALLING
Information Patent Grant
Sensor device and electronic apparatus
- Patent number 11,215,484
- Issue date Jan 4, 2022
- Seiko Epson Corporation
- Masayasu Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Resampling circuit, physical quantity sensor unit, inertial measure...
- Patent number 11,187,716
- Issue date Nov 30, 2021
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and measurement system
- Patent number 11,150,263
- Issue date Oct 19, 2021
- Seiko Epson Corporation
- Chitoshi Miki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resampling circuit, physical quantity sensor unit, inertial measure...
- Patent number 11,133,815
- Issue date Sep 28, 2021
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Ink jet recording method, ultraviolet-ray curable ink, and ink jet...
- Patent number 11,077,677
- Issue date Aug 3, 2021
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Measurement instrument, measurement method, measurement system, and...
- Patent number 10,877,061
- Issue date Dec 29, 2020
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement apparatus, attenuation characteristic calculation metho...
- Patent number 10,768,145
- Issue date Sep 8, 2020
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Ink jet recording method, ultraviolet-ray curable ink, and ink jet...
- Patent number 10,625,519
- Issue date Apr 21, 2020
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Sensor device and electronic apparatus
- Patent number 10,612,948
- Issue date Apr 7, 2020
- Seiko Epson Corporation
- Masayasu Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Measurement instrument, measurement method, measurement system, and...
- Patent number 10,203,350
- Issue date Feb 12, 2019
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, measuring system, measuring method, and program
- Patent number 10,198,640
- Issue date Feb 5, 2019
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical quantity detection apparatus, measurement system, and meas...
- Patent number 10,139,308
- Issue date Nov 27, 2018
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Module and electronic apparatus
- Patent number 10,113,875
- Issue date Oct 30, 2018
- Seiko Epson Corporation
- Masayasu Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and electronic apparatus
- Patent number 10,107,653
- Issue date Oct 23, 2018
- Seiko Epson Corporation
- Masayasu Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Module and electronic apparatus
- Patent number 10,072,954
- Issue date Sep 11, 2018
- Seiko Epson Corporation
- Masayasu Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Ink jet recording method, ultraviolet-ray curable ink, and ink jet...
- Patent number 10,029,483
- Issue date Jul 24, 2018
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Temperature characteristic correction device, temperature character...
- Patent number 9,983,004
- Issue date May 29, 2018
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Ink jet recording method, ultraviolet-ray curable ink, and ink jet...
- Patent number 9,884,487
- Issue date Feb 6, 2018
- Seiko Epson Corporation
- Yoshihiro Kobayashi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Patents Applicationslast 30 patents

Information Patent Application
Sensor Device And Electronic Apparatus
- Publication number 20240302191
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Masayasu SAKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Non...
- Publication number 20230341289
- Publication date Oct 26, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Non...
- Publication number 20230341255
- Publication date Oct 26, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Sensor Device And Electronic Apparatus
- Publication number 20230258481
- Publication date Aug 17, 2023
- SEIKO EPSON CORPORATION
- Masayasu SAKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20230175918
- Publication date Jun 8, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20230175919
- Publication date Jun 8, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20230019808
- Publication date Jan 19, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20230001967
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20230003575
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
Derivation Method, Derivation Device, Derivation System, And Program
- Publication number 20230003608
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Derivation Method, Derivation Device, Derivation System, And Program
- Publication number 20230003609
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Derivation Method, Derivation Device, Derivation System, And Program
- Publication number 20230003610
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
Time Point Acquisition Method, Time Point Acquisition Device, Time...
- Publication number 20230003611
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20220291078
- Publication date Sep 15, 2022
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20220276118
- Publication date Sep 1, 2022
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20220276119
- Publication date Sep 1, 2022
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20220276120
- Publication date Sep 1, 2022
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL MEASUREMENT UNIT
- Publication number 20220221487
- Publication date Jul 14, 2022
- SEIKO EPSON CORPORATION
- Kazuyoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
Sensor Device And Electronic Apparatus
- Publication number 20210364330
- Publication date Nov 25, 2021
- SEIKO EPSON CORPORATION
- Masayasu SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20210302222
- Publication date Sep 30, 2021
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20210304597
- Publication date Sep 30, 2021
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G08 - SIGNALLING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20210293657
- Publication date Sep 23, 2021
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20210293606
- Publication date Sep 23, 2021
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20210293604
- Publication date Sep 23, 2021
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
- Publication number 20210293605
- Publication date Sep 23, 2021
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
INK JET RECORDING METHOD, ULTRAVIOLET-RAY CURABLE INK, AND INK JET...
- Publication number 20200247146
- Publication date Aug 6, 2020
- SEIKO EPSON CORPORATION
- Yoshihiro Kobayashi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT SYSTEM
- Publication number 20200191824
- Publication date Jun 18, 2020
- SEIKO EPSON CORPORATION
- Chitoshi MIKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sensor Device And Electronic Apparatus
- Publication number 20200149934
- Publication date May 14, 2020
- SEIKO EPSON CORPORATION
- Masayasu SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
RESAMPLING CIRCUIT, PHYSICAL QUANTITY SENSOR UNIT, INERTIAL MEASURE...
- Publication number 20190331708
- Publication date Oct 31, 2019
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RESAMPLING CIRCUIT, PHYSICAL QUANTITY SENSOR UNIT, INERTIAL MEASURE...
- Publication number 20190334540
- Publication date Oct 31, 2019
- SEIKO EPSON CORPORATION
- Yoshihiro KOBAYASHI
- H03 - BASIC ELECTRONIC CIRCUITRY

