Yukio Yoshizawa

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen preparation device, and control method in specimen prepara...
- Patent number 8,710,464
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and method for correcting position wit...
- Patent number 8,629,394
- Issue date Jan 14, 2014
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system
- Patent number 7,772,554
- Issue date Aug 10, 2010
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARA...
- Publication number 20110309245
- Publication date Dec 22, 2011
- Yuichi Madokoro
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING POSITION WIT...
- Publication number 20110297826
- Publication date Dec 8, 2011
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle System
- Publication number 20080245965
- Publication date Oct 9, 2008
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20080203299
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Toshiaki Kozuma
- G01 - MEASURING TESTING