Yuuichi Hirano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,838,349
- Issue date Nov 23, 2010
- Renesas Electronics Corporation
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, method of manufacturing same and method of de...
- Patent number 7,741,679
- Issue date Jun 22, 2010
- Renesas Technology Corp.
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,723,790
- Issue date May 25, 2010
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 7,675,122
- Issue date Mar 9, 2010
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a capacitance
- Patent number 7,608,879
- Issue date Oct 27, 2009
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, SRAM and manufacturing method of semiconducto...
- Patent number 7,598,570
- Issue date Oct 6, 2009
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with effective heat-radiation
- Patent number 7,541,644
- Issue date Jun 2, 2009
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,482,658
- Issue date Jan 27, 2009
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,439,587
- Issue date Oct 21, 2008
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,393,731
- Issue date Jul 1, 2008
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method of manufacturing the same
- Patent number 7,382,026
- Issue date Jun 3, 2008
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a capacitance
- Patent number 7,339,238
- Issue date Mar 4, 2008
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,332,776
- Issue date Feb 19, 2008
- Renesas Technology Corp.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,307,318
- Issue date Dec 11, 2007
- Renesas Technology Corp.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, method of manufacturing same and method of de...
- Patent number 7,303,950
- Issue date Dec 4, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method of manufacturing the same
- Patent number 7,271,454
- Issue date Sep 18, 2007
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,193,272
- Issue date Mar 20, 2007
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device having trench isolation
- Patent number 7,144,764
- Issue date Dec 5, 2006
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a capacitance
- Patent number 7,112,835
- Issue date Sep 26, 2006
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,067,881
- Issue date Jun 27, 2006
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device of reduced gate overlap capacitance and method...
- Patent number 7,045,867
- Issue date May 16, 2006
- Renesas Technology Corp.
- Hai Dang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor storage device having high soft-error immunity
- Patent number 6,975,041
- Issue date Dec 13, 2005
- Renesas Technology Corp.
- Yuuichi Hirano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device, method of manufacturing same and method of de...
- Patent number 6,958,266
- Issue date Oct 25, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, method of manufacturing same and method of de...
- Patent number 6,953,979
- Issue date Oct 11, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,933,565
- Issue date Aug 23, 2005
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate with stacked oxide and SOI layers with a mo...
- Patent number 6,872,979
- Issue date Mar 29, 2005
- Renesas Technology Corp.
- Yoshiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a capacitance
- Patent number 6,858,918
- Issue date Feb 22, 2005
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device having trench isolation
- Patent number 6,841,400
- Issue date Jan 11, 2005
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing same
- Patent number 6,787,855
- Issue date Sep 7, 2004
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor storage device having high soft-error immunity
- Patent number 6,756,692
- Issue date Jun 29, 2004
- Renesas Technology Corp.
- Yuuichi Hirano
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20090014797
- Publication date Jan 15, 2009
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SAME AND METHOD OF DE...
- Publication number 20080315313
- Publication date Dec 25, 2008
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20080274596
- Publication date Nov 6, 2008
- Renesas Technology Corporation
- Takuji MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and method of manufacturing the same
- Publication number 20080211035
- Publication date Sep 4, 2008
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20080128814
- Publication date Jun 5, 2008
- Renesas Technology Corp.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20080128810
- Publication date Jun 5, 2008
- Renesas Technology Corp.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20080067593
- Publication date Mar 20, 2008
- Renesas Technology Corp.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and method of manufacturing the same
- Publication number 20080001226
- Publication date Jan 3, 2008
- RENSESAS TECHNOLOGY CORP.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A CAPACITANCE
- Publication number 20070296009
- Publication date Dec 27, 2007
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20070257330
- Publication date Nov 8, 2007
- Renesas Technology Corp.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20070138560
- Publication date Jun 21, 2007
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20070132028
- Publication date Jun 14, 2007
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with effective heat-radiation
- Publication number 20070007595
- Publication date Jan 11, 2007
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device including a capacitance
- Publication number 20060289906
- Publication date Dec 28, 2006
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor device having trench isolation
- Publication number 20060249756
- Publication date Nov 9, 2006
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, SRAM and manufacturing method of semiconducto...
- Publication number 20060086980
- Publication date Apr 27, 2006
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing same
- Publication number 20050275023
- Publication date Dec 15, 2005
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20050275021
- Publication date Dec 15, 2005
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20050269637
- Publication date Dec 8, 2005
- RENESAS TECHNOLOGY CORP.
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050253219
- Publication date Nov 17, 2005
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050184342
- Publication date Aug 25, 2005
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, method of manufacturing same and method of de...
- Publication number 20050156242
- Publication date Jul 21, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device including a capacitance
- Publication number 20050087779
- Publication date Apr 28, 2005
- Renesas Technology Corp.
- Shigenobu Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and method of manufacturing the same
- Publication number 20050078546
- Publication date Apr 14, 2005
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor device having trench isolation
- Publication number 20050037524
- Publication date Feb 17, 2005
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with effective heat-radiation
- Publication number 20040232554
- Publication date Nov 25, 2004
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20040227185
- Publication date Nov 18, 2004
- Renesas Technology Corp.
- Takuji Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor storage device having soft-error immunity
- Publication number 20040179410
- Publication date Sep 16, 2004
- Renesas Technology Corp.
- Yuuichi Hirano
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and method of manufacturing same
- Publication number 20040145017
- Publication date Jul 29, 2004
- Renesas Technology Corp.
- Yuuichi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device of reduced gate overlap capacitance and method...
- Publication number 20040051151
- Publication date Mar 18, 2004
- Renesas Technology Corp.
- Hai Dang
- H01 - BASIC ELECTRIC ELEMENTS

