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Yuji Gotoh
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Oita-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Hardened layer depth measuring apparatus
Patent number
10,458,775
Issue date
Oct 29, 2019
Neturen Co., Ltd.
Yoshitaka Misaka
G01 - MEASURING TESTING
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Patent Grant
Quenching depth measurement method and quenching depth measurement...
Patent number
9,304,108
Issue date
Apr 5, 2016
Neturen Co., Ltd.
Yuji Gotoh
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
HARDENED LAYER DEPTH MEASURING APPARATUS
Publication number
20180051975
Publication date
Feb 22, 2018
Neturen Co., Ltd.
Yoshitaka MISAKA
G01 - MEASURING TESTING
Information
Patent Application
QUENCHING DEPTH MEASUREMENT METHOD AND QUENCHING DEPTH MEASUREMENT...
Publication number
20130300405
Publication date
Nov 14, 2013
Neturen Co., Ltd.
Yuji Gotoh
G01 - MEASURING TESTING