YUN-ZONG TIAN

Person

TAICHUNG COUNTY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Fault detection method of semiconductor manufacturing processes and...
- Patent number 8,756,028
- Issue date Jun 17, 2014
- Inotera Memories, Inc.
- Yij Chieh Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting variance in semiconductor processes
- Patent number 8,649,990
- Issue date Feb 11, 2014
- Inotera Memories, Inc.
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system of compressing raw fabrication data for fault det...
- Patent number 8,510,610
- Issue date Aug 13, 2013
- Inotera Memories, Inc.
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Specification establishing method for controlling semiconductor pro...
- Patent number 8,332,416
- Issue date Dec 11, 2012
- Inotera Memories, Inc.
- Cheng-Hao Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for assessing data worth for analyzing yield rate
- Patent number 8,265,903
- Issue date Sep 11, 2012
- Inotera Memories, Inc.
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of adjusting wafer processing sequence
- Patent number 8,244,500
- Issue date Aug 14, 2012
- Inotera Memories, Inc.
- Yun-Zong Tian
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for evaluating efficacy of prevention maintenance for a tool
- Patent number 8,195,431
- Issue date Jun 5, 2012
- Inotera Memories, Inc.
- Yi Feng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for planning a semiconductor manufacturing process based on...
- Patent number 8,170,964
- Issue date May 1, 2012
- Inotera Memories, Inc.
- Wei Jun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for predicting cycle time
- Patent number 8,090,668
- Issue date Jan 3, 2012
- Inotera Memories, Inc.
- Yi Feng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for finding the correlation between the tool PM and the prod...
- Patent number 8,032,248
- Issue date Oct 4, 2011
- Inotera Memories, Inc.
- Yi Feng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fuzzy control method for adjusting a semiconductor machine
- Patent number 8,010,212
- Issue date Aug 30, 2011
- Inotera Memories, Inc.
- Yi Feng Lee
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for monitoring fabrication parameter
- Patent number 7,855,086
- Issue date Dec 21, 2010
- Inotera Memories, Inc.
- Yi Feng Lee
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM OF COMPRESSING RAW FABRICATION DATA FOR FAULT DET...
- Publication number 20120331357
- Publication date Dec 27, 2012
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION METHOD OF SEMICONDUCTOR MANUFACTURING PROCESSES AND...
- Publication number 20120330591
- Publication date Dec 27, 2012
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECIFICATION ESTABLISHING METHOD FOR CONTROLLING SEMICONDUCTOR PRO...
- Publication number 20120102052
- Publication date Apr 26, 2012
- INOTERA MEMORIES, INC.
- CHENG-HAO CHEN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES
- Publication number 20110257932
- Publication date Oct 20, 2011
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR PLANNING PRODUCTION SCHEDULE OF EQUIPMENT AND ASSOCIATED...
- Publication number 20110251708
- Publication date Oct 13, 2011
- Wei-Jun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...
- Publication number 20110153660
- Publication date Jun 23, 2011
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
YIELD LOSS PREDICTION METHOD AND ASSOCIATED COMPUTER READABLE MEDIUM
- Publication number 20110137595
- Publication date Jun 9, 2011
- Yij-Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR PREDICTING AND WARNING OF WAFER ACCEPTANCE TEST VALUE
- Publication number 20110112999
- Publication date May 12, 2011
- INOTERA MEMORIES, INC.
- YI-FENG LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST...
- Publication number 20110093226
- Publication date Apr 21, 2011
- INOTERA MEMORIES, INC.
- YIJ CHIEH-CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR EVALUATING EFFICACY OF PREVENTION MAINTENANCE FOR A TOOL
- Publication number 20110010132
- Publication date Jan 13, 2011
- INOTERA MEMORIES, INC.
- YI-FENG LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for assessing data worth for analyzing yield rate
- Publication number 20100268501
- Publication date Oct 21, 2010
- Yij Chieh Chu
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF ADJUSTING WAFER PROCESSING SEQUENCE
- Publication number 20100256792
- Publication date Oct 7, 2010
- INOTERA MEMORIES, INC.
- YUN-ZONG TIAN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR FINDING THE CORRELATION BETWEEN THE TOOL PM AND THE PROD...
- Publication number 20100234978
- Publication date Sep 16, 2010
- Inotera Memories, Inc.
- YI FENG LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING FABRICATION PARAMETER
- Publication number 20100233830
- Publication date Sep 16, 2010
- INOTERA MEMORIES, INC.
- YI FENG LEE
- G05 - CONTROLLING REGULATING
Information Patent Application
MONITORING METHOD FOR MULTI TOOLS
- Publication number 20100223027
- Publication date Sep 2, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR PLANNING A SEMICONDUCTOR MANUFACTURING PROCESS BASED ON...
- Publication number 20100205127
- Publication date Aug 12, 2010
- INOTERA MEMORIES, INC.
- WEI JUN CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...
- Publication number 20100093114
- Publication date Apr 15, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETERMINING TOOL'S PRODUCTION QUALITY
- Publication number 20100049355
- Publication date Feb 25, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES
- Publication number 20100010763
- Publication date Jan 14, 2010
- INOTERA MEMORIES INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST...
- Publication number 20100004882
- Publication date Jan 7, 2010
- INOTERA MEMORIES, INC.
- YIJ CHIEH CHU
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR PREDICTING CYCLE TIME
- Publication number 20090327173
- Publication date Dec 31, 2009
- INOTERA MEMORIES, INC.
- YI FENG LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE FAULT DETECTION METHOD
- Publication number 20090276182
- Publication date Nov 5, 2009
- INOTERA MEMORIES, INC.
- YI FENG LEE
- G05 - CONTROLLING REGULATING
Information Patent Application
FUZZY CONTROL METHOD FOR ADJUSTING A SEMICONDUCTOR MACHINE
- Publication number 20090259332
- Publication date Oct 15, 2009
- INOTERA MEMORIES, INC.
- YI FENG LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING MANUFACTURING PROCESS
- Publication number 20090197354
- Publication date Aug 6, 2009
- INOTERA MEMORIES, INC.
- Tzu-Cheng Lin
- G05 - CONTROLLING REGULATING

