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Yoshitada Oshida
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Ebina, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of inspecting a DNA chip and apparatus thereof
Patent number
8,361,784
Issue date
Jan 29, 2013
Hitachi, Ltd.
Yoshitada Oshida
G01 - MEASURING TESTING
Information
Patent Grant
Device for changing pitch between light beam axes, and substrate ex...
Patent number
8,089,614
Issue date
Jan 3, 2012
Hitachi Via Mechanics, Ltd.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Grant
Laser direct imaging apparatus
Patent number
7,969,636
Issue date
Jun 28, 2011
Hitachi Via Mechanics, Ltd.
Yoshitatsu Naito
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate exposure apparatus and illumination apparatus
Patent number
7,755,741
Issue date
Jul 13, 2010
Hitachi Via Mechanics, Ltd.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and method
Patent number
7,604,925
Issue date
Oct 20, 2009
Renesas Technology Corporation
Minori Noguchi
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Exposure apparatus and method
Patent number
7,598,020
Issue date
Oct 6, 2009
Renesas Technology Corporation
Minori Noguchi
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Biological sample optical measuring method and biological sample op...
Patent number
7,400,753
Issue date
Jul 15, 2008
Hitachi, Ltd.
Taisaku Seino
G01 - MEASURING TESTING
Information
Patent Grant
Pattern exposure method and pattern exposure apparatus
Patent number
7,372,478
Issue date
May 13, 2008
Hitachi Via Mechanics, Ltd.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Grant
Method in inspecting DNA and apparatus therefor
Patent number
7,309,568
Issue date
Dec 18, 2007
Hitachi, Ltd.
Yoshitada Oshida
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus and method
Patent number
7,277,155
Issue date
Oct 2, 2007
Renesas Technology Corp.
Minori Noguchi
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method of inspecting a DNA chip
Patent number
7,217,573
Issue date
May 15, 2007
Hitachi, Ltd.
Yoshitada Oshida
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for imparting alignment to alignment layer thr...
Patent number
7,092,058
Issue date
Aug 15, 2006
Hitachi Displays, Ltd.
Aki Sakai
G02 - OPTICS
Information
Patent Grant
Apparatus and method for measuring micro area in specimen
Patent number
7,064,813
Issue date
Jun 20, 2006
Hitachi High-Technologies Corporation
Satoshi Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus and method
Patent number
7,012,671
Issue date
Mar 14, 2006
Renesas Technology Corp.
Minori Noguchi
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method and apparatus for inspecting DNA and method for detecting fl...
Patent number
6,760,105
Issue date
Jul 6, 2004
Hitachi, Ltd.
Yoshitada Oshida
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus and method
Patent number
6,485,891
Issue date
Nov 26, 2002
Hitachi, Ltd.
Minori Noguchi
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Alignment of an optical assembly
Patent number
6,455,944
Issue date
Sep 24, 2002
Hitachi, Ltd.
Takeshi Kato
G02 - OPTICS
Information
Patent Grant
Exposure apparatus and method
Patent number
6,335,146
Issue date
Jan 1, 2002
Hitachi, Ltd.
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Projection exposure apparatus and projection exposure method
Patent number
6,094,268
Issue date
Jul 25, 2000
Hitachi, Ltd.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and method
Patent number
6,016,187
Issue date
Jan 18, 2000
Hitachi, Ltd.
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and method
Patent number
5,767,949
Issue date
Jun 16, 1998
Hitachi, Ltd.
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern detecting method, pattern detecting apparatus, projection e...
Patent number
5,684,565
Issue date
Nov 4, 1997
Hitachi, Ltd.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for pattern exposure, mask used therefor, and...
Patent number
5,677,755
Issue date
Oct 14, 1997
Hitachi, Ltd.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and method
Patent number
5,526,094
Issue date
Jun 11, 1996
Hitachi, Ltd.
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical apparatus for laser machining
Patent number
5,414,239
Issue date
May 9, 1995
Hitachi, Ltd.
