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Yuji Kasai
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Tsukuba, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam apparatus
Patent number
10,217,604
Issue date
Feb 26, 2019
Hitachi High-Technologies Corporation
Makoto Sakakibara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for removing foreign substances in charged particle beam dev...
Patent number
9,368,319
Issue date
Jun 14, 2016
Hitachi High-Technologies Corporation
Kazuma Tanii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrum spread communication system
Patent number
8,982,926
Issue date
Mar 17, 2015
National Institute of Advanced Industrial Science and Technology
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Charged particle ray apparatus and pattern measurement method
Patent number
8,890,068
Issue date
Nov 18, 2014
Hitachi High-Technologies Corporation
Yuji Kasai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
8,686,380
Issue date
Apr 1, 2014
Hitachi High-Technologies Corporation
Souichi Katagiri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Serial bus transmission system
Patent number
8,493,991
Issue date
Jul 23, 2013
National Institute of Advanced Industrial Science and Technology
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Digital data transmitting apparatus
Patent number
7,583,749
Issue date
Sep 1, 2009
National Institute of Advanced Industrial Science and Technology
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Power consumption controlling apparatus for high frequency amplifier
Patent number
7,529,528
Issue date
May 5, 2009
Sharp Kabushiki Kaisha
Munehiro Uratani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Scanning electron microscope
Patent number
7,514,683
Issue date
Apr 7, 2009
Hitachi High-Technologies Corporation
Kazuma Tanii
G01 - MEASURING TESTING
Information
Patent Grant
Signal timing adjustment device, signal timing adjustment system, s...
Patent number
7,447,289
Issue date
Nov 4, 2008
Sharp Kabushiki Kaisha
Munehiro Uratani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
Patent number
7,397,031
Issue date
Jul 8, 2008
Hitachi, Ltd.
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Grant
High-speed signal transmission system
Patent number
7,295,032
Issue date
Nov 13, 2007
National Institute of Advanced Industrial Science and Technology
Kanji Otsuka
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Digital circuit having delay circuit for adjustment of clock signal...
Patent number
7,274,238
Issue date
Sep 25, 2007
National Institute of Advanced Industrial Science and Technology
Eiichi Takahashi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Bus driver with well voltage control section
Patent number
7,248,095
Issue date
Jul 24, 2007
Sharp Kabushiki Kaisha
Munehiro Uratani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
Patent number
7,098,455
Issue date
Aug 29, 2006
Hitachi, Ltd.
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Grant
Optical apparatus, optical apparatus adjustment method, and storage...
Patent number
6,879,388
Issue date
Apr 12, 2005
Agency of Industrial Science & Technology, Ministry of International Trade &...
Yuji Kasai
G02 - OPTICS
Information
Patent Grant
Capacitance position sensor and position controller equipped with t...
Patent number
6,861,848
Issue date
Mar 1, 2005
National Institute of Advanced Industrial Science and Technology
Yuji Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Maximum power point tracking method and device
Patent number
6,844,739
Issue date
Jan 18, 2005
National Institute of Advanced Industrial Science and Technology
Yuji Kasai
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Optical apparatus, optical apparatus adjustment method, and storage...
Patent number
6,781,682
Issue date
Aug 24, 2004
Agency of Industrial Science & Technology, Ministry of International Trade &...
Yuji Kasai
G02 - OPTICS
Information
Patent Grant
Electronic holding circuit and adjusting method thereof using a pro...
Patent number
6,637,008
Issue date
Oct 21, 2003
Agency of Industrial Science & Technology
Tetsuya Higuchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
Patent number
6,583,413
Issue date
Jun 24, 2003
Hitachi, Ltd.
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Grant
Intrinsic Josephson superconducting tunnel junction device
Patent number
6,441,394
Issue date
Aug 27, 2002
National Institute of Advanced Industrial Science and Technology
Yuji Kasai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of measuring atomic beam flux rate in film growth apparatus
Patent number
5,886,778
Issue date
Mar 23, 1999
Agency of Industrial Science & Technology, Ministry of International Trade &...
Yuji Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Coin-operated locker
Patent number
4,957,196
Issue date
Sep 18, 1990
Kokusan Kinzoku Kogyo Kabushiki Kaisha
Kenji Shiojima
G07 - CHECKING-DEVICES
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM AND METHOD
Publication number
20240230392
Publication date
Jul 11, 2024
Japan Infrastructure Measurement Inc.
Tetsuya HIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Charged Particle Beam Device
Publication number
20220230845
Publication date
Jul 21, 2022
HITACHI HIGH-TECH CORPORATION
Kohei SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20180286629
Publication date
Oct 4, 2018
Hitachi High-Technologies Corporation
Makoto SAKAKIBARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Removing Foreign Substances in Charged Particle Beam Dev...
Publication number
20150279609
Publication date
Oct 1, 2015
Hitachi High-Technologies Corporation
Kazuma Tanii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MONITORING SYSTEM AND SLAVE DEVICE FOR PHOTOVOLTAIC POWER GENERATIO...
Publication number
20150222227
Publication date
Aug 6, 2015
Hitachi Industry & Control Solutions, Ltd.
Sadao Nishizawa
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
MULTIPLE ACCESS COMMUNICATION SYSTEM AND PHOTOVOLTAIC POWER GENERAT...
Publication number
20140341235
Publication date
Nov 20, 2014
Teruhiko Tagashira
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Charged Particle Ray Apparatus and Pattern Measurement Method
Publication number
20140001360
Publication date
Jan 2, 2014
Hitachi High-Technologies Corporation
Yuji Kasai
G01 - MEASURING TESTING
Information
Patent Application
SPECTRUM SPREAD COMMUNICATION SYSTEM
Publication number
20130089120
Publication date
Apr 11, 2013
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SERIAL BUS TRANSMISSION SYSTEM
Publication number
20110142066
Publication date
Jun 16, 2011
Nat'I Inst of Advanced Industrial Sci and Tech
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Charged particle beam apparatus
Publication number
20090294697
Publication date
Dec 3, 2009
Hitachi High-Technologies Corporation
Souichi Katagiri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Parameter Adjustment Device and Parameter Adjustment Method
Publication number
20080310492
Publication date
Dec 18, 2008
EVOLVABLE SYSTEMS RESEARCH INSTITUTE INC.
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Scanning electron microscope
Publication number
20070235646
Publication date
Oct 11, 2007
Kazuma Tanii
G01 - MEASURING TESTING
Information
Patent Application
Digital data transmitting apparatus
Publication number
20060274850
Publication date
Dec 7, 2006
Yuji Kasai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method of inspecting a circuit pattern and inspecting instrument
Publication number
20060243908
Publication date
Nov 2, 2006
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Application
Digital system, clock signal adjusting method for digital system, r...
Publication number
20060236146
Publication date
Oct 19, 2006
National Inst of Adv Industrial Science and Tech
Eiichi Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Digital circuit having a delay circuit for adjustment of clock sign...
Publication number
20060109146
Publication date
May 25, 2006
Eiichi Takahashi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Bus driver and semiconductor integrated circuit
Publication number
20060055449
Publication date
Mar 16, 2006
Sharp Kabushiki Kaisha
Munehiro Uratani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Power consumption controlling apparatus for high frequency amplifier
Publication number
20060046668
Publication date
Mar 2, 2006
Sharp Kabushiki Kaisha
Munehiro Uratani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
High-speed signal transmission system
Publication number
20050179465
Publication date
Aug 18, 2005
Kanji Otsuka
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Optical apparatus, optical apparatus adjustment method, and storage...
Publication number
20040232237
Publication date
Nov 25, 2004
Evolvable System Research Institute, Inc.
Yuji Kasai
G02 - OPTICS
Information
Patent Application
Signal timing adjustment device, signal timing adjustment system, s...
Publication number
20040190665
Publication date
Sep 30, 2004
Munehiro Uratani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method of inspecting a circuit pattern and inspecting instrument
Publication number
20030201391
Publication date
Oct 30, 2003
Hiroyuki Shinada
G01 - MEASURING TESTING
Information
Patent Application
Capacitance position sensor and position controller equipped with t...
Publication number
20030080756
Publication date
May 1, 2003
National Inst. of Advanced Ind. Science and Tech.
Yuji Kasai
G01 - MEASURING TESTING
Information
Patent Application
Maximum power point tracking method and device
Publication number
20020163323
Publication date
Nov 7, 2002
National Inst. of Advanced Ind. Science and Tech.
Yuji Kasai
G05 - CONTROLLING REGULATING
Information
Patent Application
Intrinsic Josephson superconducting tunnel junction device
Publication number
20010050362
Publication date
Dec 13, 2001
Yuji Kasai
H01 - BASIC ELECTRIC ELEMENTS