YUN-ZONG TIAN

Person

Patents Grantslast 30 patents

Fault detection method of semiconductor manufacturing processes and...

Method for detecting variance in semiconductor processes

Method and system of compressing raw fabrication data for fault det...

Specification establishing method for controlling semiconductor pro...

Method for assessing data worth for analyzing yield rate

Method of adjusting wafer processing sequence

Method for evaluating efficacy of prevention maintenance for a tool

Method for planning a semiconductor manufacturing process based on...

Method for predicting cycle time

Method for finding the correlation between the tool PM and the prod...

Fuzzy control method for adjusting a semiconductor machine

Method for monitoring fabrication parameter

Patents Applicationslast 30 patents

METHOD AND SYSTEM OF COMPRESSING RAW FABRICATION DATA FOR FAULT DET...

FAULT DETECTION METHOD OF SEMICONDUCTOR MANUFACTURING PROCESSES AND...

SPECIFICATION ESTABLISHING METHOD FOR CONTROLLING SEMICONDUCTOR PRO...

METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES

METHOD FOR PLANNING PRODUCTION SCHEDULE OF EQUIPMENT AND ASSOCIATED...

METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...

YIELD LOSS PREDICTION METHOD AND ASSOCIATED COMPUTER READABLE MEDIUM

METHOD FOR PREDICTING AND WARNING OF WAFER ACCEPTANCE TEST VALUE

FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST...

METHOD FOR EVALUATING EFFICACY OF PREVENTION MAINTENANCE FOR A TOOL

Method for assessing data worth for analyzing yield rate

METHOD OF ADJUSTING WAFER PROCESSING SEQUENCE

METHOD FOR FINDING THE CORRELATION BETWEEN THE TOOL PM AND THE PROD...

METHOD FOR MONITORING FABRICATION PARAMETER

MONITORING METHOD FOR MULTI TOOLS

METHOD FOR PLANNING A SEMICONDUCTOR MANUFACTURING PROCESS BASED ON...

METHOD OF SEARCHING FOR KEY SEMICONDUCTOR OPERATION WITH RANDOMIZAT...

METHOD FOR DETERMINING TOOL'S PRODUCTION QUALITY

METHOD FOR DETECTING VARIANCE IN SEMICONDUCTOR PROCESSES

FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST...

METHOD FOR PREDICTING CYCLE TIME

MACHINE FAULT DETECTION METHOD

FUZZY CONTROL METHOD FOR ADJUSTING A SEMICONDUCTOR MACHINE

SYSTEM AND METHOD FOR MONITORING MANUFACTURING PROCESS