Takao Terabayashi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of detecting inclination of a specimen and a projection expo...
Patent number
5,392,115
Issue date
Feb 21, 1995
Hitachi, Ltd.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and method
Patent number
5,329,333
Issue date
Jul 12, 1994
Hitachi, Ltd.
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Reduced-projection exposure system with chromatic aberration correc...
Patent number
5,324,953
Issue date
Jun 28, 1994
Hitachi, Ltd.
Yasuhiro Yoshitake
G02 - OPTICS
Information
Patent Grant
Illumination method, illumination apparatus and projection exposure...
Patent number
5,302,999
Issue date
Apr 12, 1994
Hitachi, Ltd.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Grant
Projection type exposure method and apparatus
Patent number
5,247,329
Issue date
Sep 21, 1993
Hitachi, Ltd.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Laser Direct Imaging Apparatus
Publication number
20090080047
Publication date
Mar 26, 2009
HITACHI VIA MECHANICS, LTD.
Yoshitatsu NAITO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PATTERN EXPOSURE METHOD AND PATTERN EXPOSURE APPARATUS
Publication number
20080213705
Publication date
Sep 4, 2008
Hitachi Via Mechanics Ltd.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Application
Substrate Exposure Apparatus and Illumination Apparatus
Publication number
20080079921
Publication date
Apr 3, 2008
HITACHI VIA MECHANICS, LTD.
Yoshitada Oshida
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Device for Changing Pitch Between Light Beam Axes, and Substrate Ex...
Publication number
20070279609
Publication date
Dec 6, 2007
HITACHI VIA MECHANICS, LTD.
Yoshitada OSHIDA
G02 - OPTICS
Information
Patent Application
Method of inspecting a DNA chip and apparatus thereof
Publication number
20070154938
Publication date
Jul 5, 2007
Yoshitada Oshida
G01 - MEASURING TESTING
Information
Patent Application
Lighting system and exposure apparatus
Publication number
20070058149
Publication date
Mar 15, 2007
HITACHI VIA MECHANICS, LTD.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Application
Pattern exposure method and apparatus
Publication number
20060215139
Publication date
Sep 28, 2006
Hitachi Via Mechanics Ltd.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Application
Pattern exposure method and pattern exposure apparatus
Publication number
20050219496
Publication date
Oct 6, 2005
Hitachi Via Mechanics Ltd.
Yoshitada Oshida
G02 - OPTICS
Information
Patent Application
Illuminating method, exposing method, and device for therefor
Publication number
20050219493
Publication date
Oct 6, 2005
Yoshitada Oshida
G02 - OPTICS
Information
Patent Application
Exposure apparatus and method
Publication number
20050196713
Publication date
Sep 8, 2005
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure apparatus and method
Publication number
20050196705
Publication date
Sep 8, 2005
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure apparatus and method
Publication number
20050191583
Publication date
Sep 1, 2005
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Manufacturing method and manufacturing device of liquid crystal dis...
Publication number
20040257507
Publication date
Dec 23, 2004
Aki Sakai
G02 - OPTICS
Information
Patent Application
Biological sample optical measuring method and biological sample op...
Publication number
20040239916
Publication date
Dec 2, 2004
Taisaku Seino
G01 - MEASURING TESTING
Information
Patent Application
Method in inspecting DNA and apparatus therefor
Publication number
20030087282
Publication date
May 8, 2003
Hitachi, Ltd. Incorporation: Japan
Yoshitada Oshida
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for measuring micro area in specimen
Publication number
20030081209
Publication date
May 1, 2003
Satoshi Takahashi
G01 - MEASURING TESTING
Information
Patent Application
Exposure apparatus and method
Publication number
20030073045
Publication date
Apr 17, 2003
Minori Noguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method and apparatus for inspecting DNA and method for detecting fl...
Publication number
20020140933
Publication date
Oct 3, 2002
Hitachi, Ltd
Yoshitada Oshida
G01 - MEASURING TESTING