Yuusuke OOMINAMI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Support system for specified inspection, support method for specifi...
- Patent number 11,561,184
- Issue date Jan 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi Tada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,239,051
- Issue date Feb 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Mai Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting height of sample and observation system
- Patent number 10,141,157
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Makoto Nakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,134,564
- Issue date Nov 20, 2018
- Hitachi High-Technologies Corporation
- Taiga Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron scanning microscope and image generation method
- Patent number 9,875,877
- Issue date Jan 23, 2018
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder with light emitting and transferring elements for a c...
- Patent number 9,812,288
- Issue date Nov 7, 2017
- Hitachi High-Technologies Corporation
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Particle Analysis Device and Particle Analysis Method
- Publication number 20240219286
- Publication date Jul 4, 2024
- Hitachi High-Tech Corporation
- Erino MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE ANALYZING DEVICE, AND PARTICLE ANALYZING METHOD
- Publication number 20240201113
- Publication date Jun 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko HISADA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Microscope and Method of Imaging Sample
- Publication number 20210233740
- Publication date Jul 29, 2021
- Hitachi High-Technologies Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD
- Publication number 20210181127
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Akiko HISADA
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFI...
- Publication number 20200278303
- Publication date Sep 3, 2020
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi TADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20190378687
- Publication date Dec 12, 2019
- Hitachi High-Technologies Corporation
- Mai YOSHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Adjusting Height of Sample and Observation System
- Publication number 20180174796
- Publication date Jun 21, 2018
- Hitachi High-Technologies Corporation
- Makoto NAKABAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20170330724
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Taiga OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD
- Publication number 20170069458
- Publication date Mar 9, 2017
- Hitachi High-Technologies Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD
- Publication number 20160343538
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Shinsuke KAWANISHI
- H01 - BASIC ELECTRIC ELEMENTS

Yuusuke OOMINAMI

Person

Patents Grantslast 30 patents

Cell analysis apparatus and cell analysis method

Support system for specified inspection, support method for specifi...

Charged particle beam device

Method for adjusting height of sample and observation system

Charged particle beam device

Electron scanning microscope and image generation method

Sample holder with light emitting and transferring elements for a c...

Patents Applicationslast 30 patents

Particle Analysis Device and Particle Analysis Method

PARTICLE ANALYZING DEVICE, AND PARTICLE ANALYZING METHOD

Charged Particle Microscope and Method of Imaging Sample

CELL ANALYSIS APPARATUS AND CELL ANALYSIS METHOD

SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFI...

Charged Particle Beam Device

Method for Adjusting Height of Sample and Observation System

CHARGED PARTICLE BEAM DEVICE

SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD

ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD