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Yoshihiro Yamashita

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer and analysis method
    • Patent number 11,959,914
    • Issue date Apr 16, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki Takakura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Coordinate calculation apparatus, coordinate calculation method, an...
    • Patent number 11,922,659
    • Issue date Mar 5, 2024
    • NEC SOLUTION INNOVATORS, LTD.
    • Yoshihiro Yamashita
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Electrochemiluminescence method of detecting an analyte in a liquid...
    • Patent number 11,703,504
    • Issue date Jul 18, 2023
    • Roche Diagnostics Operations, Inc.
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,639,943
    • Issue date May 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,525,837
    • Issue date Dec 13, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,519,924
    • Issue date Dec 6, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Daisuke Ebihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analyzer
    • Patent number 11,517,636
    • Issue date Dec 6, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hisashi Yabutani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus and method for controlling automatic a...
    • Patent number 11,499,983
    • Issue date Nov 15, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shunichirou Nobuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,360,108
    • Issue date Jun 14, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,340,241
    • Issue date May 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,320,443
    • Issue date May 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiroya Umeki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,293,934
    • Issue date Apr 5, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takeshi Ishida
    • C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,169,168
    • Issue date Nov 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,161,118
    • Issue date Nov 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Liquid stirring method
    • Patent number 10,761,000
    • Issue date Sep 1, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer and liquid reservoir
    • Patent number 10,753,953
    • Issue date Aug 25, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Reika Kuroda
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Dispensing device
    • Patent number 10,725,062
    • Issue date Jul 28, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Koshin Hamasaki
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Electrochemiluminescence method of detecting an analyte in a liquid...
    • Patent number 10,422,797
    • Issue date Sep 24, 2019
    • Roche Diagnostics Operations, Inc.
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Nozzle cleaning method and automated analyzer
    • Patent number 10,307,782
    • Issue date Jun 4, 2019
    • Hitachi High-Technologies Corporation
    • Takushi Miyakawa
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,977,041
    • Issue date May 22, 2018
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,958,468
    • Issue date May 1, 2018
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,791,465
    • Issue date Oct 17, 2017
    • Hitachi High-Technologies Corporation
    • Yukinori Sakashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analyzing device and sample analyzing method
    • Patent number 9,557,326
    • Issue date Jan 31, 2017
    • Hitachi High-Technologies Corporation
    • Toru Inaba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Structure of power transmission apparatus
    • Patent number 9,447,851
    • Issue date Sep 20, 2016
    • Denso Corporation
    • Hitoshi Noguchi
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Structure of power transmission apparatus
    • Patent number 9,328,806
    • Issue date May 3, 2016
    • Denso Corporation
    • Hitoshi Noguchi
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,255,937
    • Issue date Feb 9, 2016
    • Hitachi High-Technologies Corporation
    • Yukinori Sakashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Drive force transmission apparatus
    • Patent number 9,145,962
    • Issue date Sep 29, 2015
    • Denso Corporation
    • Hitoshi Noguchi
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,916,096
    • Issue date Dec 23, 2014
    • Hitachi High-Technologies Corporation
    • Yukinori Sakashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analyzer
    • Patent number 8,802,032
    • Issue date Aug 12, 2014
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Power transmitting device
    • Patent number 8,714,332
    • Issue date May 6, 2014
    • Denso Corporation
    • Hitoshi Noguchi
    • B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTROCHEMILUMINESCENCE METHOD OF DETECTING AN ANALYTE IN A LIQUID...
    • Publication number 20230251253
    • Publication date Aug 10, 2023
    • Roche Diagnostics Operations, Inc.
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAVELENGTH CONVERSION MEMBER
    • Publication number 20220282151
    • Publication date Sep 8, 2022
    • TAMURA CORPORATION
    • Yusuke ARAI
    • C01 - INORGANIC CHEMISTRY
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220196691
    • Publication date Jun 23, 2022
    • Hitachi High-Tech Corporation
    • Eiichiro Takada
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220034929
    • Publication date Feb 3, 2022
    • Hitachi High-Tech Corporation
    • Yuki Yokota
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    COORDINATE CALCULATION APPARATUS, COORDINATE CALCULATION METHOD, AN...
