YOSHIO KAMEDA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Control customization system, control customization method, and con...
- Patent number 11,579,574
- Issue date Feb 14, 2023
- NEC Corporation
- Wemer Wee
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Model estimation system, method, and program
- Patent number 11,443,219
- Issue date Sep 13, 2022
- NEC Corporation
- Riki Eto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control objective integration system, control objective integration...
- Patent number 11,435,705
- Issue date Sep 6, 2022
- NEC Corporation
- Wemer Wee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle control system, vehicle control method, and program recordi...
- Patent number 11,400,954
- Issue date Aug 2, 2022
- NEC Corporation
- Yoshio Kameda
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Dimension measurement device, dimension measurement system, and dim...
- Patent number 10,776,945
- Issue date Sep 15, 2020
- NEC Corporation
- Kenichiro Fukushi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device, predictive control method, and recor...
- Patent number 10,048,658
- Issue date Aug 14, 2018
- NEC Corporation
- Yoshio Kameda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Redundant computing system and redundant computing method
- Patent number 8,862,934
- Issue date Oct 14, 2014
- NEC Corporation
- Yoshio Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection apparatus, semiconductor wafer positioning...
- Patent number 8,570,056
- Issue date Oct 29, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting device and semiconductor inspecting method
- Patent number 8,536,890
- Issue date Sep 17, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing the same
- Patent number 8,513,970
- Issue date Aug 20, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device, semiconductor device, and testing method
- Patent number 8,441,277
- Issue date May 14, 2013
- NEC Corporation
- Koichiro Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,399,960
- Issue date Mar 19, 2013
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,330,254
- Issue date Dec 11, 2012
- Renesas Electronics Corporation
- Masayuki Furumiya
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit of superconducting circuit blocks and method of...
- Patent number 6,703,857
- Issue date Mar 9, 2004
- NEC Corporation
- Yoshio Kameda
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER-READA...
- Publication number 20240119357
- Publication date Apr 11, 2024
- NEC Corporation
- Keita SAKUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTIVELY ROBUST MODEL TRAINING
- Publication number 20240028912
- Publication date Jan 25, 2024
- NEC Corporation
- Vivek BARSOPIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEAKLY SUPERVISED OBJECT LOCALIZATION METHOD AND SYSTEM FOR IMPLEME...
- Publication number 20230206616
- Publication date Jun 29, 2023
- NEC Corporation
- Vivek BARSOPIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FORWARD COMPATIBLE MODEL TRAINING
- Publication number 20220343212
- Publication date Oct 27, 2022
- NEC Corporation
- Vivek BARSOPIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISTRIBUTIONALLY ROBUST MODEL TRAINING
- Publication number 20220292345
- Publication date Sep 15, 2022
- NEC Corporation
- Vivek BARSOPIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEARCH DEVICE, SEARCH SYSTEM, SEARCH METHOD, AND RECORDING MEDIUM
- Publication number 20220100819
- Publication date Mar 31, 2022
- NEC Corporation
- Keiichi KISAMORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE, MACHINE LEARNING DEVICE, ANALYSIS SYSTEM, ANALYSIS...
- Publication number 20210390451
- Publication date Dec 16, 2021
- NEC Corporation
- Keiichi KISAMORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE, MACHINE LEARNING DEVICE, ANALYSIS SYSTEM, ANALYSIS...
- Publication number 20210383157
- Publication date Dec 9, 2021
- NEC Corporation
- Keiichi KISAMORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICLE CONTROL SYSTEM, VEHICLE CONTROL METHOD, AND PROGRAM RECORDI...
- Publication number 20200317220
- Publication date Oct 8, 2020
- NEC Corporation
- Yoshio KAMEDA
- B60 - VEHICLES IN GENERAL
Information Patent Application
ENSEMBLE CONTROL SYSTEM, ENSEMBLE CONTROL METHOD, AND ENSEMBLE CONT...
- Publication number 20200249637
- Publication date Aug 6, 2020
- NEC Corporation
- Wemer WEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL CUSTOMIZATION SYSTEM, CONTROL CUSTOMIZATION METHOD, AND CON...
- Publication number 20200192307
- Publication date Jun 18, 2020
- NEC Corporation
- Wemer WEE
- B60 - VEHICLES IN GENERAL
Information Patent Application
MODEL ESTIMATION SYSTEM, METHOD, AND PROGRAM
- Publication number 20200027013
- Publication date Jan 23, 2020
- NEC Corporation
- Riki ETO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
- Publication number 20190385082
- Publication date Dec 19, 2019
- NEC Corporation
- Yoshio KAMEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE, TRAVEL DATA PROCESSING METHOD, VEHIC...
- Publication number 20190367040
- Publication date Dec 5, 2019
- NEC Corporation
- Yoshio KAMEDA
- B60 - VEHICLES IN GENERAL
Information Patent Application
NON-LINEAR PROGRAMMING PROBLEM PROCESSING DEVICE AND NON-LINEAR PRO...
- Publication number 20190311269
- Publication date Oct 10, 2019
- NEC Corporation
- Yoshio KAMEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL OBJECTIVE INTEGRATION SYSTEM, CONTROL OBJECTIVE INTEGRATION...
- Publication number 20190196419
- Publication date Jun 27, 2019
- NEC Corporation
- Wemer WEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LINEAR PARAMETER VARYING MODEL ESTIMATION SYSTEM, METHOD, AND PROGRAM
- Publication number 20190188344
- Publication date Jun 20, 2019
- NEC Corporation
- Riki ETO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COST FUNCTION DESIGN SYSTEM, COST FUNCTION DESIGN METHOD, AND COST...
- Publication number 20180373208
- Publication date Dec 27, 2018
- NEC Corporation
- Wemer WEE
- G05 - CONTROLLING REGULATING
Information Patent Application
DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT SYSTEM, AND DIM...
- Publication number 20180225843
- Publication date Aug 9, 2018
- NEC Corporation
- Kenichiro FUKUSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE, PREDICTIVE CONTROL METHOD, AND RECOR...
- Publication number 20160209817
- Publication date Jul 21, 2016
- NEC Corporation
- YOSHIO KAMEDA
- G05 - CONTROLLING REGULATING
Information Patent Application
MULTIPLEX SYSTEM
- Publication number 20120307650
- Publication date Dec 6, 2012
- NEC Corporation
- Yoshio Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUNDANT COMPUTING SYSTEM AND REDUNDANT COMPUTING METHOD
- Publication number 20120233506
- Publication date Sep 13, 2012
- Yoshio Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME
- Publication number 20110260747
- Publication date Oct 27, 2011
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110012228
- Publication date Jan 20, 2011
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110006443
- Publication date Jan 13, 2011
- NEC Corporation
- Koichiro Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION APPARATUS, SEMICONDUCTOR WAFER POSITIONING...
- Publication number 20100321053
- Publication date Dec 23, 2010
- YOSHIO KAMEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTING DEVICE AND SEMICONDUCTOR INSPECTING METHOD
- Publication number 20100321054
- Publication date Dec 23, 2010
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD
- Publication number 20100283497
- Publication date Nov 11, 2010
- NEC Corporation
- Koichiro Noguchi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100164053
- Publication date Jul 1, 2010
- NEC ELECTRONICS CORPORATION
- Masayuki FURUMIYA
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit of superconducting circuit blocks and method of...
- Publication number 20030034794
- Publication date Feb 20, 2003
- NEC Corporation
- Yoshio Kameda
- H03 - BASIC ELECTRONIC CIRCUITRY

