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Charged mass labeling system
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Patent number 12,055,550
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Issue date Aug 6, 2024
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Purdue Research Foundation
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Robert Graham Cooks
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G01 - MEASURING TESTING
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Ion focusing
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Patent number 11,830,717
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Issue date Nov 28, 2023
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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Ion focusing
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Patent number 11,631,577
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Issue date Apr 18, 2023
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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Ion focusing
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Patent number 11,469,090
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Issue date Oct 11, 2022
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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Charged mass labeling system
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Patent number 11,061,035
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Issue date Jul 13, 2021
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Purdue Research Foundation
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Robert Graham Cooks
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G01 - MEASURING TESTING
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Ion focusing
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Patent number 10,923,338
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Issue date Feb 16, 2021
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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Ion focusing
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Patent number 10,777,400
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Issue date Sep 15, 2020
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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-
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ION focusing
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Patent number 10,615,021
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Issue date Apr 7, 2020
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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-
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Ion focusing
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Patent number 10,014,169
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Issue date Jul 3, 2018
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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Ion focusing
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Patent number 9,548,192
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Issue date Jan 17, 2017
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS
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Ion focusing
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Patent number 9,184,038
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Issue date Nov 10, 2015
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Purdue Research Foundation
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Robert Graham Cooks
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H01 - BASIC ELECTRIC ELEMENTS