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Yuka MIYAKE
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Tokyo, JP
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last 30 patents
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Patent Application
METHOD FOR WASHING DISPENSING PROBE INCLUDED IN AUTOMATED ANALYZER,...
Publication number
20240230700
Publication date
Jul 11, 2024
HITACHI HIGH-TECH CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20240012019
Publication date
Jan 11, 2024
HITACHI HIGH-TECH CORPORATION
Yuka MIYAKE
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analysis Device
Publication number
20230009785
Publication date
Jan 12, 2023
Hitachi High-Tech Corporation
Yosuke HORIE
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE
Publication number
20220397582
Publication date
Dec 15, 2022
HITACHI HIGH-TECH CORPORATION
Mariko MIYAZAKI
G01 - MEASURING TESTING