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Yoshiki MURAMATSU

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer and cleaning method
    • Patent number 11,231,433
    • Issue date Jan 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki Muramatsu
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,143,665
    • Issue date Oct 12, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,041,874
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Saori Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing apparatus
    • Patent number 10,761,105
    • Issue date Sep 1, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki Muramatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,031,152
    • Issue date Jul 24, 2018
    • Hitachi High-Technologies Corporation
    • Yoshiki Muramatsu
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER AND WATER SUPPLY TANK FOR AUTOMATIC ANALYZER
    • Publication number 20240425350
    • Publication date Dec 26, 2024
    • Hitachi High-Tech Corporation
    • Yoshiki MURAMATSU
    • B67 - OPENING, CLOSING OR CLEANING BOTTLES, JARS OR SIMILAR CONTAINERS LIQUID...
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220299539
    • Publication date Sep 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke HORIE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210341506
    • Publication date Nov 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki MURAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200096529
    • Publication date Mar 26, 2020
    • Hitachi High-Technologies Corporation
    • Saori CHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190361042
    • Publication date Nov 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND CLEANING METHOD
    • Publication number 20190049477
    • Publication date Feb 14, 2019
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS
    • Publication number 20170176484
    • Publication date Jun 22, 2017
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170010294
    • Publication date Jan 12, 2017
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • G01 - MEASURING TESTING