Yuuichi Hirano

Person

Patents Grantslast 30 patents

Semiconductor device and method of manufacturing the same

Semiconductor device, method of manufacturing same and method of de...

Semiconductor device and method of manufacturing the same

Semiconductor memory device

Semiconductor device including a capacitance

Semiconductor device, SRAM and manufacturing method of semiconducto...

Semiconductor device with effective heat-radiation

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor memory device and method of manufacturing the same

Semiconductor device including a capacitance

Semiconductor device

Semiconductor device

Semiconductor device, method of manufacturing same and method of de...

Semiconductor memory device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Method of manufacturing semiconductor device having trench isolation

Semiconductor device including a capacitance

Semiconductor device

Semiconductor device of reduced gate overlap capacitance and method...

Semiconductor storage device having high soft-error immunity

Semiconductor device, method of manufacturing same and method of de...

Semiconductor device, method of manufacturing same and method of de...

Semiconductor device and method of manufacturing the same

Semiconductor substrate with stacked oxide and SOI layers with a mo...

Semiconductor device including a capacitance

Method of manufacturing semiconductor device having trench isolation

Semiconductor device and method of manufacturing same

Semiconductor storage device having high soft-error immunity

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SAME AND METHOD OF DE...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor memory device and method of manufacturing the same

Semiconductor device

Semiconductor device

Semiconductor device

Semiconductor memory device and method of manufacturing the same

SEMICONDUCTOR DEVICE INCLUDING A CAPACITANCE

Semiconductor device

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device with effective heat-radiation

Semiconductor device including a capacitance

Method of manufacturing semiconductor device having trench isolation

Semiconductor device, SRAM and manufacturing method of semiconducto...

Semiconductor device and method of manufacturing same

Semiconductor device

Semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor device, method of manufacturing same and method of de...

Semiconductor device including a capacitance

Semiconductor memory device and method of manufacturing the same

Method of manufacturing semiconductor device having trench isolation

Semiconductor device with effective heat-radiation

Semiconductor device

Semiconductor storage device having soft-error immunity

Semiconductor device and method of manufacturing same

Semiconductor device of reduced gate overlap capacitance and method...