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Yoshiyuki NAKAMURA
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Information processing device, information processing method, and p...
Patent number
11,423,496
Issue date
Aug 23, 2022
Sony Corporation
Shigeto Takenaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Heat transfer system, winding device, heat transfer method, and win...
Patent number
10,926,551
Issue date
Feb 23, 2021
Dai Nippon Printing Co., Ltd.
Koichiro Kuroda
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Dip-forming synthetic isoprene polymer latex, dip-forming compositi...
Patent number
10,519,258
Issue date
Dec 31, 2019
Zeon Corporation
Yoshiyuki Nakamura
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Manufacturing method and program of semiconductor device
Patent number
10,151,792
Issue date
Dec 11, 2018
Renesas Electronics Corporation
Yoshiyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing method and program of semiconductor device
Patent number
9,945,902
Issue date
Apr 17, 2018
Renesas Electronics Corporation
Yoshiyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dip-forming composition and dip-formed article
Patent number
9,637,621
Issue date
May 2, 2017
Zeon Corporation
Shunjin Aihara
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Latex for molding use, composition for dip molding use, and dip-mol...
Patent number
9,546,239
Issue date
Jan 17, 2017
Zeon Corporation
Yoshiyuki Nakamura
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Nitrile copolymer rubber composition and nitrile copolymer latex co...
Patent number
8,563,644
Issue date
Oct 22, 2013
Zeon Corporation
Akira Imada
B32 - LAYERED PRODUCTS
Information
Patent Grant
Test circuit including tap controller selectively outputting test s...
Patent number
8,468,402
Issue date
Jun 18, 2013
Renesas Electronics Corporation
Toshiyuki Maeda
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit
Patent number
8,015,462
Issue date
Sep 6, 2011
Renesas Electronics Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit, BIST circuit, design program of B...
Patent number
7,681,096
Issue date
Mar 16, 2010
NEC Electronics Corporation
Tomonori Sasaki
G11 - INFORMATION STORAGE
Information
Patent Grant
Client terminal device, storage medium product, bank server apparat...
Patent number
7,660,756
Issue date
Feb 9, 2010
Sony Corporation
Yoshiyuki Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Information support system
Patent number
7,474,855
Issue date
Jan 6, 2009
National Institute of Advanced Industrial Science and Technology
Takuichi Nishimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built-in self test circuit
Patent number
7,360,116
Issue date
Apr 15, 2008
NEC Electronics Corp.
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and circuit test method
Patent number
7,188,289
Issue date
Mar 6, 2007
NEC Electronics Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
On-vehicle video camera
Patent number
7,050,089
Issue date
May 23, 2006
Sony Corporation
Yoshiyuki Nakamura
B60 - VEHICLES IN GENERAL
Information
Patent Grant
System for transferring data between application systems
Patent number
6,971,106
Issue date
Nov 29, 2005
Sony Corporation
Yoshiyuki Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor apparatus for providing reliable data analysis of sig...
Patent number
6,920,590
Issue date
Jul 19, 2005
NEC Electronics Corporation
Yoshiyuki Nakamura
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit method and apparatus
Patent number
6,898,748
Issue date
May 24, 2005
NEC Electronics Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device using interposer substrate and manufacturing m...
Patent number
6,720,644
Issue date
Apr 13, 2004
Sony Corporation
Akira Yoshizawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Editing device and editing method
Patent number
6,674,955
Issue date
Jan 6, 2004
Sony Corporation
Masafumi Matsui
G11 - INFORMATION STORAGE
Information
Patent Grant
Synthetic aperture sonar and synthetic aperture processing method
Patent number
6,594,200
Issue date
Jul 15, 2003
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test circuit for a memory device
Patent number
6,523,135
Issue date
Feb 18, 2003
NEC Corporation
Yoshiyuki Nakamura
G11 - INFORMATION STORAGE
Information
Patent Grant
Test circuit and method for system logic
Patent number
6,381,720
Issue date
Apr 30, 2002
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Macro cell signal selector and semiconductor integrated circuit inc...
Patent number
6,140,840
Issue date
Oct 31, 2000
NEC Corporation
Yoshiyuki Nakamura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test circuit and test method for testing semiconductor chip
Patent number
6,079,039
Issue date
Jun 20, 2000
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Integrated semiconductor circuit having scan flip-flops at predeter...
Patent number
5,680,406
Issue date
Oct 21, 1997
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Integrated logic circuit with partial scan path circuit and partial...
Patent number
5,627,841
Issue date
May 6, 1997
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Testable scan path circuit operable with multi-phase clock
Patent number
5,519,714
Issue date
May 21, 1996
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Scan path circuit for testing multi-phase clocks from sequential ci...
Patent number
5,459,736
Issue date
Oct 17, 1995
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HEAT TRANSFER SYSTEM, WINDING DEVICE, HEAT TRANSFER METHOD, AND WIN...
Publication number
20190202212
Publication date
Jul 4, 2019
DAI NIPPON PRINTING CO., LTD.
