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Yoshiro Asano

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Digital dial gauge
    • Patent number D943443
    • Issue date Feb 15, 2022
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital dial gauge
    • Patent number D943442
    • Issue date Feb 15, 2022
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital dial gauge
    • Patent number D938294
    • Issue date Dec 14, 2021
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number D893327
    • Issue date Aug 18, 2020
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Variable focal length lens
    • Patent number D870795
    • Issue date Dec 24, 2019
    • Mitutoyo Corporation
    • Masaki Okayasu
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Variable focal length lens
    • Patent number D869542
    • Issue date Dec 10, 2019
    • Mitutoyo Corporation
    • Masaki Okayasu
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Display device for hardness tester
    • Patent number D848867
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D848882
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D848883
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D847674
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D847676
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Hardness tester
    • Patent number D847675
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Variable focal length lens
    • Patent number D829261
    • Issue date Sep 25, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Caliper
    • Patent number D774928
    • Issue date Dec 27, 2016
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number 9,372,059
    • Issue date Jun 21, 2016
    • Mitutoyo Corporation
    • Yoshiro Asano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Camera for remote coordinate measuring machine
    • Patent number D744573
    • Issue date Dec 1, 2015
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Micrometer
    • Patent number D740143
    • Issue date Oct 6, 2015
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number D729659
    • Issue date May 19, 2015
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Calipers
    • Patent number D721291
    • Issue date Jan 20, 2015
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D712761
    • Issue date Sep 9, 2014
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Optical measurement head for measuring coordinates
    • Patent number D709777
    • Issue date Jul 29, 2014
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Stand for a micrometer
    • Patent number D678033
    • Issue date Mar 19, 2013
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D08 - Tools and hardware
  • Information Patent Grant

    Stand for a micrometer
    • Patent number D678090
    • Issue date Mar 19, 2013
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Inside diameter measurement tool
    • Patent number D670585
    • Issue date Nov 13, 2012
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D659575
    • Issue date May 15, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D659574
    • Issue date May 15, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D659572
    • Issue date May 15, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Knob for a stand for measuring instruments
    • Patent number D657654
    • Issue date Apr 17, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D08 - Tools and hardware
  • Information Patent Grant

    Heat-insulating cover for micrometer
    • Patent number D653134
    • Issue date Jan 31, 2012
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Surface-roughness measurement instrument
    • Patent number D614053
    • Issue date Apr 20, 2010
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

  • Information Patent Application

    MICROMETER
    • Publication number 20150059196
    • Publication date Mar 5, 2015
    • MITUTOYO CORPORATION
    • Yoshiro ASANO
    • G01 - MEASURING TESTING