Youri Victorovitch Ponomarev

Person

Leuven, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,941,222
- Issue date Apr 10, 2018
- ams International AG
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Food package with integrated RFID-tag and sensor
- Patent number 9,884,715
- Issue date Feb 6, 2018
- NXP B.V.
- Romano Hoofman
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 9,818,905
- Issue date Nov 14, 2017
- NXP B.V.
- Aurelie Humbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method including an intertial mass element
- Patent number 9,679,857
- Issue date Jun 13, 2017
- NXP B.V.
- Matthias Merz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated circuit and manufacturing method therefor
- Patent number 9,632,049
- Issue date Apr 25, 2017
- ams International AG
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
Analyte detection methods and devices
- Patent number 9,606,115
- Issue date Mar 28, 2017
- NXP B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 9,546,884
- Issue date Jan 17, 2017
- NXP B.V.
- Roel Daamen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with directional light sensor, device including...
- Patent number 9,331,219
- Issue date May 3, 2016
- NXP, B.V.
- Zoran Zivkovic
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,284,187
- Issue date Mar 15, 2016
- ams International AG
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 9,188,540
- Issue date Nov 17, 2015
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit arrangement, device and gas detection method
- Patent number 9,140,678
- Issue date Sep 22, 2015
- NXP, B.V.
- Dimitri Soccol
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 9,052,267
- Issue date Jun 9, 2015
- NXP, B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for molecule detection using nanopores
- Patent number 9,034,637
- Issue date May 19, 2015
- NXP, B.V.
- Matthias Merz
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Implantable multi-electrode device
- Patent number 9,020,607
- Issue date Apr 28, 2015
- Sapiens Steering Brain Stimulation B.V.
- Matthias Merz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Liquid immersion sensor
- Patent number 8,988,088
- Issue date Mar 24, 2015
- Quotainne Enterprises LLC
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 8,957,687
- Issue date Feb 17, 2015
- NXP, B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 8,925,371
- Issue date Jan 6, 2015
- NXP, B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Biomimetic neurostimulation device
- Patent number 8,923,977
- Issue date Dec 30, 2014
- Sapiens Steering Brain Stimulation B.V.
- Michel Marcel José Ghislain Decré
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Stacked multi-cell battery concept
- Patent number 8,906,534
- Issue date Dec 9, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Romano Hoofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 8,896,073
- Issue date Nov 25, 2014
- NXP B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Grant
Sensing environmental parameter through stress induced in IC
- Patent number 8,872,290
- Issue date Oct 28, 2014
- NXP B.V.
- Romano Hoofman
- G01 - MEASURING TESTING
Information Patent Grant
Electrochemical sensor
- Patent number 8,864,968
- Issue date Oct 21, 2014
- NXP B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
IC manufacturing method, IC and apparatus
- Patent number 8,866,239
- Issue date Oct 21, 2014
- NXP B.V.
- Marcus Van Dal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Charge-pump circuit
- Patent number 8,823,443
- Issue date Sep 2, 2014
- NXP B.V.
- Gilberto Curatola
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrochemical potentiometric sensing without reference electrode
- Patent number 8,801,917
- Issue date Aug 12, 2014
- NXP, B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
Implantable multi-electrode device
- Patent number 8,798,737
- Issue date Aug 5, 2014
- Sapiens Steering Brain Stimulation B.V.
- Matthias Merz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Integrated circuit including a porous material for retaining a liqu...
- Patent number 8,779,548
- Issue date Jul 15, 2014
- NXP, B.V.
- Youri Victorovitch Ponomarev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Humidity sensor based on progressive corrosion of exposed material
- Patent number 8,683,861
- Issue date Apr 1, 2014
- NXP, B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Intrusion protection using stress changes
- Patent number 8,330,191
- Issue date Dec 11, 2012
- NXP B.V.
- Romano Hoofman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor module for a catheter
- Patent number 8,233,957
- Issue date Jul 31, 2012
- NXP B.V.
- Matthias Merz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD
- Publication number 20170005045
- Publication date Jan 5, 2017
- NXP B.V.
- Matthias Merz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
- Publication number 20160197047
- Publication date Jul 7, 2016
- ams International AG
- Roel DAAMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
- Publication number 20160043265
- Publication date Feb 11, 2016
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
ANALYTE DETECTION METHODS AND DEVICES
- Publication number 20150226736
- Publication date Aug 13, 2015
- NXP B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit with Directional Light Sensor, device including...
- Publication number 20150171231
- Publication date Jun 18, 2015
- NXP B.V.
- Zoran Zivkovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
- Publication number 20150031158
- Publication date Jan 29, 2015
- NXP B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Application
Implantable Multi-Electrode Device
- Publication number 20140309548
- Publication date Oct 16, 2014
- SAPIENS STEERING BRAIN STIMULATION B.V.
- Matthias Merz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
- Publication number 20140191348
- Publication date Jul 10, 2014
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT ARRANGEMENT, DEVICE AND GAS DETECTION METHOD
- Publication number 20140170762
- Publication date Jun 19, 2014
- NXP B.V.
- Dimitri Soccol
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit and Manufacturing Method
- Publication number 20130193417
- Publication date Aug 1, 2013
- NXP B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Application
Temperature Sensor, Electronic Device and Temperature Measurement M...
- Publication number 20130070807
- Publication date Mar 21, 2013
- NXP B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Application
Sensor
- Publication number 20120286803
- Publication date Nov 15, 2012
- NXP B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20120260732
- Publication date Oct 18, 2012
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
LIQUID IMMERSION SENSOR
- Publication number 20120249168
- Publication date Oct 4, 2012
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit with Sensor and Method of Manufacturing Such an...
- Publication number 20120211845
- Publication date Aug 23, 2012
- NXP B.V.
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
IC MANUFACTURING METHOD, IC AND APPARATUS
- Publication number 20120112294
- Publication date May 10, 2012
- NXP B.V.
- Marcus Van Dal
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREFOR
- Publication number 20110296912
- Publication date Dec 8, 2011
- NXP B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Application
SENSOR CALIBRATION IN AN RFID TAG
- Publication number 20110301903
- Publication date Dec 8, 2011
- NXP B.V.
- Arelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
FOOD PACKAGE WITH INTEGRATED RFID-TAG AND SENSOR
- Publication number 20110291806
- Publication date Dec 1, 2011
- NXP B.V.
- Romano Hoofman
- G01 - MEASURING TESTING
Information Patent Application
CHARGE-PUMP CIRCUIT
- Publication number 20110241767
- Publication date Oct 6, 2011
- NXP B.V.
- Gilberto Curatola
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ELECTROCHEMICAL POTENTIOMETRIC SENSING WITHOUT REFERENCE ELECTRODE
- Publication number 20110208457
- Publication date Aug 25, 2011
- NXP B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Application
SENSING ENVIRONMENTAL PARAMETER THROUGH STRESS INDUCED IN IC
- Publication number 20110127627
- Publication date Jun 2, 2011
- NXP B.V.
- Romano Hoofman
- G01 - MEASURING TESTING
Information Patent Application
INTRUSION PROTECTION USING STRESS CHANGES
- Publication number 20110089506
- Publication date Apr 21, 2011
- NXP B.V.
- Romano Hoofman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR
- Publication number 20110079649
- Publication date Apr 7, 2011
- NXP B.V.
- Roel DAAMEN
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICAL SENSOR
- Publication number 20110036913
- Publication date Feb 17, 2011
- NXP B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREFOR
- Publication number 20110018097
- Publication date Jan 27, 2011
- NXP B.V.
- Youri Ponomarev
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD
- Publication number 20110012211
- Publication date Jan 20, 2011
- NXP B.V.
- Matthias Merz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor on Insulator Semiconductor Device and Method of Manuf...
- Publication number 20100264492
- Publication date Oct 21, 2010
- Radu Surdeanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HUMIDITY SENSOR BASED ON PROGRESSIVE CORROSION OF EXPOSED MATERIAL
- Publication number 20100192688
- Publication date Aug 5, 2010
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICAL ENERGY SOURCE AND ELECTRONIC DEVICE PROVIDED WITH S...
- Publication number 20100167130
- Publication date Jul 1, 2010
- Koninklijke Philips Electronics N.V.
- Remco Henricus Wilhelmus Pijnenburg
- H01 - BASIC ELECTRIC ELEMENTS

