Yu-Chen Zhou

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
TMR device with novel free layer structure
- Patent number 9,577,184
- Issue date Feb 21, 2017
- Headway Technologies, Inc.
- Tong Zhao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
TMR device with novel free layer structure
- Patent number 9,437,812
- Issue date Sep 6, 2016
- Headway Technologies, Inc.
- Tong Zhao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
TMR device with novel free layer structure
- Patent number 9,040,178
- Issue date May 26, 2015
- Headway Technologies, Inc.
- Tong Zhao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MR device with synthetic free layer structure
- Patent number 9,013,016
- Issue date Apr 21, 2015
- Headway Technologies, Inc.
- Tong Zhao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MR device with synthetic free layer structure
- Patent number 8,653,615
- Issue date Feb 18, 2014
- Headway Technologies, Inc.
- Tong Zhao
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TMR Device with Novel Free Layer Structure
- Publication number 20150249210
- Publication date Sep 3, 2015
- HEADWAY TECHNOLOGIES, INC.
- Tong Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TMR Device with Novel Free Layer Structure
- Publication number 20150248902
- Publication date Sep 3, 2015
- HEADWAY TECHNOLOGIES, INC.
- Tong Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
MR Device with Synthetic Free Layer Structure
- Publication number 20140138783
- Publication date May 22, 2014
- HEADWAY TECHNOLOGIES, INC.
- Tong Zhao
- B82 - NANO-TECHNOLOGY
Information Patent Application
MR device with synthetic free layer structure
- Publication number 20100123208
- Publication date May 20, 2010
- HEADWAY TECHNOLOGIES, INC.
- Tong Zhao
- G01 - MEASURING TESTING
Information Patent Application
TMR device with novel free layer structure
- Publication number 20100073827
- Publication date Mar 25, 2010
- HEADWAY TECHNOLOGIES, INC.
- Tong Zhao
- G01 - MEASURING TESTING