Yuji Maruyama

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Artificial defect material and manufacturing method of FRP structure
- Patent number 10,518,487
- Issue date Dec 31, 2019
- Mitsubishi Heavy Industries, Ltd.
- Seiji Kobayashi
- B32 - LAYERED PRODUCTS
Information Patent Grant
Wiring pattern inspection apparatus for printed circuit board
- Patent number 5,787,191
- Issue date Jul 28, 1998
- Matsushita Electric Industrial Co., Ltd.
- Hideaki Kawamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for inspecting a wiring pattern according to a micro-insp...
- Patent number 5,608,816
- Issue date Mar 4, 1997
- Matsushita Electric Industrial Co., Ltd.
- Toyoki Kawahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wiring pattern inspection apparatus for printed circuit board
- Patent number 5,459,795
- Issue date Oct 17, 1995
- Matsushita Electric Industrial Co., Ltd.
- Hideaki Kawamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for inspecting wiring pattern formed on a board
- Patent number 5,272,763
- Issue date Dec 21, 1993
- Matsushita Electric Industrial Co., Ltd.
- Yuji Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection system for inspecting defect of land pattern for...
- Patent number 5,214,712
- Issue date May 25, 1993
- Matsushita Electric Industrial Co., Ltd.
- Atsuharu Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for optically inspecting conditions of parts packaged on sub...
- Patent number 5,200,799
- Issue date Apr 6, 1993
- Matsushita Electric Industrial Co., Ltd.
- Yuji Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting solder portion of a circuit board
- Patent number 5,103,105
- Issue date Apr 7, 1992
- Matsushita Electric Industrial Co., Ltd.
- Kazutoshi Ikegaya
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical inspection apparatus for printed-circuit boards wit...
- Patent number 5,027,418
- Issue date Jun 25, 1991
- Matsushita Electric Industrial Co., Ltd.
- Kazutoshi Ikegaya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Linescan apparatus for detecting salient pattern of a product
- Patent number 4,983,827
- Issue date Jan 8, 1991
- Matsushita Electric Industrial Co., Ltd.
- Kazutoshi Ikegaya
- G01 - MEASURING TESTING
Information Patent Grant
Bi-level image display signal processing apparatus
- Patent number 4,924,322
- Issue date May 8, 1990
- Matsushita Electric Industrial Co., Ltd.
- Toshiharu Kurosawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Bi-level image display signal processing apparatus
- Patent number 4,891,710
- Issue date Jan 2, 1990
- Matsushita Electric Industrial Co., Ltd.
- Katsuo Nakazato
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for processing image signal
- Patent number 4,890,167
- Issue date Dec 26, 1989
- Matsushita Electric Industrial Co., Ltd.
- Katsuo Nakazato
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
ARTIFICIAL DEFECT MATERIAL AND MANUFACTURING METHOD OF FRP STRUCTURE
- Publication number 20170274604
- Publication date Sep 28, 2017
- Mitsubishi Heavy Industries, Ltd.
- Seiji KOBAYASHI
- G01 - MEASURING TESTING

Yuji Maruyama

Person

Patents Grantslast 30 patents

Artificial defect material and manufacturing method of FRP structure

Wiring pattern inspection apparatus for printed circuit board

Apparatus for inspecting a wiring pattern according to a micro-insp...

Wiring pattern inspection apparatus for printed circuit board

Apparatus for inspecting wiring pattern formed on a board

Pattern inspection system for inspecting defect of land pattern for...

System for optically inspecting conditions of parts packaged on sub...

Apparatus for inspecting solder portion of a circuit board

Electro-optical inspection apparatus for printed-circuit boards wit...

Linescan apparatus for detecting salient pattern of a product

Bi-level image display signal processing apparatus

Bi-level image display signal processing apparatus

Apparatus for processing image signal

Patents Applicationslast 30 patents

ARTIFICIAL DEFECT MATERIAL AND MANUFACTURING METHOD OF FRP STRUCTURE