Yuichiro Hashimoto

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Liquid feeding apparatus and liquid feeding method
- Patent number 12,153,026
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Mass analysis system, and method for determining performance of mas...
- Patent number 12,106,951
- Issue date Oct 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka Sumigama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of controlling the same
- Patent number 12,033,842
- Issue date Jul 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen analyzer
- Patent number 12,025,626
- Issue date Jul 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Riku Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Ion detector
- Patent number 11,955,327
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatograph mass spectrometer
- Patent number 11,860,142
- Issue date Jan 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Masuyuki Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Ion source
- Patent number 11,749,517
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatograph mass spectrometer
- Patent number 11,635,413
- Issue date Apr 25, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuka Sumigama
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry apparatus and mass spectrometry method
- Patent number 11,251,030
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuichiro Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Sample fragmentation device using heating and pressure regulation b...
- Patent number 11,101,121
- Issue date Aug 24, 2021
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis device
- Patent number 10,551,346
- Issue date Feb 4, 2020
- Hitachi High-Technologies Corporation
- Kazushige Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Ion guide and mass spectrometer using same
- Patent number 10,424,472
- Issue date Sep 24, 2019
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility separation device
- Patent number 10,338,028
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Yuichiro Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Ion guide and mass spectrometer using same
- Patent number 10,204,773
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,139,369
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- G01 - MEASURING TESTING
Information Patent Grant
Analysis system
- Patent number 10,036,737
- Issue date Jul 31, 2018
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device
- Patent number 9,892,901
- Issue date Feb 13, 2018
- Hitachi High-Technologies Corporation
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid ion source, mass spectrometer, and ion mobility device
- Patent number 9,852,897
- Issue date Dec 26, 2017
- Hitachi High-Technologies Corporation
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid ion source and mass spectrometric device
- Patent number 9,704,699
- Issue date Jul 11, 2017
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Attached matter testing device and testing method
- Patent number 9,696,288
- Issue date Jul 4, 2017
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass analyzing method for efficiently ionizin...
- Patent number 9,543,135
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzer for substance
- Patent number 9,417,163
- Issue date Aug 16, 2016
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 9,390,900
- Issue date Jul 12, 2016
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ionization method, ionization apparatus, and mass analysis system
- Patent number 9,377,445
- Issue date Jun 28, 2016
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- G01 - MEASURING TESTING
Information Patent Grant
Ion mobility separation device
- Patent number 9,302,271
- Issue date Apr 5, 2016
- Hitachi, Ltd.
- Yuichiro Hashimoto
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Mass spectrometric system
- Patent number 9,287,105
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Attached matter inspection device
- Patent number 9,261,437
- Issue date Feb 16, 2016
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,214,324
- Issue date Dec 15, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass analyzing method
- Patent number 9,184,037
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,177,775
- Issue date Nov 3, 2015
- Hitachi High-Technologies Corporation
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ANALYTICAL SYSTEM AND METHOD
- Publication number 20240385155
- Publication date Nov 21, 2024
- Roche Diagnostics Operations, Inc.
- Robert Lang
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240361346
- Publication date Oct 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD
- Publication number 20240360826
- Publication date Oct 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke KANAI
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER
- Publication number 20240339312
- Publication date Oct 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Tsugunao TOMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY SYSTEM, PROCESSING DEVICE, AND ANOMALY DETECTION...
- Publication number 20240310338
- Publication date Sep 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Masuyuki Sugiyama
- G01 - MEASURING TESTING
Information Patent Application
Liquid Chromatograph and Liquid Delivery Method
- Publication number 20240210364
- Publication date Jun 27, 2024
- Hitachi High-Tech Corporation
- Daisuke AKIEDA
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CHROMATOGRAPH AND METHOD FOR CONTROLLING SAME
- Publication number 20240201144
- Publication date Jun 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER INCLUDING HPLC AND CONTROL METHOD FOR THE SAME
- Publication number 20240192180
- Publication date Jun 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Midori Tobita
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME
- Publication number 20240177983
- Publication date May 30, 2024
- HITACHI HIGH-TECH COORPORATION
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW PATH WASHING METHOD OF AUTO SAMPLER AND FLOW PATH WASHING APPA...
- Publication number 20240094236
- Publication date Mar 21, 2024
- Hitachi High-Tech Corporation
- Yushi HARADA
- B08 - CLEANING
Information Patent Application
MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME
- Publication number 20240063010
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZER COLUMN CARTRIDGE
- Publication number 20240060942
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yusuke Shimizu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method for Controlling Mass Spectrometer
- Publication number 20240006174
- Publication date Jan 4, 2024
- Hitachi High-Tech Corporation
- Riku TAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOSAMPLER OF LIQUID CHROMATOGRAPH AND LIQUID CHROMATOGRAPH INCLUD...
- Publication number 20230408459
- Publication date Dec 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke Kanai
- G01 - MEASURING TESTING
Information Patent Application
Liquid Feeding Pump and Liquid Feeding Method
- Publication number 20230384271
- Publication date Nov 30, 2023
- Hitachi High-Tech Corporation
- Nobuhiro TSUKADA
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Liquid Feeding Pump and Liquid Feeding Method
- Publication number 20230332586
- Publication date Oct 19, 2023
- Hitachi High-Tech Corporation
- Nobuhiro TSUKADA
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD FOR AUTOMATIC ANALYZER
- Publication number 20230184802
- Publication date Jun 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY DEVICE CONTROL METHOD, MASS SPECTROMETRY SYSTEM,...
- Publication number 20230170198
- Publication date Jun 1, 2023
- HITACHI HIGH-TECH CORPORATION
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, MASS SPECTROMETER, ION SOURCE CONTROL METHOD
- Publication number 20230141083
- Publication date May 11, 2023
- Hitachi High-Tech Corporation
- Hideki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20230136178
- Publication date May 4, 2023
- Hitachi High-Tech Corporation
- Yuka SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID CHROMATOGRAPHIC APPARATUS AND AIR BUBBLE REMOVAL METHOD OF...
- Publication number 20230123459
- Publication date Apr 20, 2023
- Hitachi High-Tech Corporation
- Midori TOBITA
- G01 - MEASURING TESTING
Information Patent Application
LIQUID FEEDING APPARATUS AND LIQUID FEEDING METHOD
- Publication number 20230091683
- Publication date Mar 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20230056978
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma NISHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL SYSTEM AND METHOD INCLUDING SWITCHING BETWEEN LIQUID CHR...
- Publication number 20230037141
- Publication date Feb 2, 2023
- Roche Diagnostics Operations, Inc.
- Stefan Quint
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCE AND MASS SPECTROMETER
- Publication number 20230005730
- Publication date Jan 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDOSCOPE CONTAMINATION DETECTION DEVICE, CONTROL DEVICE, AND ENDOS...
- Publication number 20220404278
- Publication date Dec 22, 2022
- OLYMPUS CORPORATION
- Yuichiro HASHIMOTO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CONTROL APPARATUS, ENDOSCOPE POSITIONING STATE DETERMINATION METHOD...
- Publication number 20220392102
- Publication date Dec 8, 2022
- OLYMPUS CORPORATION
- Jin OHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECIMEN ANALYZER
- Publication number 20220283193
- Publication date Sep 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Riku Tamura
- G01 - MEASURING TESTING
Information Patent Application
PRETREATMENT METHOD OF AN AUTOMATIC ANALYZER
- Publication number 20220276270
- Publication date Sep 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND METHOD OF CONTROLLING THE SAME
- Publication number 20220270868
- Publication date Aug 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Yasuda
- G01 - MEASURING TESTING