YOSHIO KAMEDA

Person

Patents Grantslast 30 patents

Control customization system, control customization method, and con...

Model estimation system, method, and program

Control objective integration system, control objective integration...

Vehicle control system, vehicle control method, and program recordi...

Dimension measurement device, dimension measurement system, and dim...

Information processing device, predictive control method, and recor...

Redundant computing system and redundant computing method

Semiconductor inspection apparatus, semiconductor wafer positioning...

Semiconductor inspecting device and semiconductor inspecting method

Semiconductor device and method of testing the same

Semiconductor testing device, semiconductor device, and testing method

Semiconductor device

Semiconductor device

Integrated circuit of superconducting circuit blocks and method of...

Patents Applicationslast 30 patents

ANALYSIS DEVICE, ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER-READA...

PREDICTIVELY ROBUST MODEL TRAINING

WEAKLY SUPERVISED OBJECT LOCALIZATION METHOD AND SYSTEM FOR IMPLEME...

FORWARD COMPATIBLE MODEL TRAINING

DISTRIBUTIONALLY ROBUST MODEL TRAINING

SEARCH DEVICE, SEARCH SYSTEM, SEARCH METHOD, AND RECORDING MEDIUM

ANALYSIS DEVICE, MACHINE LEARNING DEVICE, ANALYSIS SYSTEM, ANALYSIS...

ANALYSIS DEVICE, MACHINE LEARNING DEVICE, ANALYSIS SYSTEM, ANALYSIS...

VEHICLE CONTROL SYSTEM, VEHICLE CONTROL METHOD, AND PROGRAM RECORDI...

ENSEMBLE CONTROL SYSTEM, ENSEMBLE CONTROL METHOD, AND ENSEMBLE CONT...

CONTROL CUSTOMIZATION SYSTEM, CONTROL CUSTOMIZATION METHOD, AND CON...

MODEL ESTIMATION SYSTEM, METHOD, AND PROGRAM

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...

INFORMATION PROCESSING DEVICE, TRAVEL DATA PROCESSING METHOD, VEHIC...

NON-LINEAR PROGRAMMING PROBLEM PROCESSING DEVICE AND NON-LINEAR PRO...

CONTROL OBJECTIVE INTEGRATION SYSTEM, CONTROL OBJECTIVE INTEGRATION...

LINEAR PARAMETER VARYING MODEL ESTIMATION SYSTEM, METHOD, AND PROGRAM

COST FUNCTION DESIGN SYSTEM, COST FUNCTION DESIGN METHOD, AND COST...

DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT SYSTEM, AND DIM...

INFORMATION PROCESSING DEVICE, PREDICTIVE CONTROL METHOD, AND RECOR...

MULTIPLEX SYSTEM

REDUNDANT COMPUTING SYSTEM AND REDUNDANT COMPUTING METHOD

SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR INSPECTION APPARATUS, SEMICONDUCTOR WAFER POSITIONING...

SEMICONDUCTOR INSPECTING DEVICE AND SEMICONDUCTOR INSPECTING METHOD

SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD

SEMICONDUCTOR DEVICE

Integrated circuit of superconducting circuit blocks and method of...