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Yoshinari Kurosaki
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Kanagawa-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sensor and inspection device
Patent number
11,992,320
Issue date
May 28, 2024
Kabushiki Kaisha Toshiba
Yoshihiro Higashi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor and inspection device
Patent number
11,726,149
Issue date
Aug 15, 2023
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Grant
Sensor and inspection device
Patent number
11,703,530
Issue date
Jul 18, 2023
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor and inspection device
Patent number
11,513,173
Issue date
Nov 29, 2022
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,493,572
Issue date
Nov 8, 2022
Kabushiki Kaisha Toshiba
Yoshihiro Higashi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor and inspection device
Patent number
11,432,751
Issue date
Sep 6, 2022
Kabushiki Kaisha Toshiba
Satoshi Shirotori
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Magnetic sensor and inspection device
Patent number
11,402,441
Issue date
Aug 2, 2022
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave attenuator and electronic device
Patent number
11,049,818
Issue date
Jun 29, 2021
Kabushiki Kaisha Toshiba
Akira Kikitsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromagnetic wave attenuator and electronic device
Patent number
11,011,474
Issue date
May 18, 2021
Kabushiki Kaisha Toshiba
Akira Kikitsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromagnetic wave attenuator and electronic device
Patent number
11,011,475
Issue date
May 18, 2021
Kabushiki Kaisha Toshiba
Akira Kikitsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device
Patent number
10,699,979
Issue date
Jun 30, 2020
Kabushiki Kaisha Toshiba
Akira Kikitsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having electromagnetic wave attenuation layer
Patent number
10,510,680
Issue date
Dec 17, 2019
Kabushiki Kaisha Toshiba
Hitoshi Iwasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with magnetic layer and nonmagnetic layer
Patent number
10,468,354
Issue date
Nov 5, 2019
Kabushiki Kaisha Toshiba
Akira Kikitsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetoresistive effect element, magnetic head, and magnetic disk a...
Patent number
8,917,485
Issue date
Dec 23, 2014
Kabushiki Kaisha Toshiba
Hideaki Fukuzawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic memory and magnetic memory apparatus
Patent number
8,644,057
Issue date
Feb 4, 2014
Kabushiki Kaisha Toshiba
Tsuyoshi Kondo
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic oscillation element and spin wave device
Patent number
8,569,852
Issue date
Oct 29, 2013
Kabushiki Kaisha Toshiba
Hirofumi Morise
G01 - MEASURING TESTING
Information
Patent Grant
Magneto-resistance effect element, and method for manufacturing the...
Patent number
8,542,466
Issue date
Sep 24, 2013
Kabushiki Kaisha Toshiba
Yoshihiko Fuji
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nano-imprint mold and substrate with uneven patterns manufactured b...
Patent number
8,419,412
Issue date
Apr 16, 2013
Kabushiki Kaisha Toshiba
Yuichi Ohsawa
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Concave-convex pattern forming method and magnetic tunnel junction...
Patent number
8,420,499
Issue date
Apr 16, 2013
Kabushiki Kaisha Toshiba
Tomotaka Ariga
G11 - INFORMATION STORAGE
Information
Patent Grant
Magneto-resistance effect element, and method for manufacturing the...
Patent number
8,379,351
Issue date
Feb 19, 2013
Kabushiki Kaisha Toshiba
Yoshihiko Fuji
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
ELECTROMAGNETIC WAVE ATTENUATOR AND ELECTRONIC DEVICE
Publication number
20230145220
Publication date
May 11, 2023
Kabushiki Kaisha Toshiba
Akira KIKITSU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMAGNETIC WAVE ATTENUATOR AND ELECTRONIC DEVICE
Publication number
20230147383
Publication date
May 11, 2023
Kabushiki Kaisha Toshiba
Akira KIKITSU
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SENSOR AND INSPECTION DEVICE
Publication number
20230074881
Publication date
Mar 9, 2023
Kabushiki Kaisha Toshiba
Yoshihiro HIGASHI
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SENSOR AND INSPECTION DEVICE
Publication number
20230041879
Publication date
Feb 9, 2023
Kabushiki Kaisha Toshiba
Akira KIKITSU
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND INSPECTION DEVICE
Publication number
20220221536
Publication date
Jul 14, 2022
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND INSPECTION DEVICE
Publication number
20220221534
Publication date
Jul 14, 2022
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR AND INSPECTION DEVICE
Publication number
20220175289
Publication date
Jun 9, 2022
Kabushiki Kaisha Toshiba
Satoshi SHIROTORI
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MAGNETIC SENSOR AND INSPECTION DEVICE
Publication number
20220065955
Publication date
Mar 3, 2022
Kabushiki Kaisha Toshiba
Akira KIKITSU
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MAGNETIC SENSOR
Publication number
20210286029
Publication date
Sep 16, 2021
Kabushiki Kaisha Toshiba
Yoshihiro Higashi
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE ATTENUATOR AND ELECTRONIC DEVICE
Publication number
20200243457
Publication date
Jul 30, 2020
Kabushiki Kaisha Toshiba
Akira KIKITSU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMAGNETIC WAVE ATTENUATOR AND ELECTRONIC DEVICE
Publication number
20200227358
Publication date
Jul 16, 2020
Kabushiki Kaisha Toshiba
Akira KIKITSU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE
Publication number
20200066608
Publication date
Feb 27, 2020
Kabushiki Kaisha Toshiba
Akira KIKITSU
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20190081007
Publication date
Mar 14, 2019
Kabushiki Kaisha Toshiba
Hitoshi IWASAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20180337139
Publication date
Nov 22, 2018
Kabushiki Kaisha Toshiba
Akira KIKITSU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETO-RESISTANCE EFFECT ELEMENT, AND METHOD FOR MANUFACTURING THE...
Publication number
20130128391
Publication date
May 23, 2013
TDK Corporation
Yoshihiko FUJI
B82 - NANO-TECHNOLOGY
Information
Patent Application
MAGNETIC OSCILLATION ELEMENT AND SPIN WAVE DEVICE
Publication number
20120242438
Publication date
Sep 27, 2012
Kabushiki Kaisha Toshiba
Hirofumi Morise
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MAGNETIC MEMORY AND MAGNETIC MEMORY APPARATUS
Publication number
20120224416
Publication date
Sep 6, 2012
Kabushiki Kaisha Toshiba
Tsuyoshi Kondo
G11 - INFORMATION STORAGE
Information
Patent Application
NANO-IMPRINT MOLD AND SUBSTRATE WITH UNEVEN PATTERNS MANUFACTURED B...
Publication number
20120196084
Publication date
Aug 2, 2012
KABUSHIKI KAISHA TOSHIBA
Yuichi OHSAWA
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
CONCAVE-CONVEX PATTERN FORMING METHOD AND MAGNETIC TUNNEL JUNCTION...
Publication number
20120115250
Publication date
May 10, 2012
KABUSHIKI KAISHA TOSHIBA
Tomotaka Ariga
G11 - INFORMATION STORAGE
Information
Patent Application
Magneto-resistance effect element, and method for manufacturing the...
Publication number
20080239591
Publication date
Oct 2, 2008
Kabushiki Kaisha Toshiba
Yoshihiko Fuji
G01 - MEASURING TESTING
Information
Patent Application
Magnetoresistive effect element, magnetic head, and magnetic disk a...
Publication number
20070223150
Publication date
Sep 27, 2007
Kabushiki Kaisha Toshiba
Hideaki Fukuzawa
G01 - MEASURING TESTING