Young Gyu AN

Person

Cheongju-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Stylus pen and electronic device including same
- Patent number 10,817,078
- Issue date Oct 27, 2020
- Samsung Electronics Co., Ltd.
- Chung Keun Yoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Speaker apparatus and electronic device having the same
- Patent number 9,609,438
- Issue date Mar 28, 2017
- Samsung Electronics Co., Ltd.
- Kwang-Hyun Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Motor and rotor thereof
- Patent number 9,419,482
- Issue date Aug 16, 2016
- Samsung Electronics Co., Ltd.
- Jae Young Lee
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Image communication method and apparatus which controls the output...
- Patent number 9,088,699
- Issue date Jul 21, 2015
- Samsung Electronics Co., Ltd.
- Young-hun An
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Motor and rotor thereof
- Patent number 9,048,712
- Issue date Jun 2, 2015
- Samsung Electronics Co., Ltd.
- Jae Young Lee
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Organic deposition apparatus and method of depositing organic subst...
- Patent number 8,617,314
- Issue date Dec 31, 2013
- ADP Engineering Co., Ltd.
- Young Ung An
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System for controlling and managing network apparatus and method th...
- Patent number 8,615,574
- Issue date Dec 24, 2013
- KT Corporation
- Yun-Geun Ji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Area-efficient data line layouts to suppress the degradation of ele...
- Patent number 8,547,766
- Issue date Oct 1, 2013
- Samsung Electronics Co., Ltd.
- Jong-Hak Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Slide type portable terminal
- Patent number 8,391,002
- Issue date Mar 5, 2013
- Samsung Electronics Co., Ltd.
- Sun-Jong Choe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for controlling power in dual-standby mode mobile terminal a...
- Patent number 8,160,632
- Issue date Apr 17, 2012
- Samsung Electronics Co., Ltd.
- Mathew Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electrical signal transmission module, method of transmitting elect...
- Patent number 8,139,949
- Issue date Mar 20, 2012
- Samsung Electronics Co., Ltd.
- Sang-Hoon Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor memory device
- Patent number 8,130,577
- Issue date Mar 6, 2012
- Samsung Electronics Co., Ltd.
- Jong-Hak Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Interface structure of wafer test equipment
- Patent number 8,026,733
- Issue date Sep 27, 2011
- Samsung Electronics Co., Ltd.
- Sang-hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Interposer and probe card having the same
- Patent number 7,884,628
- Issue date Feb 8, 2011
- Samsung Electronics Co., Ltd.
- Young-Soo An
- G01 - MEASURING TESTING
Information Patent Grant
Wireless interface probe card for high speed one-shot wafer test an...
- Patent number 7,880,490
- Issue date Feb 1, 2011
- Samsung Electronics Co., Ltd.
- Sang-Hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer type test board assembly for high-precision inspection
- Patent number 7,786,721
- Issue date Aug 31, 2010
- Samsung Electronics Co., Ltd.
- Min-Gu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Flat panel audio output apparatus and video/audio output apparatus
- Patent number 7,769,191
- Issue date Aug 3, 2010
- Samsung Electronics Co., Ltd.
- Kyung-ju Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Probe card capable of multi-probing
- Patent number 7,659,735
- Issue date Feb 9, 2010
- Min-gu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test system including coaxial cables
- Patent number 7,538,566
- Issue date May 26, 2009
- Samsung Electronics Co., Ltd.
- Young-Soo An
- G01 - MEASURING TESTING
Information Patent Grant
Connector for testing a semiconductor package
- Patent number 7,438,563
- Issue date Oct 21, 2008
- Samsung Electronics Co., Ltd.
- Young-Bae Chung
- G01 - MEASURING TESTING
Information Patent Grant
Socket including pressure conductive rubber and mesh for testing of...
- Patent number 6,489,790
- Issue date Dec 3, 2002
- Samsung Electronics Co., Ltd.
- Young-soo An
- G01 - MEASURING TESTING
Information Patent Grant
Socket pin and socket for electrical testing of semiconductor packages
- Patent number 6,396,294
- Issue date May 28, 2002
- Samsung Electronics Co., Ltd.
- Young-soo An
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REPRINT APPARATUS FOR CIRCUIT BOARD AND REPRINT METHOD USING THE SAME
- Publication number 20240365475
- Publication date Oct 31, 2024
- Samsung Electro-Mechanics Co., Ltd.
- Do Jae YOO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SUBSTRATE TREATING APPARATUS
- Publication number 20240216965
- Publication date Jul 4, 2024
- SEMES CO., LTD.
- Young Seo AN
- B08 - CLEANING
Information Patent Application
SUBSTRATE TREATING APPARATUS
- Publication number 20240222155
- Publication date Jul 4, 2024
- SEMES CO., LTD.
- Young Seo AN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPRINT APPARATUS FOR CIRCUIT BOARD AND REPRINT METHOD USING THE SAME
- Publication number 20240074065
- Publication date Feb 29, 2024
- Samsung Electro-Mechanics Co., Ltd.
- Do Jae YOO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MOTOR MANUFACTURING METHOD AND MOTOR MANUFACTURING SYSTEM
