Yuichi Hamamura

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for work quality control
- Patent number 10,614,391
- Issue date Apr 7, 2020
- Hitachi, Ltd.
- Kei Imazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect image processing apparatus, defect image processing method,...
- Patent number 8,995,748
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Reviewed defect selection processing method, defect review method,...
- Patent number 8,675,949
- Issue date Mar 18, 2014
- Hitachi High-Technologies Corporation
- Yuji Takagi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating systematic defect, and apparatus therefor
- Patent number 8,621,400
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defective-ratio predicting method, defective-ratio predicting progr...
- Patent number 8,612,811
- Issue date Dec 17, 2013
- Renesas Electronics Corporation
- Chizu Matsumoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device yield prediction system and method
- Patent number 7,945,410
- Issue date May 17, 2011
- Hitachi, Ltd.
- Natsuyo Morioka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for analyzing circuit pattern defects and a system thereof
- Patent number 7,352,890
- Issue date Apr 1, 2008
- Hitachi, Ltd.
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for analyzing circuit pattern defects
- Patent number 7,062,081
- Issue date Jun 13, 2006
- Hitachi, Ltd.
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 6,960,765
- Issue date Nov 1, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for test conditions
- Patent number 6,895,346
- Issue date May 17, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Photomask for test wafers
- Patent number 6,841,405
- Issue date Jan 11, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
System for testing electronic devices
- Patent number 6,780,660
- Issue date Aug 24, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices indicating short-circuit
- Patent number 6,771,077
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices
- Patent number 6,770,496
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for observing or processing and analyzing usin...
- Patent number 6,476,387
- Issue date Nov 5, 2002
- Hitachi, Ltd.
- Norimasa Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern forming method using charged particle beam process and char...
- Patent number 6,344,115
- Issue date Feb 5, 2002
- Hitachi, Ltd.
- Junzou Azuma
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and its apparatus for detecting a secondary electron beam im...
- Patent number 6,303,932
- Issue date Oct 16, 2001
- Hitachi, Ltd.
- Yuichi Hamamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern forming method using charged particle beam process and char...
- Patent number 5,976,328
- Issue date Nov 2, 1999
- Hitachi, Ltd.
- Junzou Azuma
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for judging milling end point for use in charged...
- Patent number 5,952,658
- Issue date Sep 14, 1999
- Hitachi, Ltd.
- Akira Shimase
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR WORK QUALITY CONTROL
- Publication number 20160253618
- Publication date Sep 1, 2016
- Hitachi, Ltd
- Kei IMAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECIPE GENERATION APPARATUS, INSPECTION SUPPORT APPARATUS, INSPECTI...
- Publication number 20140177940
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN REVIEW TOOL, RECIPE MAKING TOOL, AND METHOD OF MAKING RECIPE
- Publication number 20130283227
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EVALUATING SYSTEMATIC DEFECT, AND APPARATUS THEREFOR
- Publication number 20130191807
- Publication date Jul 25, 2013
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...
- Publication number 20120141011
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVIEWED DEFECT SELECTION PROCESSING METHOD, DEFECT REVIEW METHOD,...
- Publication number 20120093392
- Publication date Apr 19, 2012
- Yuji Takagi
- G01 - MEASURING TESTING
Information Patent Application
DEFECTIVE-RATIO PREDICTING METHOD, DEFECTIVE-RATIO PREDICTING PROGR...
- Publication number 20110172806
- Publication date Jul 14, 2011
- RENESAS ELECTRONICS CORPORATION
- Chizu Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Liquid Crystal Display Device with Evaluation Patterns Disposed The...
- Publication number 20080241486
- Publication date Oct 2, 2008
- Seiji Ishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE YIELD PREDICTION SYSTEM AND METHOD
- Publication number 20080140330
- Publication date Jun 12, 2008
- Natsuyo Morioka
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for analyzing circuit pattern defects and a system thereof
- Publication number 20060140472
- Publication date Jun 29, 2006
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20050269511
- Publication date Dec 8, 2005
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method of testing electronic devices
- Publication number 20030197523
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method for test conditions
- Publication number 20030199110
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing electronic devices
- Publication number 20030199107
- Publication date Oct 23, 2003
- Hitachi, Ltd
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
System for testing electronic devices
- Publication number 20030199111
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Photomask for test wafers
- Publication number 20030197522
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20030184332
- Publication date Oct 2, 2003
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing circuit pattern defects and a system thereof
- Publication number 20010016061
- Publication date Aug 23, 2001
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING

Yuichi Hamamura

Person

Patents Grantslast 30 patents

Method and apparatus for work quality control

Defect image processing apparatus, defect image processing method,...

Reviewed defect selection processing method, defect review method,...

Method of evaluating systematic defect, and apparatus therefor

Defective-ratio predicting method, defective-ratio predicting progr...

Semiconductor device yield prediction system and method

Method for analyzing circuit pattern defects and a system thereof

Method and system for analyzing circuit pattern defects

Probe driving method, and probe apparatus

Method for test conditions

Photomask for test wafers

System for testing electronic devices

Method of testing electronic devices indicating short-circuit

Method of testing electronic devices

Method and apparatus for observing or processing and analyzing usin...

Pattern forming method using charged particle beam process and char...

Method and its apparatus for detecting a secondary electron beam im...

Pattern forming method using charged particle beam process and char...

Method and system for judging milling end point for use in charged...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR WORK QUALITY CONTROL

RECIPE GENERATION APPARATUS, INSPECTION SUPPORT APPARATUS, INSPECTI...

PATTERN REVIEW TOOL, RECIPE MAKING TOOL, AND METHOD OF MAKING RECIPE

METHOD OF EVALUATING SYSTEMATIC DEFECT, AND APPARATUS THEREFOR

DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...

REVIEWED DEFECT SELECTION PROCESSING METHOD, DEFECT REVIEW METHOD,...

DEFECTIVE-RATIO PREDICTING METHOD, DEFECTIVE-RATIO PREDICTING PROGR...

Liquid Crystal Display Device with Evaluation Patterns Disposed The...

SEMICONDUCTOR DEVICE YIELD PREDICTION SYSTEM AND METHOD

Method for analyzing circuit pattern defects and a system thereof

Probe driving method, and probe apparatus

Method of testing electronic devices

Method for test conditions

Method of manufacturing electronic devices

System for testing electronic devices

Photomask for test wafers

Probe driving method, and probe apparatus

Method for analyzing circuit pattern defects and a system thereof