Yoshiki Matoba

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray transmission inspection apparatus and X-ray transmission insp...
- Patent number 11,022,570
- Issue date Jun 1, 2021
- Hitachi High-Tech Science Corporation
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Mass analysis apparatus and method
- Patent number 10,847,355
- Issue date Nov 24, 2020
- Hitachi High-Tech Science Corporation
- Masahiro Sakuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection method and X-ray inspection device
- Patent number 10,823,686
- Issue date Nov 3, 2020
- Hitachi High-Tech Science Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of mass analysis
- Patent number 10,651,018
- Issue date May 12, 2020
- Hitachi High-Tech Science Corporation
- Masahiro Sakuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatus and method
- Patent number 10,636,638
- Issue date Apr 28, 2020
- HITATCHI HIGH-TECH SCIENCE CORPORATION
- Masahiro Sakuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray transmission inspection apparatus and inspection method using...
- Patent number 10,054,555
- Issue date Aug 21, 2018
- Hitachi High-Tech Science Corporation
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray transmission inspection apparatus
- Patent number 9,863,896
- Issue date Jan 9, 2018
- Hitachi High-Tech Science Corporation
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer comprising a temperature sensor, tw...
- Patent number 9,410,906
- Issue date Aug 9, 2016
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray fluorescence spectrometer comprising a gas blowing mechanism
- Patent number 9,400,255
- Issue date Jul 26, 2016
- Hitachi High-Tech Science Corporation
- Hiroaki Nohara
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter detector
- Patent number 9,213,007
- Issue date Dec 15, 2015
- Hitachi High-Tech Science Corporation
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 9,188,553
- Issue date Nov 17, 2015
- Hitachi High-Tech Science Corporation
- Masahiro Sakuta
- G01 - MEASURING TESTING
Information Patent Grant
Transmission X-ray analyzer
- Patent number 9,001,966
- Issue date Apr 7, 2015
- Hitachi High-Tech Science Corporation
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Transmission X-ray analyzer and transmission X-ray analysis method
- Patent number 8,912,503
- Issue date Dec 16, 2014
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer and X-ray analysis method
- Patent number 8,891,729
- Issue date Nov 18, 2014
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray transmission inspection apparatus and x-ray transmission insp...
- Patent number 8,596,866
- Issue date Dec 3, 2013
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device and X-ray inspection method
- Patent number 8,422,630
- Issue date Apr 16, 2013
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 8,068,583
- Issue date Nov 29, 2011
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer and X-ray analysis method
- Patent number 8,000,439
- Issue date Aug 16, 2011
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer and X-ray analysis method
- Patent number 7,970,101
- Issue date Jun 28, 2011
- SII NanoTechnology Inc.
- Noriaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube and X-ray analyzing apparatus
- Patent number 7,680,248
- Issue date Mar 16, 2010
- SII NanoTechnology Inc.
- Yoshiki Matoba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray tube and X-ray analysis apparatus
- Patent number 7,634,054
- Issue date Dec 15, 2009
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 7,634,053
- Issue date Dec 15, 2009
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube and X-ray analysis apparatus
- Patent number 7,627,088
- Issue date Dec 1, 2009
- SII NanoTechnology Inc.
- Yoshiki Matoba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 7,623,627
- Issue date Nov 24, 2009
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 7,587,025
- Issue date Sep 8, 2009
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Grant
Energy dispersion type radiation detecting system and method of mea...
- Patent number 7,529,337
- Issue date May 5, 2009
- Sii Nano Technology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 7,436,926
- Issue date Oct 14, 2008
- Sii Nano Technology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 7,428,293
- Issue date Sep 23, 2008
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray analysis apparatus
- Patent number 7,424,093
- Issue date Sep 9, 2008
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescent analysis apparatus
- Patent number 7,289,598
- Issue date Oct 30, 2007
- Sii Nano Technology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYDROGEN IMPURITY TESTING SYSTEM AND HYDROGEN IMPURITY TESTING METHOD
- Publication number 20240297316
- Publication date Sep 5, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS APPARATUS AND METHOD
- Publication number 20200118804
- Publication date Apr 16, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro SAKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
- Publication number 20200041425
- Publication date Feb 6, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR AND METHOD OF MASS ANALYSIS
- Publication number 20190214240
- Publication date Jul 11, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro SAKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS APPARATUS AND METHOD
- Publication number 20190027349
- Publication date Jan 24, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro SAKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
- Publication number 20180202947
- Publication date Jul 19, 2018
- Hitachi High-Tech Science Corporation
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND INSPECTION METHOD USING...
- Publication number 20170031054
- Publication date Feb 2, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshiki MATOBA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND EXTRANEOUS SUBSTANCE DE...
- Publication number 20160041110
- Publication date Feb 11, 2016
- Hitachi High-Technologies Corporation
- Yoshiki MATOBA
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Transmission Inspection Apparatus
- Publication number 20150276626
- Publication date Oct 1, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
Foreign Matter Detector
- Publication number 20140294144
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Spectrometer
- Publication number 20140294145
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ryusuke Hirose
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Spectrometer
- Publication number 20140294143
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroaki Nohara
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Analyzer
- Publication number 20140286474
- Publication date Sep 25, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro Sakuta
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION X-RAY ANALYZER
- Publication number 20130216024
- Publication date Aug 22, 2013
- Hitachi High-Technologies Corporation
- Yoshiki MATOBA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
- Publication number 20130034204
- Publication date Feb 7, 2013
- Yoshiki MATOBA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION X-RAY ANALYZER AND TRANSMISSION X-RAY ANALYSIS METHOD
- Publication number 20130032728
- Publication date Feb 7, 2013
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-ray transmission inspection apparatus and x-ray transmission insp...
- Publication number 20110222656
- Publication date Sep 15, 2011
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-Ray inspection device and X-Ray inspection method
- Publication number 20100316187
- Publication date Dec 16, 2010
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
- Publication number 20100046701
- Publication date Feb 25, 2010
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
- Publication number 20100046700
- Publication date Feb 25, 2010
- Noriaki Sakai
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
- Publication number 20100002833
- Publication date Jan 7, 2010
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
- Publication number 20090213996
- Publication date Aug 27, 2009
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TUBE AND X-RAY ANALYSIS APPARATUS
- Publication number 20090041196
- Publication date Feb 12, 2009
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TUBE AND X-RAY ANALYSIS APPARATUS
- Publication number 20090028297
- Publication date Jan 29, 2009
- Yoshiki Matoba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
- Publication number 20080212739
- Publication date Sep 4, 2008
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TUBE AND X-RAY ANALYZING APPARATUS
- Publication number 20080181365
- Publication date Jul 31, 2008
- Yoshiki Matoba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Fluorescent X-ray analysis apparatus
- Publication number 20080013681
- Publication date Jan 17, 2008
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
Energy dispersion type radiation detecting system and method of mea...
- Publication number 20080008293
- Publication date Jan 10, 2008
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent x-ray analysis apparatus
- Publication number 20070274441
- Publication date Nov 29, 2007
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent X-ray analysis apparatus
- Publication number 20070269004
- Publication date Nov 22, 2007
- SII NANO TECHNOLOGY INC.
- Yoshiki Matoba
- G01 - MEASURING TESTING