    • Publication number 20220005223
    • Publication date Jan 6, 2022
    • NEC Solution Innovators, Ltd.
    • Yoshihiro YAMASHITA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210018522
    • Publication date Jan 21, 2021
    • Yoshihiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20200378994
    • Publication date Dec 3, 2020
    • Hitachi High-Tech Corporation
    • Takeshi ISHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus and Method for Controlling Automatic A...
    • Publication number 20200319218
    • Publication date Oct 8, 2020
    • Hitachi High-Tech Corporation
    • Shunichirou NOBUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200249249
    • Publication date Aug 6, 2020
    • Hitachi High-Technologies Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200241022
    • Publication date Jul 30, 2020
    • Hitachi High-Technologies Corporation
    • Takenori OKUSA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200241029
    • Publication date Jul 30, 2020
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20200240981
    • Publication date Jul 30, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20200209273
    • Publication date Jul 2, 2020
    • Yuichiro OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer
    • Publication number 20200191814
    • Publication date Jun 18, 2020
    • Hitachi High-Technologies Corporation
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Analyzer
    • Publication number 20200171182
    • Publication date Jun 4, 2020
    • Hisashi YABUTANI
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    ELECTROCHEMILUMINESCENCE METHOD OF DETECTING AN ANALYTE IN A LIQUID...
    • Publication number 20200003768
    • Publication date Jan 2, 2020
    • Roche Diagnostics Operations, Inc.
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20190361041
    • Publication date Nov 28, 2019
    • Hitachi High-Technologies Corporation
    • Shunsuke SASAKI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20190351419
    • Publication date Nov 21, 2019
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20190310275
    • Publication date Oct 10, 2019
    • Hitachi High-Technologies Corporation
    • Takeshi ISHIDA
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190204346
    • Publication date Jul 4, 2019
    • Hitachi High-Technologies Corporation
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPENSING DEVICE
    • Publication number 20180203029
    • Publication date Jul 19, 2018
    • Hitachi High-Technologies Corporation
    • Koshin HAMASAKI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATED ANALYZER AND LIQUID RESERVOIR
    • Publication number 20180011121
    • Publication date Jan 11, 2018
    • Hitachi High-Technologies Corporation
    • Reika KURODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIQUID STIRRING METHOD
    • Publication number 20170205321
    • Publication date Jul 20, 2017
    • Hitachi High-Technologies Corporation
    • Shunsuke SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    NOZZLE CLEANING METHOD AND AUTOMATED ANALYZER
    • Publication number 20160193622
    • Publication date Jul 7, 2016
    • Hitachi High-Technologies Corporation
    • Takushi MIYAKAWA
    • B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160154016
    • Publication date Jun 2, 2016
    • Hitachi High-Technologies Corporation
    • Yoshihiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROCHEMILUMINESCENCE METHOD OF DETECTING AN ANALYTE IN A LIQUID...
    • Publication number 20160097765
    • Publication date Apr 7, 2016
    • Hitachi High-Technologies Corporation
    • Ralf Kraus
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISTRIBUTED SURVEY SYSTEM FOR OBTAINING UNDERGROUND ELECTRICAL CHAR...
    • Publication number 20150369948
    • Publication date Dec 24, 2015
    • OYO CORPORATION
    • Yoshihiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20150293135
    • Publication date Oct 15, 2015
    • Hitachi High-Technologies Corporation
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Application

    STRUCTURE OF POWER TRANSMISSION APPARATUS
    • Publication number 20150167796
    • Publication date Jun 18, 2015
    • DENSO CORPORATION
    • Hitoshi NOGUCHI
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    STRUCTURE OF POWER TRANSMISSION APPARATUS
    • Publication number 20150167797
    • Publication date Jun 18, 2015
    • DENSO CORPORATION
    • Hitoshi NOGUCHI
    • B60 - VEHICLES IN GENERAL