Yuichiro Hashimoto

Person

Patents Grantslast 30 patents

Liquid feeding apparatus and liquid feeding method

Mass analysis system, and method for determining performance of mas...

Mass spectrometer and method of controlling the same

Specimen analyzer

Ion detector

Liquid chromatograph mass spectrometer

Ion source

Liquid chromatograph mass spectrometer

Mass spectrometry apparatus and mass spectrometry method

Sample fragmentation device using heating and pressure regulation b...

Ion analysis device

Ion guide and mass spectrometer using same

Ion mobility separation device

Ion guide and mass spectrometer using same

Mass spectrometer

Analysis system

Mass spectrometry device

Hybrid ion source, mass spectrometer, and ion mobility device

Hybrid ion source and mass spectrometric device

Attached matter testing device and testing method

Mass spectrometer and mass analyzing method for efficiently ionizin...

Analyzer for substance

Mass spectrometer

Ionization method, ionization apparatus, and mass analysis system

Ion mobility separation device

Mass spectrometric system

Attached matter inspection device

Analysis device and analysis method

Mass spectrometer and mass analyzing method

Mass spectrometer

Patents Applicationslast 30 patents

ANALYTICAL SYSTEM AND METHOD

AUTOMATIC ANALYZER

INSPECTION METHOD

METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

MASS SPECTROMETRY SYSTEM, PROCESSING DEVICE, AND ANOMALY DETECTION...

Liquid Chromatograph and Liquid Delivery Method

LIQUID CHROMATOGRAPH AND METHOD FOR CONTROLLING SAME

AUTOMATIC ANALYZER INCLUDING HPLC AND CONTROL METHOD FOR THE SAME

MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

FLOW PATH WASHING METHOD OF AUTO SAMPLER AND FLOW PATH WASHING APPA...

MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME

ANALYZER COLUMN CARTRIDGE

Method for Controlling Mass Spectrometer

AUTOSAMPLER OF LIQUID CHROMATOGRAPH AND LIQUID CHROMATOGRAPH INCLUD...

Liquid Feeding Pump and Liquid Feeding Method

Liquid Feeding Pump and Liquid Feeding Method

CONTROL METHOD FOR AUTOMATIC ANALYZER

MASS SPECTROMETRY DEVICE CONTROL METHOD, MASS SPECTROMETRY SYSTEM,...

ION SOURCE, MASS SPECTROMETER, ION SOURCE CONTROL METHOD

Mass Spectrometer

LIQUID CHROMATOGRAPHIC APPARATUS AND AIR BUBBLE REMOVAL METHOD OF...

LIQUID FEEDING APPARATUS AND LIQUID FEEDING METHOD

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

ANALYTICAL SYSTEM AND METHOD INCLUDING SWITCHING BETWEEN LIQUID CHR...

ION SOURCE AND MASS SPECTROMETER

ENDOSCOPE CONTAMINATION DETECTION DEVICE, CONTROL DEVICE, AND ENDOS...

CONTROL APPARATUS, ENDOSCOPE POSITIONING STATE DETERMINATION METHOD...

SPECIMEN ANALYZER

PRETREATMENT METHOD OF AN AUTOMATIC ANALYZER

MASS SPECTROMETER AND METHOD OF CONTROLLING THE SAME