Yutaka Akino

Person

Isehara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Evaluation apparatus and evaluation method
- Patent number 7,468,792
- Issue date Dec 23, 2008
- Canon Kabushiki Kaisha
- Yuichi Masaki
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus and evaluation method
- Patent number 7,333,196
- Issue date Feb 19, 2008
- Canon Kabushiki Kaisha
- Yuichi Masaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate having a stepped profile
- Patent number 7,245,002
- Issue date Jul 17, 2007
- Canon Kabushiki Kaisha
- Yutaka Akino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate and method of manufacturing the same
- Patent number 6,417,108
- Issue date Jul 9, 2002
- Canon Kabushiki Kaisha
- Yutaka Akino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor device using processing from both...
- Patent number 6,329,265
- Issue date Dec 11, 2001
- Canon Kabushiki Kaisha
- Mamoru Miyawaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ink jet cartridge and apparatus having a substrate with grooves whi...
- Patent number 6,070,968
- Issue date Jun 6, 2000
- Canon Kabushiki Kaisha
- Yutaka Akino
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Manufacturing method of a semiconductor apparatus having an electro...
- Patent number 5,963,812
- Issue date Oct 5, 1999
- Canon Kabushiki Kaisha
- Yuzo Kataoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device made using processing from both sides of a wor...
- Patent number 5,952,694
- Issue date Sep 14, 1999
- Canon Kabushiki Kaisha
- Mamoru Miyawaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a ROM device having contact holes treated w...
- Patent number 5,580,808
- Issue date Dec 3, 1996
- Canon Kabushiki Kaisha
- Yuzo Kataoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming metal pattern including a schottky diode
- Patent number 5,569,614
- Issue date Oct 29, 1996
- Canon Kabushiki Kaisha
- Yuzo Kataoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a capacitor having contact hole treated with hydr...
- Patent number 5,527,730
- Issue date Jun 18, 1996
- Conon Kabushiki Kaisha
- Yuzo Kayaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate for recording head, recording head and method for produci...
- Patent number 5,376,231
- Issue date Dec 27, 1994
- Canon Kabushiki Kaisha
- Shigeyuki Matsumoto
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
- Publication number 20080100838
- Publication date May 1, 2008
- Canon Kabushiki Kaisha
- Yuichi Masaki
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20070114609
- Publication date May 24, 2007
- Yutaka Akino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Evaluation apparatus and evaluation method
- Publication number 20050206897
- Publication date Sep 22, 2005
- Canon Kabushiki Kaisha
- Yuichi Masaki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate and method of manufacturing the same
- Publication number 20020132451
- Publication date Sep 19, 2002
- Yutaka Akino
- H01 - BASIC ELECTRIC ELEMENTS

Yutaka Akino

Person

Patents Grantslast 30 patents

Evaluation apparatus and evaluation method

Evaluation apparatus and evaluation method

Semiconductor substrate having a stepped profile

Semiconductor substrate and method of manufacturing the same

Method of making a semiconductor device using processing from both...

Ink jet cartridge and apparatus having a substrate with grooves whi...

Manufacturing method of a semiconductor apparatus having an electro...

Semiconductor device made using processing from both sides of a wor...

Method of manufacturing a ROM device having contact holes treated w...

Method of forming metal pattern including a schottky diode

Method of forming a capacitor having contact hole treated with hydr...

Substrate for recording head, recording head and method for produci...

Patents Applicationslast 30 patents

EVALUATION APPARATUS AND EVALUATION METHOD

SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING THE SAME

Evaluation apparatus and evaluation method

Semiconductor substrate and method of manufacturing the same