Youri Victorovitch Ponomarev

Person

Patents Grantslast 30 patents

Integrated circuit with sensor and method of manufacturing such an...

Food package with integrated RFID-tag and sensor

Integrated circuit and manufacturing method

Semiconductor device and method including an intertial mass element

Integrated circuit and manufacturing method therefor

Analyte detection methods and devices

Sensor

Integrated circuit with directional light sensor, device including...

Integrated circuit with sensor and method of manufacturing such an...

Integrated circuit and manufacturing method

Integrated circuit arrangement, device and gas detection method

Integrated circuit and manufacturing method

Apparatus and method for molecule detection using nanopores

Implantable multi-electrode device

Liquid immersion sensor

Sensor

Sensor

Biomimetic neurostimulation device

Stacked multi-cell battery concept

Integrated circuit and manufacturing method

Sensing environmental parameter through stress induced in IC

Electrochemical sensor

IC manufacturing method, IC and apparatus

Charge-pump circuit

Electrochemical potentiometric sensing without reference electrode

Implantable multi-electrode device

Integrated circuit including a porous material for retaining a liqu...

Humidity sensor based on progressive corrosion of exposed material

Intrusion protection using stress changes

Sensor module for a catheter

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD

INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...

INTEGRATED CIRCUIT AND MANUFACTURING METHOD

ANALYTE DETECTION METHODS AND DEVICES

Integrated Circuit with Directional Light Sensor, device including...

INTEGRATED CIRCUIT AND MANUFACTURING METHOD

Implantable Multi-Electrode Device

INTEGRATED CIRCUIT AND MANUFACTURING METHOD

INTEGRATED CIRCUIT ARRANGEMENT, DEVICE AND GAS DETECTION METHOD

Integrated Circuit and Manufacturing Method

Temperature Sensor, Electronic Device and Temperature Measurement M...

Sensor

SENSOR

LIQUID IMMERSION SENSOR

Integrated Circuit with Sensor and Method of Manufacturing Such an...

IC MANUFACTURING METHOD, IC AND APPARATUS

INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREFOR

SENSOR CALIBRATION IN AN RFID TAG

FOOD PACKAGE WITH INTEGRATED RFID-TAG AND SENSOR

CHARGE-PUMP CIRCUIT

ELECTROCHEMICAL POTENTIOMETRIC SENSING WITHOUT REFERENCE ELECTRODE

SENSING ENVIRONMENTAL PARAMETER THROUGH STRESS INDUCED IN IC

INTRUSION PROTECTION USING STRESS CHANGES

SENSOR

ELECTROCHEMICAL SENSOR

INTEGRATED CIRCUIT AND MANUFACTURING METHOD THEREFOR

SEMICONDUCTOR DEVICE AND METHOD

Semiconductor on Insulator Semiconductor Device and Method of Manuf...

HUMIDITY SENSOR BASED ON PROGRESSIVE CORROSION OF EXPOSED MATERIAL

ELECTROCHEMICAL ENERGY SOURCE AND ELECTRONIC DEVICE PROVIDED WITH S...