Koichiro KURODA
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
MANUFACTURING METHOD AND PROGRAM OF SEMICONDUCTOR DEVICE
Publication number
20180217203
Publication date
Aug 2, 2018
RENESAS ELECTRONICS CORPORATION
Yoshiyuki NAKAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIP-FORMING SYNTHETIC ISOPRENE POLYMER LATEX, DIP-FORMING COMPOSITI...
Publication number
20180022841
Publication date
Jan 25, 2018
Zeon Corporation
Yoshiyuki NAKAMURA
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
Publication number
20170161852
Publication date
Jun 8, 2017
SONY CORPORATION
SHIGETO TAKENAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
Publication number
20170140483
Publication date
May 18, 2017
SONY CORPORATION
SHIGETO TAKENAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DIP-FORMING COMPOSITION AND DIP-FORMING ARTICLE
Publication number
20160168366
Publication date
Jun 16, 2016
Zeon Corporation
Shunjin AIHARA
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
LATEX FOR MOLDING USE, COMPOSITION FOR DIP MOLDING USE, AND DIP-MOL...
Publication number
20150376322
Publication date
Dec 31, 2015
ZEON CORPORATION
Yoshiyuki NAKAMURA
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
MANUFACTURING METHOD AND PROGRAM OF SEMICONDUCTOR DEVICE
Publication number
20150369857
Publication date
Dec 24, 2015
RENESAS ELECTRONICS CORPORATION
Yoshiyuki NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
LATEX, DIP-FORMING COMPOSITION, AND DIP-FORMED ARTICLE
Publication number
20150087761
Publication date
Mar 26, 2015
Zeon Corporation
Yoshitaka Satoh
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
Test circuit including tap controller selectively outputting test s...
Publication number
20100174958
Publication date
Jul 8, 2010
NEC Electronics Corporation
Toshiyuki Maeda
G01 - MEASURING TESTING
Information
Patent Application
NITRILE COPOLYMER RUBBER COMPOSITION AND NITRILE COPOLYMER LATEX CO...
Publication number
20100104789
Publication date
Apr 29, 2010
Akira Imada
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
COOLING APPARATUS AND VEHICLE
Publication number
20100062321
Publication date
Mar 11, 2010
Yoshiyuki Nakamura
B60 - VEHICLES IN GENERAL
Information
Patent Application
BATTERY PACK AND VEHICLE
Publication number
20090173559
Publication date
Jul 9, 2009
Yoshiyuki Nakamura
B60 - VEHICLES IN GENERAL
Information
Patent Application
Image providing apparatus
Publication number
20090024954
Publication date
Jan 22, 2009
Sony Corporation
Manabu Sakamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test circuit
Publication number
20080281547
Publication date
Nov 13, 2008
NEC Electronics Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor integrated circuit, BIST circuit, design program of B...
Publication number
20080077831
Publication date
Mar 27, 2008
NEC Electronics Corporation
Tomonori Sasaki
G11 - INFORMATION STORAGE
Information
Patent Application
Apparatus and a method of soldering a part to a board
Publication number
20070023486
Publication date
Feb 1, 2007
Masanari Matsuura
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Information support system
Publication number
20060153571
Publication date
Jul 13, 2006
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Takuichi Nishimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Authentication system, light emitting device, authentication device...
Publication number
20060095773
Publication date
May 4, 2006
Hideo Itoh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test circuit and circuit test method
Publication number
20050210351
Publication date
Sep 22, 2005
NEC Electronics Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Application
Deposits and savings display apparatus
Publication number
20040039701
Publication date
Feb 26, 2004
Yoshiyuki Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Image providing device
Publication number
20040024668
Publication date
Feb 5, 2004
Manabu Sakamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Built-in self test circuit
Publication number
20030191998
Publication date
Oct 9, 2003
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Application
Vehichle-mounted video switching device
Publication number
20030156193
Publication date
Aug 21, 2003
Yoshiyuki Nakamura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
EDITING SYSTEM AND EDITING METHOD
Publication number
20030091329
Publication date
May 15, 2003
TETSURO NAKATA
G11 - INFORMATION STORAGE
Information
Patent Application
EDITING APPARATUS HAVING DEDICATED PROCESSING UNIT FOR VIDEO EDITING
Publication number
20030086686
Publication date
May 8, 2003
MASAFUMI MATSUI
G11 - INFORMATION STORAGE
Information
Patent Application
Client terminal device, storage medium product, bank server apparat...
Publication number
20020188565
Publication date
Dec 12, 2002
Yoshiyuki Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
On-vehicle video camera
Publication number
20020118282
Publication date
Aug 29, 2002
Yoshiyuki Nakamura
B60 - VEHICLES IN GENERAL
Information
Patent Application
Synthetic aperture sonar and synthetic aperture processing method
Publication number
20020093880
Publication date
Jul 18, 2002
NEC Corporation
Yoshiyuki Nakamura
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device using interposer substrate and manufacturing m...
Publication number
20020084522
Publication date
Jul 4, 2002
Akira Yoshizawa
H01 - BASIC ELECTRIC ELEMENTS