Yoshihiro Kobayashi

Person

Patents Grantslast 30 patents

Sensor device and electronic apparatus

Derivation method of diagnosing a state of a superstructure, deriva...

Determining abnormalities in the superstructure of a bridge based o...

Abnormality determination for bridge superstructure based on accele...

Time point acquisition method, time point acquisition device, time...

Measurement method, measurement device, measurement system, and mea...

Measurement method, measurement device, measurement system, and mea...

Measurement method, measurement device, measurement system, and mea...

Measurement method, measurement device, measurement system, and mea...

Bridge displacement measurement method

Sensor device and electronic apparatus

Measurement method, measurement device, measurement system, and mea...

Sensor device and electronic apparatus

Resampling circuit, physical quantity sensor unit, inertial measure...

Measurement device and measurement system

Resampling circuit, physical quantity sensor unit, inertial measure...

Ink jet recording method, ultraviolet-ray curable ink, and ink jet...

Measurement instrument, measurement method, measurement system, and...

Measurement apparatus, attenuation characteristic calculation metho...

Ink jet recording method, ultraviolet-ray curable ink, and ink jet...

Sensor device and electronic apparatus

Measurement instrument, measurement method, measurement system, and...

Measuring device, measuring system, measuring method, and program

Physical quantity detection apparatus, measurement system, and meas...

Module and electronic apparatus

Sensor device and electronic apparatus

Module and electronic apparatus

Ink jet recording method, ultraviolet-ray curable ink, and ink jet...

Temperature characteristic correction device, temperature character...

Ink jet recording method, ultraviolet-ray curable ink, and ink jet...

Patents Applicationslast 30 patents

Sensor Device And Electronic Apparatus

Measurement Method, Measurement Device, Measurement System, And Non...

Measurement Method, Measurement Device, Measurement System, And Non...

Sensor Device And Electronic Apparatus

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Derivation Method, Derivation Device, Derivation System, And Program

Derivation Method, Derivation Device, Derivation System, And Program

Derivation Method, Derivation Device, Derivation System, And Program

Time Point Acquisition Method, Time Point Acquisition Device, Time...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

INERTIAL MEASUREMENT UNIT

Sensor Device And Electronic Apparatus

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

Measurement Method, Measurement Device, Measurement System, And Mea...

INK JET RECORDING METHOD, ULTRAVIOLET-RAY CURABLE INK, AND INK JET...

MEASUREMENT DEVICE AND MEASUREMENT SYSTEM

Sensor Device And Electronic Apparatus

RESAMPLING CIRCUIT, PHYSICAL QUANTITY SENSOR UNIT, INERTIAL MEASURE...

RESAMPLING CIRCUIT, PHYSICAL QUANTITY SENSOR UNIT, INERTIAL MEASURE...