Yoshiki Matoba

Person

Patents Grantslast 30 patents

X-ray transmission inspection apparatus and X-ray transmission insp...

Mass analysis apparatus and method

X-ray inspection method and X-ray inspection device

Apparatus for and method of mass analysis

Mass analysis apparatus and method

X-ray transmission inspection apparatus and inspection method using...

X-ray transmission inspection apparatus

X-ray fluorescence spectrometer comprising a temperature sensor, tw...

X-ray fluorescence spectrometer comprising a gas blowing mechanism

Foreign matter detector

X-ray fluorescence analyzer

Transmission X-ray analyzer

Transmission X-ray analyzer and transmission X-ray analysis method

X-ray analyzer and X-ray analysis method

X-ray transmission inspection apparatus and x-ray transmission insp...

X-ray inspection device and X-ray inspection method

X-ray analysis apparatus and X-ray analysis method

X-ray analyzer and X-ray analysis method

X-ray analyzer and X-ray analysis method

X-ray tube and X-ray analyzing apparatus

X-ray tube and X-ray analysis apparatus

Fluorescent X-ray analysis apparatus

X-ray tube and X-ray analysis apparatus

X-ray analysis apparatus and X-ray analysis method

X-ray analysis apparatus and X-ray analysis method

Energy dispersion type radiation detecting system and method of mea...

Fluorescent X-ray analysis apparatus

Fluorescent X-ray analysis apparatus

Fluorescent x-ray analysis apparatus

X-ray fluorescent analysis apparatus

Patents Applicationslast 30 patents

HYDROGEN IMPURITY TESTING SYSTEM AND HYDROGEN IMPURITY TESTING METHOD

MASS ANALYSIS APPARATUS AND METHOD

X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...

APPARATUS FOR AND METHOD OF MASS ANALYSIS

MASS ANALYSIS APPARATUS AND METHOD

X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE

X-RAY TRANSMISSION INSPECTION APPARATUS AND INSPECTION METHOD USING...

X-RAY TRANSMISSION INSPECTION APPARATUS AND EXTRANEOUS SUBSTANCE DE...

X-Ray Transmission Inspection Apparatus

Foreign Matter Detector

X-Ray Fluorescence Spectrometer

X-Ray Fluorescence Spectrometer

X-Ray Fluorescence Analyzer

TRANSMISSION X-RAY ANALYZER

X-RAY ANALYZER AND X-RAY ANALYSIS METHOD

TRANSMISSION X-RAY ANALYZER AND TRANSMISSION X-RAY ANALYSIS METHOD

X-ray transmission inspection apparatus and x-ray transmission insp...

X-Ray inspection device and X-Ray inspection method

X-RAY ANALYZER AND X-RAY ANALYSIS METHOD

X-RAY ANALYZER AND X-RAY ANALYSIS METHOD

X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD

X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD

X-RAY TUBE AND X-RAY ANALYSIS APPARATUS

X-RAY TUBE AND X-RAY ANALYSIS APPARATUS

X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD

X-RAY TUBE AND X-RAY ANALYZING APPARATUS

Fluorescent X-ray analysis apparatus

Energy dispersion type radiation detecting system and method of mea...

Fluorescent x-ray analysis apparatus

Fluorescent X-ray analysis apparatus