Yuuichi Yamagishi

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for fabricating probe tip portion composed by coaxial cable
- Patent number 6,400,168
- Issue date Jun 4, 2002
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Longitudinal type high frequency probe for narrow pitched electrodes
- Patent number 6,310,483
- Issue date Oct 30, 2001
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Grant
Tip portion structure of high-frequency probe and method for fabric...
- Patent number 6,281,691
- Issue date Aug 28, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency probe capable of adjusting characteristic impedance...
- Patent number 6,242,930
- Issue date Jun 5, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing high frequency multichip module enabling...
- Patent number 6,229,321
- Issue date May 8, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for fabricating probe tip portion composed by coaxial cable
- Publication number 20010038294
- Publication date Nov 8, 2001
- Kouji Matsunaga
- G01 - MEASURING TESTING