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Yuji Kasai
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam apparatus
Patent number
10,217,604
Issue date
Feb 26, 2019
Hitachi High-Technologies Corporation
Makoto Sakakibara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for removing foreign substances in charged particle beam dev...
Patent number
9,368,319
Issue date
Jun 14, 2016
Hitachi High-Technologies Corporation
Kazuma Tanii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle ray apparatus and pattern measurement method
Patent number
8,890,068
Issue date
Nov 18, 2014
Hitachi High-Technologies Corporation
Yuji Kasai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
8,686,380
Issue date
Apr 1, 2014
Hitachi High-Technologies Corporation
Souichi Katagiri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
7,514,683
Issue date
Apr 7, 2009
Hitachi High-Technologies Corporation
Kazuma Tanii
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
Patent number
7,397,031
Issue date
Jul 8, 2008
Hitachi, Ltd.
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
Patent number
7,098,455
Issue date
Aug 29, 2006
Hitachi, Ltd.
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
Patent number
6,583,413
Issue date
Jun 24, 2003
Hitachi, Ltd.
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Grant
Coin-operated locker
Patent number
4,957,196
Issue date
Sep 18, 1990
Kokusan Kinzoku Kogyo Kabushiki Kaisha
Kenji Shiojima
G07 - CHECKING-DEVICES
Patents Applications
last 30 patents
Information
Patent Application
Charged Particle Beam Device
Publication number
20220230845
Publication date
Jul 21, 2022
HITACHI HIGH-TECH CORPORATION
Kohei SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20180286629
Publication date
Oct 4, 2018
Hitachi High-Technologies Corporation
Makoto SAKAKIBARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Removing Foreign Substances in Charged Particle Beam Dev...
Publication number
20150279609
Publication date
Oct 1, 2015
Hitachi High-Technologies Corporation
Kazuma Tanii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Ray Apparatus and Pattern Measurement Method
Publication number
20140001360
Publication date
Jan 2, 2014
Hitachi High-Technologies Corporation
Yuji Kasai
G01 - MEASURING TESTING
Information
Patent Application
Charged particle beam apparatus
Publication number
20090294697
Publication date
Dec 3, 2009
Hitachi High-Technologies Corporation
Souichi Katagiri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Parameter Adjustment Device and Parameter Adjustment Method
Publication number
20080310492
Publication date
Dec 18, 2008
EVOLVABLE SYSTEMS RESEARCH INSTITUTE INC.
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Scanning electron microscope
Publication number
20070235646
Publication date
Oct 11, 2007
Kazuma Tanii
G01 - MEASURING TESTING
Information
Patent Application
Method of inspecting a circuit pattern and inspecting instrument
Publication number
20060243908
Publication date
Nov 2, 2006
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Application
Method of inspecting a circuit pattern and inspecting instrument
Publication number
20030201391
Publication date
Oct 30, 2003
Hiroyuki Shinada
G01 - MEASURING TESTING