- Publication number 20220360148
- Publication date Nov 10, 2022
- MANDO CORPORATION
- Young Kyu AN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD
- Publication number 20220139738
- Publication date May 5, 2022
- SEMES CO., LTD.
- Jae Oh BANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STYLUS PEN AND ELECTRONIC DEVICE INCLUDING SAME
- Publication number 20180217687
- Publication date Aug 2, 2018
- Samsung Electronics Co., Ltd.
- Chung Keun YOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OPERATING COMPETITION GAME
- Publication number 20170100671
- Publication date Apr 13, 2017
- RedDuck Inc
- Kyeong Taek OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPEAKER APPARATUS AND ELECTRONIC DEVICE HAVING THE SAME
- Publication number 20160088398
- Publication date Mar 24, 2016
- Samsung Electronics Co., Ltd.
- Kwang-Hyun KIM
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MOTOR AND ROTOR THEREOF
- Publication number 20130187486
- Publication date Jul 25, 2013
- Samsung Electronics Co., Ltd.
- Jae Young Lee
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MOTOR AND ROTOR THEREOF
- Publication number 20130187506
- Publication date Jul 25, 2013
- Samsung Electronics Co., Ltd.
- Jae Young Lee
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR MODULE AND SYSTEM INCLUDING THE SAME
- Publication number 20120182653
- Publication date Jul 19, 2012
- Samsung Electronics Co., Ltd.
- Joo-Han LEE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
IMAGE COMMUNICATION METHOD AND APPARATUS
- Publication number 20120044364
- Publication date Feb 23, 2012
- Samsung Electronics Co., Ltd.
- Young-hun AN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Digital camera dust error photographed image correction
- Publication number 20100302398
- Publication date Dec 2, 2010
- Samsung Digital Imaging Co., Ltd.
- Young-seok An
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Data line layouts
- Publication number 20100259963
- Publication date Oct 14, 2010
- SAMSUNG ELECTRONICS CO., LTD.
- Jong-Hak Won
- G11 - INFORMATION STORAGE
Information Patent Application
SLIDE TYPE PORTABLE TERMINAL
- Publication number 20100226081
- Publication date Sep 9, 2010
- Samsung Electronics Co., Ltd.
- Sun-Jong CHOE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus for testing electrical characteristics
- Publication number 20100176796
- Publication date Jul 15, 2010
- Dong-dae Kim
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device
- Publication number 20100118615
- Publication date May 13, 2010
- Samsung Electronics Co., Ltd.
- Jong-Hak Won
- G11 - INFORMATION STORAGE
Information Patent Application
Interface structure of wafer test equipment
- Publication number 20100117673
- Publication date May 13, 2010
- Samsung Electronics Co., Ltd.
- Sang-hoon Lee
- G01 - MEASURING TESTING
Information Patent Application
Interface device for wireless testing, semiconductor device and sem...
- Publication number 20100025682
- Publication date Feb 4, 2010
- Samsung Electronics Co., Ltd.
- Sang-Hoon Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING POWER IN DUAL-STANDBY MODE MOBILE TERMINAL A...
- Publication number 20090286576
- Publication date Nov 19, 2009
- Samsung Electronics Co., Ltd.
- Mathew LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ORGANIC DEPOSITION APPARATUS AND METHOD OF DEPOSITING ORGANIC SUBST...
- Publication number 20090258142
- Publication date Oct 15, 2009
- Young Ung An
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Interposer and a probe card assembly for electrical die sorting and...
- Publication number 20090189624
- Publication date Jul 30, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Se-Jang Oh
- G01 - MEASURING TESTING
Information Patent Application
Interposer and probe card having the same
- Publication number 20090102500
- Publication date Apr 23, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Young-Soo An
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS INTERFACE PROBE CARD FOR HIGH SPEED ONE-SHOT WAFER TEST AN...
- Publication number 20090066350
- Publication date Mar 12, 2009
- Samsung Electronics Co., Ltd.
- Sang-Hoon LEE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL SIGNAL TRANSMISSION MODULE, METHOD OF TRANSMITTING ELECT...
- Publication number 20090028571
- Publication date Jan 29, 2009
- Sang-Hoon Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM FOR CONTROLLING AND MANAGING NETWORK APPARATUS AND METHOD TH...
- Publication number 20080250132
- Publication date Oct 9, 2008
- KT CORPORATION
- YUN-GEUN JI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Multilayer type test board assembly for high-precision inspection
- Publication number 20080164901
- Publication date Jul 10, 2008
- Samsung Electronics Co., Ltd.
- Min-Gu Kim
- G01 - MEASURING TESTING
Information Patent Application
System and method for testing semiconductor integrated circuit in p...
- Publication number 20080164894
- Publication date Jul 10, 2008
- Samsung Electronics Co., Ltd.
- Min-Gu Kim
- G01 - MEASURING TESTING
Information Patent Application
Probe card for test of semiconductor chips and method for test of s...
- Publication number 20080164898
- Publication date Jul 10, 2008
- Samsung Electronics Co., Ltd.
- Sung-Hoon Bae
- G01 - MEASURING TESTING

