Zhihong Liu

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Noise measurement system
- Patent number 10,852,343
- Issue date Dec 1, 2020
- PROPLUS ELECTRONICS CO., LTD.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Synchronized noise measurement system
- Patent number 10,782,337
- Issue date Sep 22, 2020
- Jinan ProPlus Electronics Co., Ltd.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Noise measurement system
- Patent number 9,500,697
- Issue date Nov 22, 2016
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for measuring flicker noise
- Patent number 9,459,301
- Issue date Oct 4, 2016
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Repetitive circuit simulation
- Patent number 9,348,957
- Issue date May 24, 2016
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for simulating dynamic behavior of a transistor
- Patent number 7,933,747
- Issue date Apr 26, 2011
- Cadence Design Systems, Inc.
- Yutao Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot carrier circuit reliability simulation
- Patent number 7,835,890
- Issue date Nov 16, 2010
- Cadence Design Systems, Inc.
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MOSFET modeling for IC design accurate for high frequencies
- Patent number 7,735,033
- Issue date Jun 8, 2010
- Cadence Design Systems, Inc.
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit simulation with decoupled self-heating analysis
- Patent number 7,606,693
- Issue date Oct 20, 2009
- Cadence Design Systems, Inc.
- Min-Che Jeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot-carrier device degradation modeling and extraction methodologies
- Patent number 7,567,891
- Issue date Jul 28, 2009
- Cadence Design Systems, Inc.
- Zhihong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MOSFET modeling for IC design accurate for high frequencies
- Patent number 7,313,770
- Issue date Dec 25, 2007
- Cadence Design Systems, Inc.
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model stamping matrix check technique in circuit simulator
- Patent number 7,299,428
- Issue date Nov 20, 2007
- Cadence Design Systems, Inc.
- Yutao Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot carrier circuit reliability simulation
- Patent number 7,292,968
- Issue date Nov 6, 2007
- Cadence Design Systems, Inc.
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for modeling devices having different geometries
- Patent number 7,263,477
- Issue date Aug 28, 2007
- Cadence Design Systems, Inc.
- Ping Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MOSFET modeling for IC design accurate for high frequencies
- Patent number 6,851,097
- Issue date Feb 1, 2005
- Cadence Design Systems, Inc.
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for measuring noise in a device
- Patent number 6,693,439
- Issue date Feb 17, 2004
- Cadence Design Systems, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
MOSFET modeling for IC design accurate for high frequencies
- Patent number 6,618,837
- Issue date Sep 9, 2003
- Cadence Design Systems, Inc.
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for modeling and simulating the effect of mis...
- Patent number 6,560,755
- Issue date May 6, 2003
- Cadence Design Systems, Inc.
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot carrier effect simulation for integrated circuits
- Patent number 6,278,964
- Issue date Aug 21, 2001
- Matsushita Electric Industrial Co., Ltd.
- Jingkun Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Realistic worst-case circuit simulation system and method
- Patent number 5,790,436
- Issue date Aug 4, 1998
- BTA Technology, Inc.
- James Chieh-Tsung Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Noise Measurement System
- Publication number 20200209303
- Publication date Jul 2, 2020
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Application
Synchronized Noise Measurement System
- Publication number 20180180662
- Publication date Jun 28, 2018
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and Methods for Measuring Flicker Noise
- Publication number 20150212131
- Publication date Jul 30, 2015
- PROPLUS ELECTRONICS CO., LTD.
- Zhihong LIU
- G01 - MEASURING TESTING
Information Patent Application
Noise Measurement System
- Publication number 20150212145
- Publication date Jul 30, 2015
- PROPLUS ELECTRONICS CO., LTD.
- Zhihong LIU
- G01 - MEASURING TESTING
Information Patent Application
Hot-Carrier Device Degradation Modeling and Extraction Methodologies
- Publication number 20090299716
- Publication date Dec 3, 2009
- Zhihong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MODELING DYNAMIC BEHAVIOR OF A TRANSISTOR
- Publication number 20090119085
- Publication date May 7, 2009
- Yutao Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOSFET Modeling for IC Design Accurate for High Frequencies
- Publication number 20080109204
- Publication date May 8, 2008
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hot Carrier Circuit Reliability Simulation
- Publication number 20080027699
- Publication date Jan 31, 2008
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit simulation with decoupled self-heating analysis
- Publication number 20070079205
- Publication date Apr 5, 2007
- Cadence Design Systems, Inc.
- Min-Chie Jeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Model stamping matrix check technique in circuit simulator
- Publication number 20050177807
- Publication date Aug 11, 2005
- Cadence Design Systems, Inc.
- Yutao Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOSFET modeling for IC design accurate for high frequencies
- Publication number 20050114111
- Publication date May 26, 2005
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for modeling devices having different geometries
- Publication number 20050027501
- Publication date Feb 3, 2005
- Cadence Design Systems, Inc.
- Ping Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOSFET modeling for IC design accurate for high frequencies
- Publication number 20040031001
- Publication date Feb 12, 2004
- Xisheng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hot carrier circuit reliability simulation
- Publication number 20030055621
- Publication date Mar 20, 2003
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING

Zhihong Liu

Person

Patents Grantslast 30 patents

Noise measurement system

Synchronized noise measurement system

Noise measurement system

Apparatuses and methods for measuring flicker noise

Repetitive circuit simulation

Method and system for simulating dynamic behavior of a transistor

Hot carrier circuit reliability simulation

MOSFET modeling for IC design accurate for high frequencies

Circuit simulation with decoupled self-heating analysis

Hot-carrier device degradation modeling and extraction methodologies

MOSFET modeling for IC design accurate for high frequencies

Model stamping matrix check technique in circuit simulator

Hot carrier circuit reliability simulation

Method and apparatus for modeling devices having different geometries

MOSFET modeling for IC design accurate for high frequencies

Apparatus and methods for measuring noise in a device

MOSFET modeling for IC design accurate for high frequencies

Apparatus and methods for modeling and simulating the effect of mis...

Hot carrier effect simulation for integrated circuits

Realistic worst-case circuit simulation system and method

Patents Applicationslast 30 patents

Noise Measurement System

Synchronized Noise Measurement System

Apparatuses and Methods for Measuring Flicker Noise

Noise Measurement System

Hot-Carrier Device Degradation Modeling and Extraction Methodologies

METHOD AND SYSTEM FOR MODELING DYNAMIC BEHAVIOR OF A TRANSISTOR

MOSFET Modeling for IC Design Accurate for High Frequencies

Hot Carrier Circuit Reliability Simulation

Circuit simulation with decoupled self-heating analysis

Model stamping matrix check technique in circuit simulator

MOSFET modeling for IC design accurate for high frequencies

Method and apparatus for modeling devices having different geometries

MOSFET modeling for IC design accurate for high frequencies

Hot carrier circuit reliability simulation