Yoshiteru Shikakura

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and setting method thereof
- Patent number 11,391,755
- Issue date Jul 19, 2022
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,712,363
- Issue date Jul 14, 2020
- Hitachi High-Tech Science Corporation
- Masayuki Iwasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope and measurement range adjusting method fo...
- Patent number 9,921,241
- Issue date Mar 20, 2018
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring vibration characteristic of cantilever
- Patent number 9,354,248
- Issue date May 31, 2016
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring vibration characteristics of cantilever
- Patent number 8,615,811
- Issue date Dec 24, 2013
- SII NanoTechnology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe aligning method for probe microscope and probe microscope ope...
- Patent number 8,495,759
- Issue date Jul 23, 2013
- SII NanoTechnology Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Approach method for probe and sample in scanning probe microscope
- Patent number 8,024,816
- Issue date Sep 20, 2011
- SII NanoTechnology Inc.
- Masato Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,997,124
- Issue date Aug 16, 2011
- SII NanoTechnology Inc.
- Yoshiteru Shikakura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Working method using scanning probe
- Patent number 7,442,925
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 7,284,415
- Issue date Oct 23, 2007
- SII NanoTechnology Inc.
- Yoshiteru Shikakura
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating scanning probe microscope
- Patent number 6,596,992
- Issue date Jul 22, 2003
- Seiko Instruments Inc.
- Kazunori Ando
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF
- Publication number 20210293849
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190234992
- Publication date Aug 1, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masayuki IWASA
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Measurement Range Adjusting Method fo...
- Publication number 20160291053
- Publication date Oct 6, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING VIBRATION CHARACTERISTIC OF CANTILEVER
- Publication number 20150276796
- Publication date Oct 1, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING VIBRATION CHARACTERISTICS OF CANTILEVER
- Publication number 20120246768
- Publication date Sep 27, 2012
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE
- Publication number 20100205697
- Publication date Aug 12, 2010
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPE...
- Publication number 20100031402
- Publication date Feb 4, 2010
- Shigeru Wakiyama
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20070290130
- Publication date Dec 20, 2007
- Yoshiteru Shikakura
- G01 - MEASURING TESTING
Information Patent Application
Processing method using atomic force microscope microfabrication de...
- Publication number 20070278177
- Publication date Dec 6, 2007
- Kazushige Kondo
- G01 - MEASURING TESTING
Information Patent Application
Working method using scanning probe
- Publication number 20060219901
- Publication date Oct 5, 2006
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20050199046
- Publication date Sep 15, 2005
- Yoshiteru Shikakura
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20020088937
- Publication date Jul 11, 2002
- Kazunori Ando
- B82 - NANO-TECHNOLOGY

Yoshiteru Shikakura

Person

Patents Grantslast 30 patents

Scanning probe microscope and setting method thereof

Scanning probe microscope

Scanning probe microscope and measurement range adjusting method fo...

Method for measuring vibration characteristic of cantilever

Method of measuring vibration characteristics of cantilever

Probe aligning method for probe microscope and probe microscope ope...

Approach method for probe and sample in scanning probe microscope

Scanning probe microscope

Working method using scanning probe

Scanning probe microscope

Method of operating scanning probe microscope

Patents Applicationslast 30 patents

Scanning Probe Microscope, Sample Observation Processing System, an...

SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF

SCANNING PROBE MICROSCOPE

Scanning Probe Microscope and Measurement Range Adjusting Method fo...

METHOD FOR MEASURING VIBRATION CHARACTERISTIC OF CANTILEVER

METHOD OF MEASURING VIBRATION CHARACTERISTICS OF CANTILEVER

APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE

PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPE...

Scanning probe microscope

Processing method using atomic force microscope microfabrication de...

Working method using scanning probe

Scanning probe microscope

Scanning probe microscope