Young Gyu AN

Person

Patents Grantslast 30 patents

Stylus pen and electronic device including same

Speaker apparatus and electronic device having the same

Motor and rotor thereof

Image communication method and apparatus which controls the output...

Motor and rotor thereof

Organic deposition apparatus and method of depositing organic subst...

System for controlling and managing network apparatus and method th...

Area-efficient data line layouts to suppress the degradation of ele...

Slide type portable terminal

Method for controlling power in dual-standby mode mobile terminal a...

Electrical signal transmission module, method of transmitting elect...

Semiconductor memory device

Interface structure of wafer test equipment

Interposer and probe card having the same

Wireless interface probe card for high speed one-shot wafer test an...

Multilayer type test board assembly for high-precision inspection

Flat panel audio output apparatus and video/audio output apparatus

Probe card capable of multi-probing

Electrical test system including coaxial cables

Connector for testing a semiconductor package

Socket including pressure conductive rubber and mesh for testing of...

Socket pin and socket for electrical testing of semiconductor packages

Patents Applicationslast 30 patents

REPRINT APPARATUS FOR CIRCUIT BOARD AND REPRINT METHOD USING THE SAME

SUBSTRATE TREATING APPARATUS

SUBSTRATE TREATING APPARATUS

REPRINT APPARATUS FOR CIRCUIT BOARD AND REPRINT METHOD USING THE SAME

MOTOR MANUFACTURING METHOD AND MOTOR MANUFACTURING SYSTEM

SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD

STYLUS PEN AND ELECTRONIC DEVICE INCLUDING SAME

SYSTEM AND METHOD FOR OPERATING COMPETITION GAME

SPEAKER APPARATUS AND ELECTRONIC DEVICE HAVING THE SAME

MOTOR AND ROTOR THEREOF

MOTOR AND ROTOR THEREOF

SEMICONDUCTOR MODULE AND SYSTEM INCLUDING THE SAME

IMAGE COMMUNICATION METHOD AND APPARATUS

Digital camera dust error photographed image correction

Data line layouts

SLIDE TYPE PORTABLE TERMINAL

Apparatus for testing electrical characteristics

Semiconductor memory device

Interface structure of wafer test equipment

Interface device for wireless testing, semiconductor device and sem...

METHOD FOR CONTROLLING POWER IN DUAL-STANDBY MODE MOBILE TERMINAL A...

ORGANIC DEPOSITION APPARATUS AND METHOD OF DEPOSITING ORGANIC SUBST...

Interposer and a probe card assembly for electrical die sorting and...

Interposer and probe card having the same

WIRELESS INTERFACE PROBE CARD FOR HIGH SPEED ONE-SHOT WAFER TEST AN...

ELECTRICAL SIGNAL TRANSMISSION MODULE, METHOD OF TRANSMITTING ELECT...

SYSTEM FOR CONTROLLING AND MANAGING NETWORK APPARATUS AND METHOD TH...

Multilayer type test board assembly for high-precision inspection

System and method for testing semiconductor integrated circuit in p...

Probe card for test of semiconductor chips and method for test of s...