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Zewu CHEN
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Schenectady, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Sample handling apparatus for pressurized fluids and X-ray analyzer...
Patent number
10,705,033
Issue date
Jul 7, 2020
X-Ray Optical Systems, Inc.
Joseph J Spinazola
G01 - MEASURING TESTING
Information
Patent Grant
Active, variable sample concentration method and apparatus for sub-...
Patent number
10,317,350
Issue date
Jun 11, 2019
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Support structure and highly aligned monochromatic X-ray optics for...
Patent number
10,256,002
Issue date
Apr 9, 2019
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analyzer having multiple excitation energy bands produced usi...
Patent number
9,449,780
Issue date
Sep 20, 2016
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Online monitoring of contaminants in crude and heavy fuels, and ref...
Patent number
9,383,326
Issue date
Jul 5, 2016
X-Ray Optical Systems, Inc.
Albertus Beumer
G01 - MEASURING TESTING
Information
Patent Grant
Non-homogeneous sample handling apparatus and X-ray analyzer applic...
Patent number
9,360,440
Issue date
Jun 7, 2016
X-Ray Optical Systems, Inc.
George Allen
G01 - MEASURING TESTING
Information
Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
Patent number
9,343,193
Issue date
May 17, 2016
X-Ray Optical Systems, Inc.
Zewu Chen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
Patent number
9,048,001
Issue date
Jun 2, 2015
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Compositions, methods of use and systems for analysis of silicon le...
Patent number
8,908,827
Issue date
Dec 9, 2014
X-Ray Optical Systems, Inc.
James Carnahan
G01 - MEASURING TESTING
Information
Patent Grant
Sample module with sample stream supported and spaced from window,...
Patent number
8,625,737
Issue date
Jan 7, 2014
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
Patent number
8,559,597
Issue date
Oct 15, 2013
X-Ray Optical Systems, Inc.
Zewu Chen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Sample module with sample stream spaced from window, for x-ray anal...
Patent number
8,050,382
Issue date
Nov 1, 2011
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Monochromatic x-ray micro beam for trace element mapping
Patent number
7,991,116
Issue date
Aug 2, 2011
X-Ray Optical Systems, Inc.
Zewu Chen
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Small spot and high energy resolution XRF system for valence state...
Patent number
7,899,154
Issue date
Mar 1, 2011
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Highly aligned x-ray optic and source assembly for precision x-ray...
Patent number
7,738,630
Issue date
Jun 15, 2010
X-Ray Optical Systems, Inc.
John H. Burdett, Jr.
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray focusing optic having multiple layers with respective crystal...
Patent number
7,738,629
Issue date
Jun 15, 2010
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray imaging systems employing point-focusing, curved monochromati...
Patent number
7,583,789
Issue date
Sep 1, 2009
The Research Foundation of State University of New York
Carolyn A. MacDonald
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and device for cooling and electrically insulating a high vo...
Patent number
7,519,159
Issue date
Apr 14, 2009
X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray source assembly having enhanced output stability, and fluid s...
Patent number
7,382,856
Issue date
Jun 3, 2008
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Grant
Portable and on-line arsenic analyzer for drinking water
Patent number
7,298,817
Issue date
Nov 20, 2007
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray source assembly having enhanced output stability, and fluid s...
Patent number
7,209,545
Issue date
Apr 24, 2007
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for implement XANES analysis
Patent number
7,206,375
Issue date
Apr 17, 2007
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and device for cooling and electrically insulating a high-vo...
Patent number
7,110,506
Issue date
Sep 19, 2006
X-Ray Optical Systems, Inc.
Ian Radley
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray tube and method and apparatus for analyzing fluid streams usi...
Patent number
7,072,439
Issue date
Jul 4, 2006
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Grant
Optical device for directing x-rays having a plurality of optical c...
Patent number
7,035,374
Issue date
Apr 25, 2006
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray fluorescence system with apertured mask for analyzing pattern...
Patent number
7,023,955
Issue date
Apr 4, 2006
X-Ray Optical System, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength dispersive XRF system using focusing optic for excitatio...
Patent number
6,934,359
Issue date
Aug 23, 2005
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Total-reflection x-ray fluorescence apparatus and method using a do...
Patent number
6,829,327
Issue date
Dec 7, 2004
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Doubly curved optical device with graded atomic planes
Patent number
6,317,483
Issue date
Nov 13, 2001
X-Ray Optical Systems, Inc.
