Yuzo Taniguchi

Person

Kodaira-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device producing method, system for carrying out the...
- Patent number 6,650,409
- Issue date Nov 18, 2003
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of making gas discharge display panel and gas discharge disp...
- Patent number 6,624,575
- Issue date Sep 23, 2003
- Hitachi, Ltd.
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring substrate and gas discharge display device
- Patent number 6,621,217
- Issue date Sep 16, 2003
- Hitachi, Ltd.
- Masashi Nishiki
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing electronic circuit devices
- Patent number 6,471,115
- Issue date Oct 29, 2002
- Hitachi, Ltd.
- Masahito Ijuin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gas discharge display panel and gas discharge display device having...
- Patent number 6,429,586
- Issue date Aug 6, 2002
- Hitachi, Ltd.
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring substrate and gas discharge display device that includes a d...
- Patent number 6,346,772
- Issue date Feb 12, 2002
- Hitachi, Ltd.
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making gas discharge display panel and gas discharge disp...
- Patent number 6,343,967
- Issue date Feb 5, 2002
- Hitachi, Ltd.
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Wiring substrate and gas discharge display device and method therefor
- Patent number 6,261,144
- Issue date Jul 17, 2001
- Hitachi, Ltd.
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency transmitter-receiver apparatus for such an applicati...
- Patent number 6,249,242
- Issue date Jun 19, 2001
- Hitachi, Ltd.
- Kenji Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 5,841,893
- Issue date Nov 24, 1998
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting foreign particles on real time...
- Patent number 5,274,434
- Issue date Dec 28, 1993
- Hitachi, Ltd.
- Hiroshi Morioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for the inspection of patterns
- Patent number 5,173,719
- Issue date Dec 22, 1992
- Hitachi, Ltd.
- Yuzo Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect inspection apparatus
- Patent number 4,731,855
- Issue date Mar 15, 1988
- Hitachi, Ltd.
- Kyo Suda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of making gas discharge display panel and gas discharge disp...
- Publication number 20020089285
- Publication date Jul 11, 2002
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wiring substrate and gas discharge display device
- Publication number 20020070665
- Publication date Jun 13, 2002
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Wiring substrate and gas discharge display device
- Publication number 20020014841
- Publication date Feb 7, 2002
- Masashi Nishiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING

Yuzo Taniguchi

Person

Patents Grantslast 30 patents

Semiconductor device producing method, system for carrying out the...

Inspection data analyzing system

Method of making gas discharge display panel and gas discharge disp...

Wiring substrate and gas discharge display device

Inspection data analyzing system

Process for manufacturing electronic circuit devices

Gas discharge display panel and gas discharge display device having...

Wiring substrate and gas discharge display device that includes a d...

Method of making gas discharge display panel and gas discharge disp...

Inspection data analyzing system

Inspection data analyzing system

Wiring substrate and gas discharge display device and method therefor

High-frequency transmitter-receiver apparatus for such an applicati...

Inspection system and method using separate processors for processi...

Inspection data analyzing system

Method and apparatus for inspecting foreign particles on real time...

Method and apparatus for the inspection of patterns

Pattern defect inspection apparatus

Patents Applicationslast 30 patents

Method of making gas discharge display panel and gas discharge disp...

Wiring substrate and gas discharge display device

Inspection data analyzing system

Wiring substrate and gas discharge display device

Inspection data analyzing system

Inspection data analyzing system