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Yoshihiro Notani
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Itami-shi, Hyogo 664, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for inspecting transmission line characteristic of a semicon...
Patent number
7,622,930
Issue date
Nov 24, 2009
Mitsubishi Electric Corporation
Yoshihiro Notani
G01 - MEASURING TESTING
Information
Patent Grant
High frequency semiconductor device
Patent number
7,321,170
Issue date
Jan 22, 2008
Mitsubishi Denki Kabushiki Kaisha
Yoshihiro Notani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample assembly for thermoelectric analyzer
Patent number
6,791,335
Issue date
Sep 14, 2004
Rigaku Corporation
Taisei Hirayama
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring surface leakage current of sample
Patent number
6,570,390
Issue date
May 27, 2003
Rigaku Corporation
Taisei Hirayama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device including a semiconductor package with electro...
Patent number
5,977,631
Issue date
Nov 2, 1999
Mitsubishi Denki Kabushiki Kaisha
Yoshihiro Notani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hermetically sealed millimeter-wave device
Patent number
5,808,519
Issue date
Sep 15, 1998
Mitsubishi Denki Kabushiki Kaisha
Kei Gotoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit device and fabricating thereof
Patent number
5,786,627
Issue date
Jul 28, 1998
Mitsubishi Denki Kabushiki Kaisha
Akira Inoue
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tab tape and semiconductor chip mounted on tab tape
Patent number
5,767,569
Issue date
Jun 16, 1998
Mitsubishi Denki Kabushiki Kaisha
Yukio Ohta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit device
Patent number
5,675,184
Issue date
Oct 7, 1997
Mitsubishi Denki Kabushiki Kaisha
Hiroto Matsubayashi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High-frequency semiconductor device including microstrip transmissi...
Patent number
5,426,319
Issue date
Jun 20, 1995
Mitsubishi Denki Kabushiki Kaisha
Yoshihiro Notani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Film carrier signal transmission line having separating grooves
Patent number
5,426,399
Issue date
Jun 20, 1995
Hiroto Matsubayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High frequency IC package
Patent number
5,418,329
Issue date
May 23, 1995
Mitsubishi Denki Kabushiki Kaisha
Takayuki Katoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High frequency signal transmission tape
Patent number
5,349,317
Issue date
Sep 20, 1994
Mitsubishi Denki Kabushiki Kaisha
Yoshihiro Notani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing semiconductor device
Patent number
5,302,554
Issue date
Apr 12, 1994
Mitsubishi Denki Kabushiki Kaisha
Takuo Kashiwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave IC package
Patent number
5,294,897
Issue date
Mar 15, 1994
Mitsubishi Denki Kabushiki Kaisha
Yoshihiro Notani
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICES AND METHODS FOR INSPECTING THE SAME
Publication number
20080246554
Publication date
Oct 9, 2008
Mitsubishi Electric Corporation
Yoshihiro Notani
G01 - MEASURING TESTING
Information
Patent Application
High frequency semiconductor device
Publication number
20060187977
Publication date
Aug 24, 2006
Mitsubishi Denki Kabushiki Kaisha
Yoshihiro Notani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for measuring surface leakage current of sample
Publication number
20020030504
Publication date
Mar 14, 2002
Rigaku Corporation
Ryo Hattori
G01 - MEASURING TESTING