Zewu Chen
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Curved optical device and method of fabrication
Patent number
6,285,506
Issue date
Sep 4, 2001
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
Information
Patent Application
POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD
Publication number
20240035990
Publication date
Feb 1, 2024
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HANDLING APPARATUS FOR PRESSURIZED FLUIDS AND X-RAY ANALYZER...
Publication number
20190056337
Publication date
Feb 21, 2019
X-Ray Optical Systems, Inc.
Joseph J SPINAZOLA
G01 - MEASURING TESTING
Information
Patent Application
SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATIC X-RAY OPTICS FOR...
Publication number
20170110212
Publication date
Apr 20, 2017
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...
Publication number
20170097311
Publication date
Apr 6, 2017
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLI...
Publication number
20160274042
Publication date
Sep 22, 2016
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
Publication number
20160260514
Publication date
Sep 8, 2016
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
Publication number
20150262722
Publication date
Sep 17, 2015
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USI...
Publication number
20150043713
Publication date
Feb 12, 2015
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATING X-RAY OPTICS FO...
Publication number
20140294157
Publication date
Oct 2, 2014
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
NON-HOMOGENEOUS SAMPLE HANDLING APPARATUS AND X-RAY ANALYZER APPLIC...
Publication number
20140270063
Publication date
Sep 18, 2014
X-Ray Optical Systems, Inc.
George ALLEN
G01 - MEASURING TESTING
Information
Patent Application
ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REF...
Publication number
20140198898
Publication date
Jul 17, 2014
X-Ray Optical Systems, Inc.
Albertus Beumer
G01 - MEASURING TESTING
Information
Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
Publication number
20140105363
Publication date
Apr 17, 2014
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LE...
Publication number
20120321045
Publication date
Dec 20, 2012
X-Ray Optical Systems, Inc.
James CARNAHAN
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE MODULE WITH SAMPLE STREAM SUPPORTED AND SPACED FROM WINDOW,...
Publication number
20110194671
Publication date
Aug 11, 2011
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
Publication number
20110170666
Publication date
Jul 14, 2011
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE...
Publication number
20100046702
Publication date
Feb 25, 2010
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGING SYSTEMS EMPLOYING POINT-FOCUSING, CURVED MONOCHROMATI...
Publication number
20090225947
Publication date
Sep 10, 2009
X-Ray Optical Systems, Inc.
Carolyn A. MacDonald
B82 - NANO-TECHNOLOGY
Information
Patent Application
HIGHLY ALIGNED X-RAY OPTIC AND SOURCE ASSEMBLY FOR PRECISION X-RAY...
Publication number
20090225948
Publication date
Sep 10, 2009
X-Ray Optical Systems, Inc.
John H. BURDETT, JR.
B82 - NANO-TECHNOLOGY
Information
Patent Application
SAMPLE MODULE WITH SAMPLE STREAM SPACED FROM WINDOW, FOR X-RAY ANAL...
Publication number
20090213988
Publication date
Aug 27, 2009
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
Information
Patent Application
MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING
Publication number
20090161829
Publication date
Jun 25, 2009
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FOCUSING OPTIC HAVING MULTIPLE LAYERS WITH RESPECTIVE CRYSTAL...
Publication number
20080117511
Publication date
May 22, 2008
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-RAY SOURCE ASSEMBLY HAVING ENHANCED OUTPUT STABILITY, AND FLUID S...
Publication number
20070140420
Publication date
Jun 21, 2007
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Application
Method and device for cooling and electrically insulating a high vo...
Publication number
20060193440
Publication date
Aug 31, 2006
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for implement XANES analysis
Publication number
20060120508
Publication date
Jun 8, 2006
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
Optical device for directing x-rays having a plurality of optical c...
Publication number
20050201517
Publication date
Sep 15, 2005
X-Ray Optical Systems, Inc.
Zewu Chen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Portable and on-line arsenic analyzer for drinking water
Publication number
20050157843
Publication date
Jul 21, 2005
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
X-ray source assembly having enhanced output stability, and fluid s...
Publication number
20050053197
Publication date
Mar 10, 2005
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Application
X-ray fluorescence system with apertured mask for analyzing pattern...
Publication number
20050036583
Publication date
Feb 17, 2005
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
Information
Patent Application
X-ray tube and method and apparatus for analyzing fluid streams usi...
Publication number
20050031073
Publication date
Feb 10, 2005
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING
Information
Patent Application
Method and device for cooling and electrically insulating a high-vo...
Publication number
20040218725
Publication date
Nov 4, 2004
X-Ray Optical Systems, Inc.
Ian Radley
G01 - MEASURING TESTING