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Yuuichi Satou
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Trace-level gas analysis apparatus and method
Patent number
6,497,136
Issue date
Dec 24, 2002
NEC Corporation
Yuuichi Satou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method and apparatus for automatically analyzing trace substance
Patent number
6,470,760
Issue date
Oct 29, 2002
NEC Corporation
Tsutomu Shinozaki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for accurately measuring local thickness of insulating la...
Patent number
6,322,422
Issue date
Nov 27, 2001
NEC Corporation
Yuuichi Satou
B24 - GRINDING POLISHING
Patents Applications
last 30 patents
Information
Patent Application
Transportation System, Schedule Proposal System, and Train Operatio...
Publication number
20190228358
Publication date
Jul 25, 2019
Hitachi, Ltd
Rieko OOTSUKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR AUTOMATICALLY ANALYZING TRACE SUBSTANCE
Publication number
20020121148
Publication date
Sep 5, 2002
TSUTOMU SHINOZAKI
G01 - MEASURING TESTING
Information
Patent Application
Trace-level gas analysis apparatus and method
Publication number
20010011474
Publication date
Aug 9, 2001
Yuuichi Satou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL