Youn Sung Choi

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
SRAM source-drain structure
- Patent number 11,075,206
- Issue date Jul 27, 2021
- QUALCOMM Incorporated
- Kwanyong Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor for gate leakage detection
- Patent number 10,996,261
- Issue date May 4, 2021
- QUALCOMM Incorporated
- Hyunwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
Integration of finFET device
- Patent number 10,950,488
- Issue date Mar 16, 2021
- Texas Instruments Incorporated
- Ryoung-han Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for fabrication of gated diodes with selective...
- Patent number 10,600,774
- Issue date Mar 24, 2020
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing or avoiding mechanical stress in static random access memo...
- Patent number 10,490,558
- Issue date Nov 26, 2019
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect transistor (FET) devices employing adjacent asymmetric...
- Patent number 10,062,768
- Issue date Aug 28, 2018
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with dual stress liner boundary
- Patent number 9,953,967
- Issue date Apr 24, 2018
- Texas Instruments Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration of analog transistor
- Patent number 9,922,971
- Issue date Mar 20, 2018
- Texas Instruments Incorporated
- Himadri Sekhar Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistors (FETs) (FinFETs) employing dielectric...
- Patent number 9,882,051
- Issue date Jan 30, 2018
- QUALCOMM Incorporated
- Ukjin Roh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistors (FETs) (FinFETs) employing dielectric...
- Patent number 9,853,152
- Issue date Dec 26, 2017
- QUALCOMM Incorporated
- Ukjin Roh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect transistor (FET) devices employing adjacent asymmetric...
- Patent number 9,634,138
- Issue date Apr 25, 2017
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with dual stress liner boundary
- Patent number 9,543,437
- Issue date Jan 10, 2017
- Texas Instruments Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration of analog transistor
- Patent number 9,412,741
- Issue date Aug 9, 2016
- Texas Instruments Incorporated
- Himadri Sekhar Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicide formation due to improved SiGe faceting
- Patent number 9,406,769
- Issue date Aug 2, 2016
- Texas Instruments Incorporated
- Shashank S. Ekbote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration of analog transistor
- Patent number 9,202,810
- Issue date Dec 1, 2015
- Texas Instruments Incorporated
- Himadri Sekhar Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicide formation due to improved SiGe faceting
- Patent number 9,202,883
- Issue date Dec 1, 2015
- Texas Instruments Incorporated
- Shashank S. Ekbote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving device performance using dual stress liner bou...
- Patent number 9,171,901
- Issue date Oct 27, 2015
- Texas Instruments Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicide formation due to improved SiGe faceting
- Patent number 9,093,298
- Issue date Jul 28, 2015
- Texas Instruments Incorporated
- Shashank S. Ekbote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of printing multiple structure widths using spacer double pa...
- Patent number 9,029,263
- Issue date May 12, 2015
- Texas Instruments Incorporated
- Ryoung-han Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain induced barrier lowering with anti-punch-through implant
- Patent number 8,987,748
- Issue date Mar 24, 2015
- Texas Instruments Incorporated
- Himadri Sekhar Pal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving device performance using dual stress liner bou...
- Patent number 8,859,357
- Issue date Oct 14, 2014
- Texas Instruments Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having silicide block resistor
- Patent number 8,748,256
- Issue date Jun 10, 2014
- Texas Instruments Incorporated
- Song Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scribe line test modules for in-line monitoring of context dependen...
- Patent number 8,669,775
- Issue date Mar 11, 2014
- Texas Instruments Incorporated
- Youn Sung Choi
- G01 - MEASURING TESTING
Information Patent Grant
On-die parametric test modules for in-line monitoring of context de...
- Patent number 8,664,968
- Issue date Mar 4, 2014
- Texas Instruments Incorporated
- Gregory Charles Baldwin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INLINE MONITORING TEST STRUCTURE
- Publication number 20200256915
- Publication date Aug 13, 2020
- QUALCOMM Incorporated
- Youn Sung CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SRAM SOURCE-DRAIN STRUCTURE
- Publication number 20200194440
- Publication date Jun 18, 2020
- QUALCOMM Incorporated
- Kwanyong LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR FOR GATE LEAKAGE DETECTION
- Publication number 20200049757
- Publication date Feb 13, 2020
- QUALCOMM Incorporated
- Hyunwoo PARK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR FABRICATION OF GATED DIODES WITH SELECTIVE...
- Publication number 20190312025
- Publication date Oct 10, 2019
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF FINFET DEVICE
- Publication number 20190273013
- Publication date Sep 5, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Ryoung-han KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING OR AVOIDING MECHANICAL STRESS IN STATIC RANDOM ACCESS MEMO...
- Publication number 20180350819
- Publication date Dec 6, 2018
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN AND INTEGRATION OF FINFET DEVICE
- Publication number 20180108564
- Publication date Apr 19, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Ryoung-han KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD-EFFECT TRANSISTOR (FET) DEVICES EMPLOYING ADJACENT ASYMMETRIC...
- Publication number 20180061943
- Publication date Mar 1, 2018
- QUALCOMM Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH DUAL STRESS LINER BOUNDARY
- Publication number 20170084598
- Publication date Mar 23, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF ANALOG TRANSISTOR
- Publication number 20160322352
- Publication date Nov 3, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Himadri Sekhar PAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF ANALOG TRANSISTOR
- Publication number 20160043076
- Publication date Feb 11, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Himadri Sekhar PAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICIDE FORMATION DUE TO IMPROVED SiGe FACETING
- Publication number 20160027888
- Publication date Jan 28, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Shashank S. EKBOTE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH DUAL STRESS LINER BOUNDARY
- Publication number 20160013314
- Publication date Jan 14, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF ANALOG TRANSISTOR
- Publication number 20150287717
- Publication date Oct 8, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Himadri Sekhar PAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICIDE FORMATION DUE TO IMPROVED SIGE FACETING
- Publication number 20150287801
- Publication date Oct 8, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Shashank S. EKBOTE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN AND INTEGRATION OF FINFET DEVICE
- Publication number 20150171217
- Publication date Jun 18, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Ryoung-han KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICIDE FORMATION DUE TO IMPROVED SiGe FACETING
- Publication number 20150054084
- Publication date Feb 26, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Shashank S. EKBOTE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING DEVICE PERFORMANCE USING DUAL STRESS LINER BOU...
- Publication number 20140374836
- Publication date Dec 25, 2014
- Youn Sung CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduction of Proximity Effects in Field-Effect Transistors with Emb...
- Publication number 20140054710
- Publication date Feb 27, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT (IC) HAVING TSVS AND STRESS COMPENSATING LAYER
- Publication number 20130249011
- Publication date Sep 26, 2013
- TEXAS INSTRUMENTS INCORPORATED
- YOUN SUNG CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT HAVING SILICIDE BLOCK RESISTOR
- Publication number 20130200466
- Publication date Aug 8, 2013
- TEXAS INSTRUMENTS INCORPORATED
- SONG ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRAIN INDUCED BARRIER LOWERING WITH ANTI-PUNCH-THROUGH IMPLANT
- Publication number 20130161639
- Publication date Jun 27, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Himadri Sekhar PAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING DEVICE PERFORMANCE USING DUAL STRESS LINER BOU...
- Publication number 20120119301
- Publication date May 17, 2012
- Texas Instrument Incorporated
- Youn Sung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCRIBE LINE TEST MODULES FOR IN-LINE MONITORING OF CONTEXT DEPENDEN...
- Publication number 20120074980
- Publication date Mar 29, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Youn Sung Choi
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE PARAMETRIC TEST MODULES FOR IN-LINE MONITORING OF CONTEXT DE...
- Publication number 20120074973
- Publication date Mar 29, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Gregory Charles Baldwin
- G01 - MEASURING TESTING

Youn Sung Choi

Person

Patents Grantslast 30 patents

SRAM source-drain structure

Sensor for gate leakage detection

Integration of finFET device

Systems and methods for fabrication of gated diodes with selective...

Reducing or avoiding mechanical stress in static random access memo...

Field-effect transistor (FET) devices employing adjacent asymmetric...

Integrated circuit with dual stress liner boundary

Integration of analog transistor

Fin field effect transistors (FETs) (FinFETs) employing dielectric...

Fin field effect transistors (FETs) (FinFETs) employing dielectric...

Field-effect transistor (FET) devices employing adjacent asymmetric...

Integrated circuit with dual stress liner boundary

Integration of analog transistor

Silicide formation due to improved SiGe faceting

Integration of analog transistor

Silicide formation due to improved SiGe faceting

Method for improving device performance using dual stress liner bou...

Silicide formation due to improved SiGe faceting

Method of printing multiple structure widths using spacer double pa...

Drain induced barrier lowering with anti-punch-through implant

Method for improving device performance using dual stress liner bou...

Integrated circuit having silicide block resistor

Scribe line test modules for in-line monitoring of context dependen...

On-die parametric test modules for in-line monitoring of context de...

Patents Applicationslast 30 patents

INLINE MONITORING TEST STRUCTURE

SRAM SOURCE-DRAIN STRUCTURE

SENSOR FOR GATE LEAKAGE DETECTION

SYSTEMS AND METHODS FOR FABRICATION OF GATED DIODES WITH SELECTIVE...

INTEGRATION OF FINFET DEVICE

REDUCING OR AVOIDING MECHANICAL STRESS IN STATIC RANDOM ACCESS MEMO...

DESIGN AND INTEGRATION OF FINFET DEVICE

FIELD-EFFECT TRANSISTOR (FET) DEVICES EMPLOYING ADJACENT ASYMMETRIC...

INTEGRATED CIRCUIT WITH DUAL STRESS LINER BOUNDARY

INTEGRATION OF ANALOG TRANSISTOR

INTEGRATION OF ANALOG TRANSISTOR

SILICIDE FORMATION DUE TO IMPROVED SiGe FACETING

INTEGRATED CIRCUIT WITH DUAL STRESS LINER BOUNDARY

INTEGRATION OF ANALOG TRANSISTOR

SILICIDE FORMATION DUE TO IMPROVED SIGE FACETING

DESIGN AND INTEGRATION OF FINFET DEVICE

SILICIDE FORMATION DUE TO IMPROVED SiGe FACETING

METHOD FOR IMPROVING DEVICE PERFORMANCE USING DUAL STRESS LINER BOU...

Reduction of Proximity Effects in Field-Effect Transistors with Emb...

INTEGRATED CIRCUIT (IC) HAVING TSVS AND STRESS COMPENSATING LAYER

INTEGRATED CIRCUIT HAVING SILICIDE BLOCK RESISTOR

DRAIN INDUCED BARRIER LOWERING WITH ANTI-PUNCH-THROUGH IMPLANT

METHOD FOR IMPROVING DEVICE PERFORMANCE USING DUAL STRESS LINER BOU...

SCRIBE LINE TEST MODULES FOR IN-LINE MONITORING OF CONTEXT DEPENDEN...

ON-DIE PARAMETRIC TEST MODULES FOR IN-LINE MONITORING OF CONTEXT DE...